Two-photon subwavelength lithography with thermal light
We propose an incoherent interferometer which can partly modify the spatial correlation property of thermal light. Applying the interferometer to the two-photon double-slit interference with thermal light, we find that the subwavelength interference patterns appear in the intensity correlation not o...
Gespeichert in:
Veröffentlicht in: | Applied physics letters 2010-08, Vol.97 (5), p.051105-051105-3 |
---|---|
Hauptverfasser: | , , |
Format: | Artikel |
Sprache: | eng |
Online-Zugang: | Volltext |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | 051105-3 |
---|---|
container_issue | 5 |
container_start_page | 051105 |
container_title | Applied physics letters |
container_volume | 97 |
creator | Cao, De-Zhong Ge, Gui-Ju Wang, Kaige |
description | We propose an incoherent interferometer which can partly modify the spatial correlation property of thermal light. Applying the interferometer to the two-photon double-slit interference with thermal light, we find that the subwavelength interference patterns appear in the intensity correlation not only between two same polarized photons at different positions but also between two orthogonally polarized photons at the same position. The latter can correspond to the two-photon double-slit interference using a two-photon entangled source. Our experimental result suggests that a thermal light source is capable of accomplishing subwavelength lithography technique to surpass the Rayleigh resolution limit. |
doi_str_mv | 10.1063/1.3472112 |
format | Article |
fullrecord | <record><control><sourceid>scitation_cross</sourceid><recordid>TN_cdi_crossref_primary_10_1063_1_3472112</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>apl</sourcerecordid><originalsourceid>FETCH-LOGICAL-c284t-113018b1fc8c34e19d7b3b0c1acb70961a8d86f07ceac3dcc0b3edafbbe6701e3</originalsourceid><addsrcrecordid>eNp1j0tLxDAUhYMoWEcX_oNuXXS8t7fTpBtBBl8w4GZchyRNH9JpShMt8--tdHDn6p7L-TjwMXaLsEbI6R7XlPEUMT1jEQLnCSGKcxYBACV5scFLduX95_xuUqKI8f3kkqFxwfWx_9KT-rad7evQxF0bGlePamiO8TTnODR2PKhuLuomXLOLSnXe3pzuin08P-23r8nu_eVt-7hLTCqykCASoNBYGWEos1iUXJMGg8poDkWOSpQir4AbqwyVxoAmW6pKa5tzQEsrdrfsmtF5P9pKDmN7UONRIshfY4nyZDyzDwvrTRtUaF3_Pzxry0Vb_mnTD_03X0s</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Two-photon subwavelength lithography with thermal light</title><source>AIP Journals Complete</source><source>AIP Digital Archive</source><source>Alma/SFX Local Collection</source><creator>Cao, De-Zhong ; Ge, Gui-Ju ; Wang, Kaige</creator><creatorcontrib>Cao, De-Zhong ; Ge, Gui-Ju ; Wang, Kaige</creatorcontrib><description>We propose an incoherent interferometer which can partly modify the spatial correlation property of thermal light. Applying the interferometer to the two-photon double-slit interference with thermal light, we find that the subwavelength interference patterns appear in the intensity correlation not only between two same polarized photons at different positions but also between two orthogonally polarized photons at the same position. The latter can correspond to the two-photon double-slit interference using a two-photon entangled source. Our experimental result suggests that a thermal light source is capable of accomplishing subwavelength lithography technique to surpass the Rayleigh resolution limit.</description><identifier>ISSN: 0003-6951</identifier><identifier>EISSN: 1077-3118</identifier><identifier>DOI: 10.1063/1.3472112</identifier><identifier>CODEN: APPLAB</identifier><language>eng</language><publisher>American Institute of Physics</publisher><ispartof>Applied physics letters, 2010-08, Vol.97 (5), p.051105-051105-3</ispartof><rights>2010 American Institute of Physics</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c284t-113018b1fc8c34e19d7b3b0c1acb70961a8d86f07ceac3dcc0b3edafbbe6701e3</citedby><cites>FETCH-LOGICAL-c284t-113018b1fc8c34e19d7b3b0c1acb70961a8d86f07ceac3dcc0b3edafbbe6701e3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://pubs.aip.org/apl/article-lookup/doi/10.1063/1.3472112$$EHTML$$P50$$Gscitation$$H</linktohtml><link.rule.ids>314,776,780,790,1553,4498,27901,27902,76127,76133</link.rule.ids></links><search><creatorcontrib>Cao, De-Zhong</creatorcontrib><creatorcontrib>Ge, Gui-Ju</creatorcontrib><creatorcontrib>Wang, Kaige</creatorcontrib><title>Two-photon subwavelength lithography with thermal