Retrieval of terahertz spectroscopic signatures in the presence of rough surface scattering using wavelet methods
Scattering of terahertz waves by surface roughness can obscure spectral signatures of chemicals at these frequencies. We demonstrate this effect using controlled levels of surface scattering on α -lactose monohydrate pellets. Furthermore, we show an implementation of wavelet methods that can retriev...
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| Veröffentlicht in: | Applied physics letters 2010-11, Vol.97 (18), p.181903-181903-3 |
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| container_end_page | 181903-3 |
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| container_issue | 18 |
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| container_title | Applied physics letters |
| container_volume | 97 |
| creator | Arbab, M. H. Winebrenner, D. P. Thorsos, E. I. Chen, A. |
| description | Scattering of terahertz waves by surface roughness can obscure spectral signatures of chemicals at these frequencies. We demonstrate this effect using controlled levels of surface scattering on
α
-lactose monohydrate pellets. Furthermore, we show an implementation of wavelet methods that can retrieve terahertz spectral information from rough surface targets. We use a multiresolution analysis of the rough-surface-scattered signal utilizing the maximal overlap discrete wavelet transform (MODWT) to extract the resonant signature of lactose. We present a periodic extension technique to circumvent the circular boundary conditions of MODWT, which can be robustly used in an automated terahertz stand-off detection device. |
| doi_str_mv | 10.1063/1.3507384 |
| format | Article |
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α
-lactose monohydrate pellets. Furthermore, we show an implementation of wavelet methods that can retrieve terahertz spectral information from rough surface targets. We use a multiresolution analysis of the rough-surface-scattered signal utilizing the maximal overlap discrete wavelet transform (MODWT) to extract the resonant signature of lactose. We present a periodic extension technique to circumvent the circular boundary conditions of MODWT, which can be robustly used in an automated terahertz stand-off detection device.</description><identifier>ISSN: 0003-6951</identifier><identifier>EISSN: 1077-3118</identifier><identifier>DOI: 10.1063/1.3507384</identifier><identifier>CODEN: APPLAB</identifier><language>eng</language><publisher>American Institute of Physics</publisher><ispartof>Applied physics letters, 2010-11, Vol.97 (18), p.181903-181903-3</ispartof><rights>2010 American Institute of Physics</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c350t-edc37a70a9bedce3714d3884549c9697370c0831085ea3414cfb74038a5f72723</citedby><cites>FETCH-LOGICAL-c350t-edc37a70a9bedce3714d3884549c9697370c0831085ea3414cfb74038a5f72723</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://pubs.aip.org/apl/article-lookup/doi/10.1063/1.3507384$$EHTML$$P50$$Gscitation$$H</linktohtml><link.rule.ids>314,780,784,794,1559,4512,27924,27925,76384,76390</link.rule.ids></links><search><creatorcontrib>Arbab, M. H.</creatorcontrib><creatorcontrib>Winebrenner, D. P.</creatorcontrib><creatorcontrib>Thorsos, E. I.</creatorcontrib><creatorcontrib>Chen, A.</creatorcontrib><title>Retrieval of terahertz spectroscopic signatures in the presence of rough surface scattering using wavelet methods</title><title>Applied physics letters</title><description>Scattering of terahertz waves by surface roughness can obscure spectral signatures of chemicals at these frequencies. We demonstrate this effect using controlled levels of surface scattering on
α
-lactose monohydrate pellets. Furthermore, we show an implementation of wavelet methods that can retrieve terahertz spectral information from rough surface targets. We use a multiresolution analysis of the rough-surface-scattered signal utilizing the maximal overlap discrete wavelet transform (MODWT) to extract the resonant signature of lactose. We present a periodic extension technique to circumvent the circular boundary conditions of MODWT, which can be robustly used in an automated terahertz stand-off detection device.</description><issn>0003-6951</issn><issn>1077-3118</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2010</creationdate><recordtype>article</recordtype><recordid>eNp1kEtLAzEUhYMoWKsL_0G2LqYmvZkmsxGk-AJBEF2HNL3pRNrJmGQq-utNaXHn5r4498D5CLnkbMLZDK75BGomQYkjMuJMygo4V8dkxBiDatbU_JScpfRR1noKMCKfr5ijx61Z0-BoxmhajPmHph5tjiHZ0HtLk191Jg8RE_UdzS3SvszYWdx9xTCsWpqG6Ew5JGty8fHdig5pV7_MFteY6QZzG5bpnJw4s054cehj8n5_9zZ_rJ5fHp7mt8-VLQlyhUsL0khmmkUZESQXS1BK1KKxzayRIJllCjhTNRoQXFi3kIKBMrWTUzmFMbna-9oSI0V0uo9-Y-K35kzvWGmuD6yK9mavTdZnk33o_hf_AdPB6QMw-AVRRXN5</recordid><startdate>20101101</startdate><enddate>20101101</enddate><creator>Arbab, M. H.</creator><creator>Winebrenner, D. P.</creator><creator>Thorsos, E. I.</creator><creator>Chen, A.</creator><general>American Institute of Physics</general><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>20101101</creationdate><title>Retrieval of terahertz spectroscopic signatures in the presence of rough surface scattering using wavelet methods</title><author>Arbab, M. H. ; Winebrenner, D. P. ; Thorsos, E. I. ; Chen, A.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c350t-edc37a70a9bedce3714d3884549c9697370c0831085ea3414cfb74038a5f72723</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2010</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Arbab, M. H.</creatorcontrib><creatorcontrib>Winebrenner, D. P.</creatorcontrib><creatorcontrib>Thorsos, E. I.</creatorcontrib><creatorcontrib>Chen, A.</creatorcontrib><collection>CrossRef</collection><jtitle>Applied physics letters</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Arbab, M. H.</au><au>Winebrenner, D. P.</au><au>Thorsos, E. I.</au><au>Chen, A.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Retrieval of terahertz spectroscopic signatures in the presence of rough surface scattering using wavelet methods</atitle><jtitle>Applied physics letters</jtitle><date>2010-11-01</date><risdate>2010</risdate><volume>97</volume><issue>18</issue><spage>181903</spage><epage>181903-3</epage><pages>181903-181903-3</pages><issn>0003-6951</issn><eissn>1077-3118</eissn><coden>APPLAB</coden><abstract>Scattering of terahertz waves by surface roughness can obscure spectral signatures of chemicals at these frequencies. We demonstrate this effect using controlled levels of surface scattering on
α
-lactose monohydrate pellets. Furthermore, we show an implementation of wavelet methods that can retrieve terahertz spectral information from rough surface targets. We use a multiresolution analysis of the rough-surface-scattered signal utilizing the maximal overlap discrete wavelet transform (MODWT) to extract the resonant signature of lactose. We present a periodic extension technique to circumvent the circular boundary conditions of MODWT, which can be robustly used in an automated terahertz stand-off detection device.</abstract><pub>American Institute of Physics</pub><doi>10.1063/1.3507384</doi></addata></record> |
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| ispartof | Applied physics letters, 2010-11, Vol.97 (18), p.181903-181903-3 |
| issn | 0003-6951 1077-3118 |
| language | eng |
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| source | AIP Journals Complete; AIP Digital Archive; Alma/SFX Local Collection |
| title | Retrieval of terahertz spectroscopic signatures in the presence of rough surface scattering using wavelet methods |
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