Magnetic force microscopy with batch-fabricated force sensors
In this paper the properties of force sensors suitable for magnetic force microscopy (MFM) made by coating silicon microcantilevers with various thin magnetic films are analyzed. These MFM force sensors are batch fabricated and their magnetic properties controlled by choosing appropriate coatings. T...
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Veröffentlicht in: | Journal of applied physics 1991-04, Vol.69 (8), p.5883-5885 |
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container_title | Journal of applied physics |
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creator | GRUÊTTER, P RUGAR, D MAMIN, H. J CASTILLO, G LIN, C.-J MCFADYEN, I. R WOLTER, O BAYER, T GRESCHNER, J |
description | In this paper the properties of force sensors suitable for magnetic force microscopy (MFM) made by coating silicon microcantilevers with various thin magnetic films are analyzed. These MFM force sensors are batch fabricated and their magnetic properties controlled by choosing appropriate coatings. Theoretical calculations show that thin-film MFM tips have a significantly reduced stray field, a good signal-to-noise ratio, and yield improved resolution when compared to etched wire tips. The sample perturbation due to the tip stray field is small, allowing the imaging of low-coercivity samples such as Permalloy. |
doi_str_mv | 10.1063/1.347856 |
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fullrecord | <record><control><sourceid>pascalfrancis_cross</sourceid><recordid>TN_cdi_crossref_primary_10_1063_1_347856</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>19762973</sourcerecordid><originalsourceid>FETCH-LOGICAL-c345t-bb6a41aafd85ab8ec36e7e504a251a0013b67b951fff1820ce9aae1ab09c88e03</originalsourceid><addsrcrecordid>eNpFj0FLwzAYhoMoWKfgT-hF8JL5fU3TJAcPMpwKEy96Ll-yxEW2tiQF2b93owNP7-Xh5XkYu0WYIzTiAeeiVlo2Z6xA0IYrKeGcFQAVcm2UuWRXOf8AIGphCvb4Tt-dH6MrQ5-cL3fRpT67ftiXv3HclJZGt-GBbIqORr8-Ydl3uU_5ml0E2mZ_c9oZ-1o-fy5e-erj5W3xtOJO1HLk1jZUI1FYa0lWeycar7yEmiqJdHARtlHWSAwhoK7AeUPkkSwYp7UHMWP30-9RLicf2iHFHaV9i9Aes1tsp-wDejehA2VH25CoczH_80Y1lVFC_AG7eVdv</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Magnetic force microscopy with batch-fabricated force sensors</title><source>AIP Digital Archive</source><creator>GRUÊTTER, P ; RUGAR, D ; MAMIN, H. J ; CASTILLO, G ; LIN, C.-J ; MCFADYEN, I. R ; WOLTER, O ; BAYER, T ; GRESCHNER, J</creator><creatorcontrib>GRUÊTTER, P ; RUGAR, D ; MAMIN, H. J ; CASTILLO, G ; LIN, C.-J ; MCFADYEN, I. R ; WOLTER, O ; BAYER, T ; GRESCHNER, J</creatorcontrib><description>In this paper the properties of force sensors suitable for magnetic force microscopy (MFM) made by coating silicon microcantilevers with various thin magnetic films are analyzed. These MFM force sensors are batch fabricated and their magnetic properties controlled by choosing appropriate coatings. Theoretical calculations show that thin-film MFM tips have a significantly reduced stray field, a good signal-to-noise ratio, and yield improved resolution when compared to etched wire tips. The sample perturbation due to the tip stray field is small, allowing the imaging of low-coercivity samples such as Permalloy.</description><identifier>ISSN: 0021-8979</identifier><identifier>EISSN: 1089-7550</identifier><identifier>DOI: 10.1063/1.347856</identifier><identifier>CODEN: JAPIAU</identifier><language>eng</language><publisher>Woodbury, NY: American Institute of Physics</publisher><subject>Exact sciences and technology ; Instruments, apparatus, components and techniques common to several branches of physics and astronomy ; Other topics in instruments, apparatus, components and techniques common to several branches of physics and astronomy ; Physics</subject><ispartof>Journal of applied physics, 1991-04, Vol.69 (8), p.5883-5885</ispartof><rights>1991 INIST-CNRS</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c345t-bb6a41aafd85ab8ec36e7e504a251a0013b67b951fff1820ce9aae1ab09c88e03</citedby><cites>FETCH-LOGICAL-c345t-bb6a41aafd85ab8ec36e7e504a251a0013b67b951fff1820ce9aae1ab09c88e03</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>310,311,315,781,785,790,791,23935,23936,25145,27929,27930</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=19762973$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>GRUÊTTER, P</creatorcontrib><creatorcontrib>RUGAR, D</creatorcontrib><creatorcontrib>MAMIN, H. J</creatorcontrib><creatorcontrib>CASTILLO, G</creatorcontrib><creatorcontrib>LIN, C.