light</title><title>Applied physics letters</title><description>We propose an incoherent interferometer which can partly modify the spatial correlation property of thermal light. Applying the interferometer to the two-photon double-slit interference with thermal light, we find that the subwavelength interference patterns appear in the intensity correlation not only between two same polarized photons at different positions but also between two orthogonally polarized photons at the same position. The latter can correspond to the two-photon double-slit interference using a two-photon entangled source. Our experimental result suggests that a thermal light source is capable of accomplishing subwavelength lithography technique to surpass the Rayleigh resolution limit.</description><issn>0003-6951</issn><issn>1077-3118</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2010</creationdate><recordtype>article</recordtype><recordid>eNp1j0tLxDAUhYMoWEcX_oNuXXS8t7fTpBtBBl8w4GZchyRNH9JpShMt8--tdHDn6p7L-TjwMXaLsEbI6R7XlPEUMT1jEQLnCSGKcxYBACV5scFLduX95_xuUqKI8f3kkqFxwfWx_9KT-rad7evQxF0bGlePamiO8TTnODR2PKhuLuomXLOLSnXe3pzuin08P-23r8nu_eVt-7hLTCqykCASoNBYGWEos1iUXJMGg8poDkWOSpQir4AbqwyVxoAmW6pKa5tzQEsrdrfsmtF5P9pKDmN7UONRIshfY4nyZDyzDwvrTRtUaF3_Pzxry0Vb_mnTD_03X0s</recordid><startdate>20100802</startdate><enddate>20100802</enddate><creator>Cao, De-Zhong</creator><creator>Ge, Gui-Ju</creator><creator>Wang, Kaige</creator><general>American Institute of Physics</general><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>20100802</creationdate><title>Two-photon subwavelength lithography with thermal light</title><author>Cao, De-Zhong ; Ge, Gui-Ju ; Wang, Kaige</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c284t-113018b1fc8c34e19d7b3b0c1acb70961a8d86f07ceac3dcc0b3edafbbe6701e3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2010</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Cao, De-Zhong</creatorcontrib><creatorcontrib>Ge, Gui-Ju</creatorcontrib><creatorcontrib>Wang, Kaige</creatorcontrib><collection>CrossRef</collection><jtitle>Applied physics letters</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Cao, De-Zhong</au><au>Ge, Gui-Ju</au><au>Wang, Kaige</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Two-photon subwavelength lithography with thermal light</atitle><jtitle>Applied physics letters</jtitle><date>2010-08-02</date><risdate>2010</risdate><volume>97</volume><issue>5</issue><spage>051105</spage><epage>051105-3</epage><pages>051105-051105-3</pages><issn>0003-6951</issn><eissn>1077-3118</eissn><coden>APPLAB</coden><abstract>We propose an incoherent interferometer which can partly modify the spatial correlation property of thermal light. Applying the interferometer to the two-photon double-slit interference with thermal light, we find that the subwavelength interference patterns appear in the intensity correlation not only between two same polarized photons at different positions but also between two orthogonally polarized photons at the same position. The latter can correspond to the two-photon double-slit interference using a two-photon entangled source. Our experimental result suggests that a thermal light source is capable of accomplishing subwavelength lithography technique to surpass the Rayleigh resolution limit.</abstract><pub>American Institute of Physics</pub><doi>10.1063/1.3472112</doi></addata></record> |
fulltext | fulltext |
identifier | ISSN: 0003-6951 |
ispartof | Applied physics letters, 2010-08, Vol.97 (5), p.051105-051105-3 |
issn | 0003-6951 1077-3118 |
language | eng |
recordid | cdi_crossref_primary_10_1063_1_3472112 |
source | AIP Journals Complete; AIP Digital Archive; Alma/SFX Local Collection |
title | Two-photon subwavelength lithography with thermal light |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-03T04%3A15%3A23IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-scitation_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Two-photon%20subwavelength%20lithography%20with%20thermal%20light&rft.jtitle=Applied%20physics%20letters&rft.au=Cao,%20De-Zhong&rft.date=2010-08-02&rft.volume=97&rft.issue=5&rft.spage=051105&rft.epage=051105-3&rft.pages=051105-051105-3&rft.issn=0003-6951&rft.eissn=1077-3118&rft.coden=APPLAB&rft_id=info:doi/10.1063/1.3472112&rft_dat=%3Cscitation_cross%3Eapl%3C/scitation_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |