A multi-channel structure to enhance the performance of a sequential lateral solidification thin-film transistor

Sequential lateral solidification (SLS) thin-film transistors (TFTs) offer higher performance than conventional excimer laser-annealed TFTs. However, their performance has an anisotropy originating from the polycrystalline silicon (p-Si) microstructure. The properties of TFTs with channel direction...

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Veröffentlicht in:Applied physics letters 2010-11, Vol.97 (20), p.202103-202103-3
Hauptverfasser: Kang, Myung-Koo, Kim, Si Joon, Kim, Hyun Jae
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Kim, Si Joon
Kim, Hyun Jae
description Sequential lateral solidification (SLS) thin-film transistors (TFTs) offer higher performance than conventional excimer laser-annealed TFTs. However, their performance has an anisotropy originating from the polycrystalline silicon (p-Si) microstructure. The properties of TFTs with channel direction parallel to the lateral growth (parallel TFTs) are superior to those of TFTs with a perpendicular channel direction (perpendicular TFTs). The multi-channel structure proposed in this paper, which directly incorporates a parallel component in a perpendicular TFT, exhibits greatly improved properties. This MC structure can be applied not only to p-Si produced by SLS, but also to any material with property anisotropy.
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fullrecord <record><control><sourceid>scitation_cross</sourceid><recordid>TN_cdi_crossref_primary_10_1063_1_3515856</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>apl</sourcerecordid><originalsourceid>FETCH-LOGICAL-c350t-255a378a3814440e97b1a17fad79cd6c01f5fb04de91e6e337569b85aef1c3473</originalsourceid><addsrcrecordid>eNp1kDtPAzEQhC0EEiFQ8A_cUjh44_P5rkGKIl5SJBqoLce3Vozu7GD7Cv49l0dLNTur2dXoI-Qe-AJ4LR5hISTIRtYXZAZcKSYAmksy45wLVrcSrslNzt-TlUshZmS_osPYF8_szoSAPc0ljbaMCWmJFMO0tdO4Q7rH5GIajj46amjGnxFD8aanvSmYJs2x95133priY5jOfGDO9wMtyYTsc4npllw502e8O-ucfL08f67f2Obj9X292jArJC9sKaURqjGigaqqOLZqCwaUM51qbVdbDk66La86bAFrFELJut020qADKyol5uTh9NemmHNCp_fJDyb9auD6gEqDPqOask-nbLa-HKv_H17pIy995qUPvMQfSP1zLQ</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>A multi-channel structure to enhance the performance of a sequential lateral solidification thin-film transistor</title><source>AIP Journals Complete</source><source>AIP Digital Archive</source><source>Alma/SFX Local Collection</source><creator>Kang, Myung-Koo ; Kim, Si Joon ; Kim, Hyun Jae</creator><creatorcontrib>Kang, Myung-Koo ; Kim, Si Joon ; Kim, Hyun Jae</creatorcontrib><description>Sequential lateral solidification (SLS) thin-film transistors (TFTs) offer higher performance than conventional excimer laser-annealed TFTs. However, their performance has an anisotropy originating from the polycrystalline silicon (p-Si) microstructure. The properties of TFTs with channel direction parallel to the lateral growth (parallel TFTs) are superior to those of TFTs with a perpendicular channel direction (perpendicular TFTs). The multi-channel structure proposed in this paper, which directly incorporates a parallel component in a perpendicular TFT, exhibits greatly improved properties. This MC structure can be applied not only to p-Si produced by SLS, but also to any material with property anisotropy.</description><identifier>ISSN: 0003-6951</identifier><identifier>EISSN: 1077-3118</identifier><identifier>DOI: 10.1063/1.3515856</identifier><identifier>CODEN: APPLAB</identifier><language>eng</language><publisher>American Institute of Physics</publisher><ispartof>Applied physics letters, 2010-11, Vol.97 (20), p.202103-202103-3</ispartof><rights>2010 American Institute of Physics</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c350t-255a378a3814440e97b1a17fad79cd6c01f5fb04de91e6e337569b85aef1c3473</citedby><cites>FETCH-LOGICAL-c350t-255a378a3814440e97b1a17fad79cd6c01f5fb04de91e6e337569b85aef1c3473</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://pubs.aip.org/apl/article-lookup/doi/10.1063/1.3515856$$EHTML$$P50$$Gscitation$$H</linktohtml><link.rule.ids>314,776,780,790,1553,4497,27903,27904,76130,76136</link.rule.ids></links><search><creatorcontrib>Kang, Myung-Koo</creatorcontrib><creatorcontrib>Kim, Si Joon</creatorcontrib><creatorcontrib>Kim, Hyun Jae</creatorcontrib><title>A multi-channel structure to enhance the performance of a sequential lateral solidification thin-film