Investigation of HfO2 high-k dielectrics electronic structure on SiO2/Si substrate by x-ray photoelectron spectroscopy

In this Letter, x-ray photoelectron spectroscopy (XPS) was used to investigate electronic structures of HfO2 with various thicknesses on SiO2/Si substrate prepared by atomic layer deposition with post deposition annealing of 600 °C, which is compatible with a gate last process in the fabrication of...

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Veröffentlicht in:Applied physics letters 2011-07, Vol.99 (1)
Hauptverfasser: Duan, T. L., Yu, H. Y., Wu, L., Wang, Z. R., Foo, Y. L., Pan, J. S.
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Yu, H. Y.
Wu, L.
Wang, Z. R.
Foo, Y. L.
Pan, J. S.
description In this Letter, x-ray photoelectron spectroscopy (XPS) was used to investigate electronic structures of HfO2 with various thicknesses on SiO2/Si substrate prepared by atomic layer deposition with post deposition annealing of 600 °C, which is compatible with a gate last process in the fabrication of complementary metal oxide semiconductor. The hafnium silicate formed between HfO2 and SiO2 interface plays a key role in generating an internal electric field. This can be attributed to the presence of oxygen vacancies (Vo) at the interface. The XPS binding energy shifts of O 1s, Si 2p, and Hf 4f spectra with increasing HfO2 thicknesses can be explained by the presence of the internal field and differential charging effects. Electrical measurements of capacitor structures support the XPS result.
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fullrecord <record><control><sourceid>crossref</sourceid><recordid>TN_cdi_crossref_primary_10_1063_1_3609233</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>10_1063_1_3609233</sourcerecordid><originalsourceid>FETCH-LOGICAL-c330t-c6766b9bcbda520c4a5de8d69376c461c78889ed12d715610a54ee43ef1e099b3</originalsourceid><addsrcrecordid>eNo1kMFOwzAQRC0EEqFw4A985eDWGydOfEQV0EqVciicI8fZNIaSRLZbkb8npeW0b0czu9IQ8gh8DlyKBcyF5CoW4opEwLOMCYD8mkScc8GkSuGW3Hn_Oa3pZIrIcd0d0Qe708H2He0bumqKmLZ217IvWlvcownOGk_P1HfWUB_cwYSDQzpFtraIF1tL_aGadB2QViP9YU6PdGj70P_nqB_-wJt-GO_JTaP3Hh8uc0Y-Xl_elyu2Kd7Wy-cNM0LwwIzMpKxUZapapzE3iU5rzGupRCZNIsFkeZ4rrCGuM0glcJ0miInABpArVYkZeTrfNdNj77ApB2e_tRtL4OWpsBLKS2HiFxqpX1Q</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Investigation of HfO2 high-k dielectrics electronic structure on SiO2/Si substrate by x-ray photoelectron spectroscopy</title><source>AIP Journals Complete</source><source>AIP Digital Archive</source><source>Alma/SFX Local Collection</source><creator>Duan, T. L. ; Yu, H. Y. ; Wu, L. ; Wang, Z. R. ; Foo, Y. L. ; Pan, J. S.</creator><creatorcontrib>Duan, T. L. ; Yu, H. Y. ; Wu, L. ; Wang, Z. R. ; Foo, Y. L. ; Pan, J. S.</creatorcontrib><description>In this Letter, x-ray photoelectron spectroscopy (XPS) was used to investigate electronic structures of HfO2 with various thicknesses on SiO2/Si substrate prepared by atomic layer deposition with post deposition annealing of 600 °C, which is compatible with a gate last process in the fabrication of complementary metal oxide semiconductor. The hafnium silicate formed between HfO2 and SiO2 interface plays a key role in generating an internal electric field. This can be attributed to the presence of oxygen vacancies (Vo) at the interface. The XPS binding energy shifts of O 1s, Si 2p, and Hf 4f spectra with increasing HfO2 thicknesses can be explained by the presence of the internal field and differential charging effects. Electrical measurements of capacitor structures support the XPS result.</description><identifier>ISSN: 0003-6951</identifier><identifier>EISSN: 1077-3118</identifier><identifier>DOI: 10.1063/1.3609233</identifier><language>eng</language><ispartof>Applied physics letters, 2011-07, Vol.99 (1)</ispartof><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c330t-c6766b9bcbda520c4a5de8d69376c461c78889ed12d715610a54ee43ef1e099b3</citedby><cites>FETCH-LOGICAL-c330t-c6766b9bcbda520c4a5de8d69376c461c78889ed12d715610a54ee43ef1e099b3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784,27924,27925</link.rule.ids></links><search><creatorcontrib>Duan, T. L.</creatorcontrib><creatorcontrib>Yu, H. Y.</creatorcontrib><creatorcontrib>Wu, L.</creatorcontrib><creatorcontrib>Wang, Z. R.</creatorcontrib><creatorcontrib>Foo, Y. L.</creatorcontrib><creatorcontrib>Pan, J. S.