Magnetic force microscopy with batch-fabricated force sensors

In this paper the properties of force sensors suitable for magnetic force microscopy (MFM) made by coating silicon microcantilevers with various thin magnetic films are analyzed. These MFM force sensors are batch fabricated and their magnetic properties controlled by choosing appropriate coatings. T...

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Veröffentlicht in:Journal of applied physics 1991-04, Vol.69 (8), p.5883-5885
Hauptverfasser: GRUÊTTER, P, RUGAR, D, MAMIN, H. J, CASTILLO, G, LIN, C.-J, MCFADYEN, I. R, WOLTER, O, BAYER, T, GRESCHNER, J
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container_end_page 5885
container_issue 8
container_start_page 5883
container_title Journal of applied physics
container_volume 69
creator GRUÊTTER, P
RUGAR, D
MAMIN, H. J
CASTILLO, G
LIN, C.-J
MCFADYEN, I. R
WOLTER, O
BAYER, T
GRESCHNER, J
description In this paper the properties of force sensors suitable for magnetic force microscopy (MFM) made by coating silicon microcantilevers with various thin magnetic films are analyzed. These MFM force sensors are batch fabricated and their magnetic properties controlled by choosing appropriate coatings. Theoretical calculations show that thin-film MFM tips have a significantly reduced stray field, a good signal-to-noise ratio, and yield improved resolution when compared to etched wire tips. The sample perturbation due to the tip stray field is small, allowing the imaging of low-coercivity samples such as Permalloy.
doi_str_mv 10.1063/1.347856
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Instruments, apparatus, components and techniques common to several branches of physics and astronomy
Other topics in instruments, apparatus, components and techniques common to several branches of physics and astronomy
Physics
title Magnetic force microscopy with batch-fabricated force sensors
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