transistor</title><title>Applied physics letters</title><description>Sequential lateral solidification (SLS) thin-film transistors (TFTs) offer higher performance than conventional excimer laser-annealed TFTs. However, their performance has an anisotropy originating from the polycrystalline silicon (p-Si) microstructure. The properties of TFTs with channel direction parallel to the lateral growth (parallel TFTs) are superior to those of TFTs with a perpendicular channel direction (perpendicular TFTs). The multi-channel structure proposed in this paper, which directly incorporates a parallel component in a perpendicular TFT, exhibits greatly improved properties. This MC structure can be applied not only to p-Si produced by SLS, but also to any material with property anisotropy.</description><issn>0003-6951</issn><issn>1077-3118</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2010</creationdate><recordtype>article</recordtype><recordid>eNp1kDtPAzEQhC0EEiFQ8A_cUjh44_P5rkGKIl5SJBqoLce3Vozu7GD7Cv49l0dLNTur2dXoI-Qe-AJ4LR5hISTIRtYXZAZcKSYAmksy45wLVrcSrslNzt-TlUshZmS_osPYF8_szoSAPc0ljbaMCWmJFMO0tdO4Q7rH5GIajj46amjGnxFD8aanvSmYJs2x95133priY5jOfGDO9wMtyYTsc4npllw502e8O-ucfL08f67f2Obj9X292jArJC9sKaURqjGigaqqOLZqCwaUM51qbVdbDk66La86bAFrFELJut020qADKyol5uTh9NemmHNCp_fJDyb9auD6gEqDPqOask-nbLa-HKv_H17pIy995qUPvMQfSP1zLQ</recordid><startdate>20101115</startdate><enddate>20101115</enddate><creator>Kang, Myung-Koo</creator><creator>Kim, Si Joon</creator><creator>Kim, Hyun Jae</creator><general>American Institute of Physics</general><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>20101115</creationdate><title>A multi-channel structure to enhance the performance of a sequential lateral solidification thin-film transistor</title><author>Kang, Myung-Koo ; Kim, Si Joon ; Kim, Hyun Jae</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c350t-255a378a3814440e97b1a17fad79cd6c01f5fb04de91e6e337569b85aef1c3473</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2010</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Kang, Myung-Koo</creatorcontrib><creatorcontrib>Kim, Si Joon</creatorcontrib><creatorcontrib>Kim, Hyun Jae</creatorcontrib><collection>CrossRef</collection><jtitle>Applied physics letters</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Kang, Myung-Koo</au><au>Kim, Si Joon</au><au>Kim, Hyun Jae</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>A multi-channel structure to enhance the performance of a sequential lateral solidification thin-film transistor</atitle><jtitle>Applied physics letters</jtitle><date>2010-11-15</date><risdate>2010</risdate><volume>97</volume><issue>20</issue><spage>202103</spage><epage>202103-3</epage><pages>202103-202103-3</pages><issn>0003-6951</issn><eissn>1077-3118</eissn><coden>APPLAB</coden><abstract>Sequential lateral solidification (SLS) thin-film transistors (TFTs) offer higher performance than conventional excimer laser-annealed TFTs. However, their performance has an anisotropy originating from the polycrystalline silicon (p-Si) microstructure. The properties of TFTs with channel direction parallel to the lateral growth (parallel TFTs) are superior to those of TFTs with a perpendicular channel direction (perpendicular TFTs). The multi-channel structure proposed in this paper, which directly incorporates a parallel component in a perpendicular TFT, exhibits greatly improved properties. This MC structure can be applied not only to p-Si produced by SLS, but also to any material with property anisotropy.</abstract><pub>American Institute of Physics</pub><doi>10.1063/1.3515856</doi></addata></record>
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title A multi-channel structure to enhance the performance of a sequential lateral solidification thin-film transistor
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-26T11%3A24%3A01IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-scitation_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=A%20multi-channel%20structure%20to%20enhance%20the%20performance%20of%20a%20sequential%20lateral%20solidification%20thin-film%20transistor&rft.jtitle=Applied%20physics%20letters&rft.au=Kang,%20Myung-Koo&rft.date=2010-11-15&rft.volume=97&rft.issue=20&rft.spage=202103&rft.epage=202103-3&rft.pages=202103-202103-3&rft.issn=0003-6951&rft.eissn=1077-3118&rft.coden=APPLAB&rft_id=info:doi/10.1063/1.3515856&rft_dat=%3Cscitation_cross%3Eapl%3C/scitation_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true