Electric field thermopower modulation analysis of an interfacial conducting layer formed between Y2O3 and rutile TiO2
Electric field modulation analysis of thermopower (S)–carrier concentration (n) relation of a bilayer laminate structure composed of a 1.5-nm-thick conducting layer, probably TinO2n–1 (n = 2, 3, …) Magnéli phase, and rutile TiO2, was performed. The results clearly showed that both the rutile TiO2 an...
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| Veröffentlicht in: | Journal of applied physics 2011-09, Vol.110 (6) |
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| container_title | Journal of applied physics |
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| creator | Mizuno, Taku Nagao, Yuki Yoshikawa, Akira Koumoto, Kunihito Kato, Takeharu Ikuhara, Yuichi Ohta, Hiromichi |
| description | Electric field modulation analysis of thermopower (S)–carrier concentration (n) relation of a bilayer laminate structure composed of a 1.5-nm-thick conducting layer, probably TinO2n–1 (n = 2, 3, …) Magnéli phase, and rutile TiO2, was performed. The results clearly showed that both the rutile TiO2 and the thin interfacial layer contribute to carrier transport: the rutile TiO2 bulk region (mobility μ ∼ 0.03 cm2 V−1 s−1) and the 1.5-nm-thick interfacial layer (μ ∼ 0.3 cm2 V−1 s−1). The effective thickness of the interfacial layer, which was obtained from the S-n relation, was below ∼3 nm, which agrees well with that of the TEM observation (∼1.5 nm), clearly showing that electric field modulation measurement of S-n relation can effectively clarify the carrier transport properties of a bilayer laminate structure. |
| doi_str_mv | 10.1063/1.3633217 |
| format | Article |
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The results clearly showed that both the rutile TiO2 and the thin interfacial layer contribute to carrier transport: the rutile TiO2 bulk region (mobility μ ∼ 0.03 cm2 V−1 s−1) and the 1.5-nm-thick interfacial layer (μ ∼ 0.3 cm2 V−1 s−1). The effective thickness of the interfacial layer, which was obtained from the S-n relation, was below ∼3 nm, which agrees well with that of the TEM observation (∼1.5 nm), clearly showing that electric field modulation measurement of S-n relation can effectively clarify the carrier transport properties of a bilayer laminate structure.</description><identifier>ISSN: 0021-8979</identifier><identifier>EISSN: 1089-7550</identifier><identifier>DOI: 10.1063/1.3633217</identifier><language>eng</language><ispartof>Journal of applied physics, 2011-09, Vol.110 (6)</ispartof><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c295t-8a8cedba2dc1755405262f89a0ca727d571f8a3b661f3658d0a721010acac99c3</citedby><cites>FETCH-LOGICAL-c295t-8a8cedba2dc1755405262f89a0ca727d571f8a3b661f3658d0a721010acac99c3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,776,780,27903,27904</link.rule.ids></links><search><creatorcontrib>Mizuno, Taku</creatorcontrib><creatorcontrib>Nagao, Yuki</creatorcontrib><creatorcontrib>Yoshikawa, Akira</creatorcontrib><creatorcontrib>Koumoto, Kunihito</creatorcontrib><creatorcontrib>Kato, Takeharu</creatorcontrib><creatorcontrib>Ikuhara, Yuichi</creatorcontrib><creatorcontrib>Ohta, Hiromichi</creatorcontrib><title>Electric field thermopower modulation analysis of an interfacial conducting layer formed between Y2O3 and rutile TiO2</title><title>Journal of applied physics</title><description>Electric field modulation analysis of thermopower (S)–carrier concentration (n) relation of a bilayer laminate structure composed of a 1.5-nm-thick conducting layer, probably TinO2n–1 (n = 2, 3, …) Magnéli phase, and rutile TiO2, was performed. The results clearly showed that both the rutile TiO2 and the thin interfacial layer contribute to carrier transport: the rutile TiO2 bulk region (mobility μ ∼ 0.03 cm2 V−1 s−1) and the 1.5-nm-thick interfacial layer (μ ∼ 0.3 cm2 V−1 s−1). The effective thickness of the interfacial layer, which was obtained from the S-n relation, was below ∼3 nm, which agrees well with that of the TEM observation (∼1.5 nm), clearly showing that electric field modulation measurement of S-n relation can effectively clarify the carrier transport properties of a bilayer laminate structure.