Growth of crystalline cobalt ferrite thin films at lower temperatures using pulsed-laser deposition technique
Cobalt ferrite thin films were grown on SiO 2 / Si ( 100 ) substrates using pulsed-laser deposition technique at substrate temperatures ranging from 250 to 600 ° C . Thermal expansion mismatch between the film and substrate appears to have a substantial effect on the magnetic properties of the cobal...
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Veröffentlicht in: | Journal of applied physics 2010-05, Vol.107 (9), p.09A516-09A516-3 |
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container_issue | 9 |
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container_title | Journal of applied physics |
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creator | Raghunathan, A. Nlebedim, I. C. Jiles, D. C. Snyder, J. E. |
description | Cobalt ferrite thin films were grown on
SiO
2
/
Si
(
100
)
substrates using pulsed-laser deposition technique at substrate temperatures ranging from 250 to
600
°
C
. Thermal expansion mismatch between the film and substrate appears to have a substantial effect on the magnetic properties of the cobalt ferrite films, due to the large magnetoelastic coupling of cobalt ferrite. It was shown in this study, that polycrystalline films with (111)-preferred orientation could be prepared at substrate temperatures as low as
250
°
C
. The growth of crystalline cobalt ferrite films at such low temperatures indicates the potential to use cobalt ferrite for microelectromechanical systems devices and sensor applications including integration with a wider range of multilayer device structures. |
doi_str_mv | 10.1063/1.3357315 |
format | Article |
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SiO
2
/
Si
(
100
)
substrates using pulsed-laser deposition technique at substrate temperatures ranging from 250 to
600
°
C
. Thermal expansion mismatch between the film and substrate appears to have a substantial effect on the magnetic properties of the cobalt ferrite films, due to the large magnetoelastic coupling of cobalt ferrite. It was shown in this study, that polycrystalline films with (111)-preferred orientation could be prepared at substrate temperatures as low as
250
°
C
. The growth of crystalline cobalt ferrite films at such low temperatures indicates the potential to use cobalt ferrite for microelectromechanical systems devices and sensor applications including integration with a wider range of multilayer device structures.</description><identifier>ISSN: 0021-8979</identifier><identifier>EISSN: 1089-7550</identifier><identifier>DOI: 10.1063/1.3357315</identifier><identifier>CODEN: JAPIAU</identifier><language>eng</language><publisher>American Institute of Physics</publisher><ispartof>Journal of applied physics, 2010-05, Vol.107 (9), p.09A516-09A516-3</ispartof><rights>2010 American Institute of Physics</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c350t-57343a91d5cba844552f5da884bb90e232450b678744a5d57a949a80270bc73b3</citedby><cites>FETCH-LOGICAL-c350t-57343a91d5cba844552f5da884bb90e232450b678744a5d57a949a80270bc73b3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://pubs.aip.org/jap/article-lookup/doi/10.1063/1.3357315$$EHTML$$P50$$Gscitation$$H</linktohtml><link.rule.ids>314,780,784,794,1559,4512,27924,27925,76384,76390</link.rule.ids></links><search><creatorcontrib>Raghunathan, A.</creatorcontrib><creatorcontrib>Nlebedim, I. C.</creatorcontrib><creatorcontrib>Jiles, D. C.</creatorcontrib><creatorcontrib>Snyder, J. E.</creatorcontrib><title>Growth of crystalline cobalt ferrite thin films at lower temperatures using pulsed-laser deposition technique</title><title>Journal of applied physics</title><description>Cobalt ferrite thin films were grown on
SiO
2
/
Si
(
100
)
substrates using pulsed-laser deposition technique at substrate temperatures ranging from 250 to
600
°
C
. Thermal expansion mismatch between the film and substrate appears to have a substantial effect on the magnetic properties of the cobalt ferrite films, due to the large magnetoelastic coupling of cobalt ferrite. It was shown in this study, that polycrystalline films with (111)-preferred orientation could be prepared at substrate temperatures as low as
250
°
C
. The growth of crystalline cobalt ferrite films at such low temperatures indicates the potential to use cobalt ferrite for microelectromechanical systems devices and sensor applications including integration with a wider range of multilayer device structures.</description><issn>0021-8979</issn><issn>1089-7550</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2010</creationdate><recordtype>article</recordtype><recordid>eNp1kMFOAyEURYnRxFpd-AdsXUyFAQpsTEyjrUkTN7omwIDFzAwjMGn6907TJq5cvcU9ubnvAHCP0QKjJXnEC0IYJ5hdgBlGQlacMXQJZgjVuBKSy2twk_M3QhgLImegW6e4LzsYPbTpkItu29A7aKPRbYHepRSKg2UXeuhD22WoC2zj3iVYXDe4pMuYXIZjDv0XHMY2u6ZqdZ7yxg0xhxJiP6F214ef0d2CK68n5u585-Dz9eVjtam27-u31fO2soShUk0PUKIlbpg1WlDKWO1Zo4WgxkjkalJThsySC06pZg3jWlKpBao5MpYTQ-bg4dRrU8w5Oa-GFDqdDgojdfSksDp7mtinE5ttKPq493_4JEtFr_5kkV_79nHn</recordid><startdate>20100501</startdate><enddate>20100501</enddate><creator>Raghunathan, A.</creator><creator>Nlebedim, I. C.</creator><creator>Jiles, D. C.</creator><creator>Snyder, J. E.</creator><general>American Institute of Physics</general><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>20100501</creationdate><title>Growth of crystalline cobalt ferrite thin films at lower temperatures using pulsed-laser deposition technique</title><author>Raghunathan, A. ; Nlebedim, I. C. ; Jiles, D. C. ; Snyder, J. E.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c350t-57343a91d5cba844552f5da884bb90e232450b678744a5d57a949a80270bc73b3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2010</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Raghunathan, A.</creatorcontrib><creatorcontrib>Nlebedim, I. C.</creatorcontrib><creatorcontrib>Jiles, D. C.</creatorcontrib><creatorcontrib>Snyder, J. E.</creatorcontrib><collection>CrossRef</collection><jtitle>Journal of applied physics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Raghunathan, A.</au><au>Nlebedim, I. C.</au><au>Jiles, D. C.</au><au>Snyder, J. E.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Growth of crystalline cobalt ferrite thin films at lower temperatures using pulsed-laser deposition technique</atitle><jtitle>Journal of applied physics</jtitle><date>2010-05-01</date><risdate>2010</risdate><volume>107</volume><issue>9</issue><spage>09A516</spage><epage>09A516-3</epage><pages>09A516-09A516-3</pages><issn>0021-8979</issn><eissn>1089-7550</eissn><coden>JAPIAU</coden><abstract>Cobalt ferrite thin films were grown on
SiO
2
/
Si
(
100
)
substrates using pulsed-laser deposition technique at substrate temperatures ranging from 250 to
600
°
C
. Thermal expansion mismatch between the film and substrate appears to have a substantial effect on the magnetic properties of the cobalt ferrite films, due to the large magnetoelastic coupling of cobalt ferrite. It was shown in this study, that polycrystalline films with (111)-preferred orientation could be prepared at substrate temperatures as low as
250
°
C
. The growth of crystalline cobalt ferrite films at such low temperatures indicates the potential to use cobalt ferrite for microelectromechanical systems devices and sensor applications including integration with a wider range of multilayer device structures.</abstract><pub>American Institute of Physics</pub><doi>10.1063/1.3357315</doi></addata></record> |
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title | Growth of crystalline cobalt ferrite thin films at lower temperatures using pulsed-laser deposition technique |
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