Continuous evolution of the in-plane magnetic anisotropies with thickness in epitaxial Fe films

We have studied the evolution of the magnetic in-plane anisotropy in epitaxial Fe/GaAs films of both (001) and (1̄10) orientation as a function of the Fe layer thickness using the longitudinal magneto-optic Kerr effect and Brillouin light scattering. Magnetization curves which are recorded in situ d...

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Veröffentlicht in:Journal of applied physics 1996-07, Vol.80 (1), p.347-355
Hauptverfasser: Gester, M., Daboo, C., Hicken, R. J., Gray, S. J., Ercole, A., Bland, J. A. C
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container_end_page 355
container_issue 1
container_start_page 347
container_title Journal of applied physics
container_volume 80
creator Gester, M.
Daboo, C.
Hicken, R. J.
Gray, S. J.
Ercole, A.
Bland, J. A. C
description We have studied the evolution of the magnetic in-plane anisotropy in epitaxial Fe/GaAs films of both (001) and (1̄10) orientation as a function of the Fe layer thickness using the longitudinal magneto-optic Kerr effect and Brillouin light scattering. Magnetization curves which are recorded in situ during film growth reveal a continuous change of the net anisotropy axes with increasing film thickness. This behavior can be understood to arise from the combination of a uniaxial and a cubic in-plane magnetic anisotropy which are both thickness dependent. Structural analysis of the substrate and Fe film surfaces provides insight into the contribution of atomic steps at the interfaces to the magnetic anisotropy. Changing the degree of crystalline order at the Fe–GaAs interface allows us to conclude that the magnetic anisotropies are determined by atomic scale order.
doi_str_mv 10.1063/1.362788
format Article
fullrecord <record><control><sourceid>crossref</sourceid><recordid>TN_cdi_crossref_primary_10_1063_1_362788</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>10_1063_1_362788</sourcerecordid><originalsourceid>FETCH-LOGICAL-c259t-d6693b6d5ddf566c379c9a19b3c330d8fc5125c166648f40921510622e6b9ae63</originalsourceid><addsrcrecordid>eNotkM1OxCAYRYnRxDqa-Ags3XTkg4HC0jSOmkziRteEUnDQFppC_Xl7x4yruzm5yTkIXQNZAxHsFtZM0EbKE1QBkapuOCenqCKEQi1Vo87RRc7vhABIpiqk2xRLiEtaMnafaVhKSBEnj8ve4RDraTDR4dG8RVeCxSaGnMqcpuAy_gplf-CC_Ygu5wON3RSK-Q5mwFuHfRjGfInOvBmyu_rfFXrd3r-0j_Xu-eGpvdvVlnJV6l4IxTrR8773XAjLGmWVAdUxyxjppbccKLcghNhIvyGKAj_oUupEp4wTbIVujr92TjnPzutpDqOZfzQQ_RdGgz6GYb92FlYa</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Continuous evolution of the in-plane magnetic anisotropies with thickness in epitaxial Fe films</title><source>AIP Digital Archive</source><creator>Gester, M. ; Daboo, C. ; Hicken, R. J. ; Gray, S. J. ; Ercole, A. ; Bland, J. A. C</creator><creatorcontrib>Gester, M. ; Daboo, C. ; Hicken, R. J. ; Gray, S. J. ; Ercole, A. ; Bland, J. A. C</creatorcontrib><description>We have studied the evolution of the magnetic in-plane anisotropy in epitaxial Fe/GaAs films of both (001) and (1̄10) orientation as a function of the Fe layer thickness using the longitudinal magneto-optic Kerr effect and Brillouin light scattering. Magnetization curves which are recorded in situ during film growth reveal a continuous change of the net anisotropy axes with increasing film thickness. This behavior can be understood to arise from the combination of a uniaxial and a cubic in-plane magnetic anisotropy which are both thickness dependent. Structural analysis of the substrate and Fe film surfaces provides insight into the contribution of atomic steps at the interfaces to the magnetic anisotropy. Changing the degree of crystalline order at the Fe–GaAs interface allows us to conclude that the magnetic anisotropies are determined by atomic scale order.</description><identifier>ISSN: 0021-8979</identifier><identifier>EISSN: 1089-7550</identifier><identifier>DOI: 10.1063/1.362788</identifier><language>eng</language><ispartof>Journal of applied physics, 1996-07, Vol.80 (1), p.347-355</ispartof><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c259t-d6693b6d5ddf566c379c9a19b3c330d8fc5125c166648f40921510622e6b9ae63</citedby><cites>FETCH-LOGICAL-c259t-d6693b6d5ddf566c379c9a19b3c330d8fc5125c166648f40921510622e6b9ae63</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,776,780,27903,27904</link.rule.ids></links><search><creatorcontrib>Gester, M.</creatorcontrib><creatorcontrib>Daboo, C.</creatorcontrib><creatorcontrib>Hicken, R. J.</creatorcontrib><creatorcontrib>Gray, S. J.</creatorcontrib><creatorcontrib>Ercole, A.