</description><issn>0021-8979</issn><issn>1089-7550</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2011</creationdate><recordtype>article</recordtype><recordid>eNotkE1LAzEYhIMouFYP_oNcPWzNm7i7yVFK_YBCL_XgaXmbD41kNyXJUvrvXbGnGQaegRlC7oEtgbXiEZaiFYJDd0EqYFLVXdOwS1IxxqGWqlPX5CbnH8YApFAVmdbB6pK8ps7bYGj5tmmIh3i0iQ7RTAGLjyPFEcMp-0yjmz31Y7HJofYYqI6jmXTx4xcNeJoxF9NgDd3bcrR2pJ98K2bG0DQVHyzd-S2_JVcOQ7Z3Z12Qj5f1bvVWb7av76vnTa25akotUWpr9siNhnnHE2t4y51UyDR2vDNNB06i2LctONE20rA5BgYMNWqltFiQh_9enWLOybr-kPyA6dQD6__-6qE__yV-Ab4rXmQ</recordid><startdate>20110915</startdate><enddate>20110915</enddate><creator>Mizuno, Taku</creator><creator>Nagao, Yuki</creator><creator>Yoshikawa, Akira</creator><creator>Koumoto, Kunihito</creator><creator>Kato, Takeharu</creator><creator>Ikuhara, Yuichi</creator><creator>Ohta, Hiromichi</creator><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>20110915</creationdate><title>Electric field thermopower modulation analysis of an interfacial conducting layer formed between Y2O3 and rutile TiO2</title><author>Mizuno, Taku ; Nagao, Yuki ; Yoshikawa, Akira ; Koumoto, Kunihito ; Kato, Takeharu ; Ikuhara, Yuichi ; Ohta, Hiromichi</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c295t-8a8cedba2dc1755405262f89a0ca727d571f8a3b661f3658d0a721010acac99c3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2011</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Mizuno, Taku</creatorcontrib><creatorcontrib>Nagao, Yuki</creatorcontrib><creatorcontrib>Yoshikawa, Akira</creatorcontrib><creatorcontrib>Koumoto, Kunihito</creatorcontrib><creatorcontrib>Kato, Takeharu</creatorcontrib><creatorcontrib>Ikuhara, Yuichi</creatorcontrib><creatorcontrib>Ohta, Hiromichi</creatorcontrib><collection>CrossRef</collection><jtitle>Journal of applied physics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Mizuno, Taku</au><au>Nagao, Yuki</au><au>Yoshikawa, Akira</au><au>Koumoto, Kunihito</au><au>Kato, Takeharu</au><au>Ikuhara, Yuichi</au><au>Ohta, Hiromichi</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Electric field thermopower modulation analysis of an interfacial conducting layer formed between Y2O3 and rutile TiO2</atitle><jtitle>Journal of applied physics</jtitle><date>2011-09-15</date><risdate>2011</risdate><volume>110</volume><issue>6</issue><issn>0021-8979</issn><eissn>1089-7550</eissn><abstract>Electric field modulation analysis of thermopower (S)–carrier concentration (n) relation of a bilayer laminate structure composed of a 1.5-nm-thick conducting layer, probably TinO2n–1 (n = 2, 3, …) Magnéli phase, and rutile TiO2, was performed. The results clearly showed that both the rutile TiO2 and the thin interfacial layer contribute to carrier transport: the rutile TiO2 bulk region (mobility μ ∼ 0.03 cm2 V−1 s−1) and the 1.5-nm-thick interfacial layer (μ ∼ 0.3 cm2 V−1 s−1). The effective thickness of the interfacial layer, which was obtained from the S-n relation, was below ∼3 nm, which agrees well with that of the TEM observation (∼1.5 nm), clearly showing that electric field modulation measurement of S-n relation can effectively clarify the carrier transport properties of a bilayer laminate structure.</abstract><doi>10.1063/1.3633217</doi></addata></record> |
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| title | Electric field thermopower modulation analysis of an interfacial conducting layer formed between Y2O3 and rutile TiO2 |
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