-J</creatorcontrib><creatorcontrib>MCFADYEN, I. R</creatorcontrib><creatorcontrib>WOLTER, O</creatorcontrib><creatorcontrib>BAYER, T</creatorcontrib><creatorcontrib>GRESCHNER, J</creatorcontrib><title>Magnetic force microscopy with batch-fabricated force sensors</title><title>Journal of applied physics</title><description>In this paper the properties of force sensors suitable for magnetic force microscopy (MFM) made by coating silicon microcantilevers with various thin magnetic films are analyzed. These MFM force sensors are batch fabricated and their magnetic properties controlled by choosing appropriate coatings. Theoretical calculations show that thin-film MFM tips have a significantly reduced stray field, a good signal-to-noise ratio, and yield improved resolution when compared to etched wire tips. The sample perturbation due to the tip stray field is small, allowing the imaging of low-coercivity samples such as Permalloy.</description><subject>Exact sciences and technology</subject><subject>Instruments, apparatus, components and techniques common to several branches of physics and astronomy</subject><subject>Other topics in instruments, apparatus, components and techniques common to several branches of physics and astronomy</subject><subject>Physics</subject><issn>0021-8979</issn><issn>1089-7550</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1991</creationdate><recordtype>article</recordtype><recordid>eNpFj0FLwzAYhoMoWKfgT-hF8JL5fU3TJAcPMpwKEy96Ll-yxEW2tiQF2b93owNP7-Xh5XkYu0WYIzTiAeeiVlo2Z6xA0IYrKeGcFQAVcm2UuWRXOf8AIGphCvb4Tt-dH6MrQ5-cL3fRpT67ftiXv3HclJZGt-GBbIqORr8-Ydl3uU_5ml0E2mZ_c9oZ-1o-fy5e-erj5W3xtOJO1HLk1jZUI1FYa0lWeycar7yEmiqJdHARtlHWSAwhoK7AeUPkkSwYp7UHMWP30-9RLicf2iHFHaV9i9Aes1tsp-wDejehA2VH25CoczH_80Y1lVFC_AG7eVdv</recordid><startdate>19910415</startdate><enddate>19910415</enddate><creator>GRUÊTTER, P</creator><creator>RUGAR, D</creator><creator>MAMIN, H. J</creator><creator>CASTILLO, G</creator><creator>LIN, C.-J</creator><creator>MCFADYEN, I. R</creator><creator>WOLTER, O</creator><creator>BAYER, T</creator><creator>GRESCHNER, J</creator><general>American Institute of Physics</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>19910415</creationdate><title>Magnetic force microscopy with batch-fabricated force sensors</title><author>GRUÊTTER, P ; RUGAR, D ; MAMIN, H. J ; CASTILLO, G ; LIN, C.-J ; MCFADYEN, I. R ; WOLTER, O ; BAYER, T ; GRESCHNER, J</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c345t-bb6a41aafd85ab8ec36e7e504a251a0013b67b951fff1820ce9aae1ab09c88e03</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1991</creationdate><topic>Exact sciences and technology</topic><topic>Instruments, apparatus, components and techniques common to several branches of physics and astronomy</topic><topic>Other topics in instruments, apparatus, components and techniques common to several branches of physics and astronomy</topic><topic>Physics</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>GRUÊTTER, P</creatorcontrib><creatorcontrib>RUGAR, D</creatorcontrib><creatorcontrib>MAMIN, H. J</creatorcontrib><creatorcontrib>CASTILLO, G</creatorcontrib><creatorcontrib>LIN, C.-J</creatorcontrib><creatorcontrib>MCFADYEN, I. R</creatorcontrib><creatorcontrib>WOLTER, O</creatorcontrib><creatorcontrib>BAYER, T</creatorcontrib><creatorcontrib>GRESCHNER, J</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><jtitle>Journal of applied physics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>GRUÊTTER, P</au><au>RUGAR, D</au><au>MAMIN, H. J</au><au>CASTILLO, G</au><au>LIN, C.-J</au><au>MCFADYEN, I. R</au><au>WOLTER, O</au><au>BAYER, T</au><au>GRESCHNER, J</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Magnetic force microscopy with batch-fabricated force sensors</atitle><jtitle>Journal of applied physics</jtitle><date>1991-04-15</date><risdate>1991</risdate><volume>69</volume><issue>8</issue><spage>5883</spage><epage>5885</epage><pages>5883-5885</pages><issn>0021-8979</issn><eissn>1089-7550</eissn><coden>JAPIAU</coden><abstract>In this paper the properties of force sensors suitable for magnetic force microscopy (MFM) made by coating silicon microcantilevers with various thin magnetic films are analyzed. These MFM force sensors are batch fabricated and their magnetic properties controlled by choosing appropriate coatings. Theoretical calculations show that thin-film MFM tips have a significantly reduced stray field, a good signal-to-noise ratio, and yield improved resolution when compared to etched wire tips. The sample perturbation due to the tip stray field is small, allowing the imaging of low-coercivity samples such as Permalloy.</abstract><cop>Woodbury, NY</cop><pub>American Institute of Physics</pub><doi>10.1063/1.347856</doi><tpages>3</tpages><oa>free_for_read</oa></addata></record> |
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subjects | Exact sciences and technology Instruments, apparatus, components and techniques common to several branches of physics and astronomy Other topics in instruments, apparatus, components and techniques common to several branches of physics and astronomy Physics |
title | Magnetic force microscopy with batch-fabricated force sensors |
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