Ultrahigh-vacuum scanning electron microscopy characterization of the growth of Fe on CaF2/Si(111): Selective nucleation on electron-beam modified surfaces

The initial stages of Fe island growth on electron-beam modified and unmodified CaF2/Si(111) surfaces were studied with a nanometer lateral spatial resolution ultrahigh-vacuum scanning electron microscope. Fe coverages between 7 and 8 ML (deposition rates from 0.12 to 0.19 ML/min, 1 ML=7.7×1014 atom...

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Veröffentlicht in:	Journal of applied physics 1994-12, Vol.76 (12), p.8105-8112
Hauptverfasser:	Heim, K. R., Hembree, G. G., Scheinfein, M. R.
Format:	Artikel
Sprache:	eng
Online-Zugang:	Volltext
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