</creatorcontrib><title>Investigation of HfO2 high-k dielectrics electronic structure on SiO2/Si substrate by x-ray photoelectron spectroscopy</title><title>Applied physics letters</title><description>In this Letter, x-ray photoelectron spectroscopy (XPS) was used to investigate electronic structures of HfO2 with various thicknesses on SiO2/Si substrate prepared by atomic layer deposition with post deposition annealing of 600 °C, which is compatible with a gate last process in the fabrication of complementary metal oxide semiconductor. The hafnium silicate formed between HfO2 and SiO2 interface plays a key role in generating an internal electric field. This can be attributed to the presence of oxygen vacancies (Vo) at the interface. The XPS binding energy shifts of O 1s, Si 2p, and Hf 4f spectra with increasing HfO2 thicknesses can be explained by the presence of the internal field and differential charging effects. Electrical measurements of capacitor structures support the XPS result.</description><issn>0003-6951</issn><issn>1077-3118</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2011</creationdate><recordtype>article</recordtype><recordid>eNo1kMFOwzAQRC0EEqFw4A985eDWGydOfEQV0EqVciicI8fZNIaSRLZbkb8npeW0b0czu9IQ8gh8DlyKBcyF5CoW4opEwLOMCYD8mkScc8GkSuGW3Hn_Oa3pZIrIcd0d0Qe708H2He0bumqKmLZ217IvWlvcownOGk_P1HfWUB_cwYSDQzpFtraIF1tL_aGadB2QViP9YU6PdGj70P_nqB_-wJt-GO_JTaP3Hh8uc0Y-Xl_elyu2Kd7Wy-cNM0LwwIzMpKxUZapapzE3iU5rzGupRCZNIsFkeZ4rrCGuM0glcJ0miInABpArVYkZeTrfNdNj77ApB2e_tRtL4OWpsBLKS2HiFxqpX1Q</recordid><startdate>20110704</startdate><enddate>20110704</enddate><creator>Duan, T. L.</creator><creator>Yu, H. Y.</creator><creator>Wu, L.</creator><creator>Wang, Z. R.</creator><creator>Foo, Y. L.</creator><creator>Pan, J. S.</creator><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>20110704</creationdate><title>Investigation of HfO2 high-k dielectrics electronic structure on SiO2/Si substrate by x-ray photoelectron spectroscopy</title><author>Duan, T. L. ; Yu, H. Y. ; Wu, L. ; Wang, Z. R. ; Foo, Y. L. ; Pan, J. S.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c330t-c6766b9bcbda520c4a5de8d69376c461c78889ed12d715610a54ee43ef1e099b3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2011</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Duan, T. L.</creatorcontrib><creatorcontrib>Yu, H. Y.</creatorcontrib><creatorcontrib>Wu, L.</creatorcontrib><creatorcontrib>Wang, Z. R.</creatorcontrib><creatorcontrib>Foo, Y. L.</creatorcontrib><creatorcontrib>Pan, J. S.</creatorcontrib><collection>CrossRef</collection><jtitle>Applied physics letters</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Duan, T. L.</au><au>Yu, H. Y.</au><au>Wu, L.</au><au>Wang, Z. R.</au><au>Foo, Y. L.</au><au>Pan, J. S.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Investigation of HfO2 high-k dielectrics electronic structure on SiO2/Si substrate by x-ray photoelectron spectroscopy</atitle><jtitle>Applied physics letters</jtitle><date>2011-07-04</date><risdate>2011</risdate><volume>99</volume><issue>1</issue><issn>0003-6951</issn><eissn>1077-3118</eissn><abstract>In this Letter, x-ray photoelectron spectroscopy (XPS) was used to investigate electronic structures of HfO2 with various thicknesses on SiO2/Si substrate prepared by atomic layer deposition with post deposition annealing of 600 °C, which is compatible with a gate last process in the fabrication of complementary metal oxide semiconductor. The hafnium silicate formed between HfO2 and SiO2 interface plays a key role in generating an internal electric field. This can be attributed to the presence of oxygen vacancies (Vo) at the interface. The XPS binding energy shifts of O 1s, Si 2p, and Hf 4f spectra with increasing HfO2 thicknesses can be explained by the presence of the internal field and differential charging effects. Electrical measurements of capacitor structures support the XPS result.</abstract><doi>10.1063/1.3609233</doi><oa>free_for_read</oa></addata></record>
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title Investigation of HfO2 high-k dielectrics electronic structure on SiO2/Si substrate by x-ray photoelectron spectroscopy
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-02T11%3A01%3A26IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-crossref&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Investigation%20of%20HfO2%20high-k%20dielectrics%20electronic%20structure%20on%20SiO2/Si%20substrate%20by%20x-ray%20photoelectron%20spectroscopy&rft.jtitle=Applied%20physics%20letters&rft.au=Duan,%20T.%20L.&rft.date=2011-07-04&rft.volume=99&rft.issue=1&rft.issn=0003-6951&rft.eissn=1077-3118&rft_id=info:doi/10.1063/1.3609233&rft_dat=%3Ccrossref%3E10_1063_1_3609233%3C/crossref%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true