</creatorcontrib><creatorcontrib>Bland, J. A. C</creatorcontrib><title>Continuous evolution of the in-plane magnetic anisotropies with thickness in epitaxial Fe films</title><title>Journal of applied physics</title><description>We have studied the evolution of the magnetic in-plane anisotropy in epitaxial Fe/GaAs films of both (001) and (1̄10) orientation as a function of the Fe layer thickness using the longitudinal magneto-optic Kerr effect and Brillouin light scattering. Magnetization curves which are recorded in situ during film growth reveal a continuous change of the net anisotropy axes with increasing film thickness. This behavior can be understood to arise from the combination of a uniaxial and a cubic in-plane magnetic anisotropy which are both thickness dependent. Structural analysis of the substrate and Fe film surfaces provides insight into the contribution of atomic steps at the interfaces to the magnetic anisotropy. Changing the degree of crystalline order at the Fe–GaAs interface allows us to conclude that the magnetic anisotropies are determined by atomic scale order.</description><issn>0021-8979</issn><issn>1089-7550</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1996</creationdate><recordtype>article</recordtype><recordid>eNotkM1OxCAYRYnRxDqa-Ags3XTkg4HC0jSOmkziRteEUnDQFppC_Xl7x4yruzm5yTkIXQNZAxHsFtZM0EbKE1QBkapuOCenqCKEQi1Vo87RRc7vhABIpiqk2xRLiEtaMnafaVhKSBEnj8ve4RDraTDR4dG8RVeCxSaGnMqcpuAy_gplf-CC_Ygu5wON3RSK-Q5mwFuHfRjGfInOvBmyu_rfFXrd3r-0j_Xu-eGpvdvVlnJV6l4IxTrR8773XAjLGmWVAdUxyxjppbccKLcghNhIvyGKAj_oUupEp4wTbIVujr92TjnPzutpDqOZfzQQ_RdGgz6GYb92FlYa</recordid><startdate>19960701</startdate><enddate>19960701</enddate><creator>Gester, M.</creator><creator>Daboo, C.</creator><creator>Hicken, R. J.</creator><creator>Gray, S. J.</creator><creator>Ercole, A.</creator><creator>Bland, J. A. C</creator><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>19960701</creationdate><title>Continuous evolution of the in-plane magnetic anisotropies with thickness in epitaxial Fe films</title><author>Gester, M. ; Daboo, C. ; Hicken, R. J. ; Gray, S. J. ; Ercole, A. ; Bland, J. A. C</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c259t-d6693b6d5ddf566c379c9a19b3c330d8fc5125c166648f40921510622e6b9ae63</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1996</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Gester, M.</creatorcontrib><creatorcontrib>Daboo, C.</creatorcontrib><creatorcontrib>Hicken, R. J.</creatorcontrib><creatorcontrib>Gray, S. J.</creatorcontrib><creatorcontrib>Ercole, A.</creatorcontrib><creatorcontrib>Bland, J. A. C</creatorcontrib><collection>CrossRef</collection><jtitle>Journal of applied physics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Gester, M.</au><au>Daboo, C.</au><au>Hicken, R. J.</au><au>Gray, S. J.</au><au>Ercole, A.</au><au>Bland, J. A. C</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Continuous evolution of the in-plane magnetic anisotropies with thickness in epitaxial Fe films</atitle><jtitle>Journal of applied physics</jtitle><date>1996-07-01</date><risdate>1996</risdate><volume>80</volume><issue>1</issue><spage>347</spage><epage>355</epage><pages>347-355</pages><issn>0021-8979</issn><eissn>1089-7550</eissn><abstract>We have studied the evolution of the magnetic in-plane anisotropy in epitaxial Fe/GaAs films of both (001) and (1̄10) orientation as a function of the Fe layer thickness using the longitudinal magneto-optic Kerr effect and Brillouin light scattering. Magnetization curves which are recorded in situ during film growth reveal a continuous change of the net anisotropy axes with increasing film thickness. This behavior can be understood to arise from the combination of a uniaxial and a cubic in-plane magnetic anisotropy which are both thickness dependent. Structural analysis of the substrate and Fe film surfaces provides insight into the contribution of atomic steps at the interfaces to the magnetic anisotropy. Changing the degree of crystalline order at the Fe–GaAs interface allows us to conclude that the magnetic anisotropies are determined by atomic scale order.</abstract><doi>10.1063/1.362788</doi><tpages>9</tpages><oa>free_for_read</oa></addata></record>
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title Continuous evolution of the in-plane magnetic anisotropies with thickness in epitaxial Fe films
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-23T12%3A42%3A25IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-crossref&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Continuous%20evolution%20of%20the%20in-plane%20magnetic%20anisotropies%20with%20thickness%20in%20epitaxial%20Fe%20films&rft.jtitle=Journal%20of%20applied%20physics&rft.au=Gester,%20M.&rft.date=1996-07-01&rft.volume=80&rft.issue=1&rft.spage=347&rft.epage=355&rft.pages=347-355&rft.issn=0021-8979&rft.eissn=1089-7550&rft_id=info:doi/10.1063/1.362788&rft_dat=%3Ccrossref%3E10_1063_1_362788%3C/crossref%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true