Estimate of the ultimate performance of the single-electron transistor

The scaling limit of current semiconductor devices is thought to be about 100 nm. To reduce the size of devices beyond this point will probably require a new device technology. The metal single-electron transistor, using the Coulomb blockade effect, has been proposed as a replacement for semiconduct...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Journal of applied physics 1994-04, Vol.75 (7), p.3654-3661
Hauptverfasser: Lutwyche, M. I., Wada, Y.
Format: Artikel
Sprache:eng
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!