Microwave properties and strain-induced lattice defects of c -axis-oriented YBa2Cu3O7−δ thin films on silicon

The microwave properties and the crystal structure of YBa2Cu3O7−δ thin films are examined as a function of film thickness. Already below the critical thickness for the formation of macroscopic fractures, we observe an increase of the residual surface resistance with thickness. Cross-sectional transm...

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Veröffentlicht in:	Journal of applied physics 1996-09, Vol.80 (6), p.3488-3492
Hauptverfasser:	Jaekel, C., Kyas, G., Roskos, H. G., Kurz, H., Kabius, B., Meertens, D., Prusseit, W., Utz, B.
Format:	Artikel
Sprache:	eng
Online-Zugang:	Volltext
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