High-precision refractive index measurements revealing order parameter fluctuations in KMnF3 and NiO

The temperature dependence of the refractive index n of cubic crystals undergoing phase transitions (PT) is measured with an accuracy of the order δn=10−6 at temperatures between 3.5 and 1000 K with a computer-controlled Jamin–Lebedeff interferometer. Microscopic monitoring for in situ sample orient...

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Veröffentlicht in:Journal of applied physics 1985-01, Vol.57 (7), p.2606-2612
Hauptverfasser: SCHÄFER, F. J, KLEEMAN, W
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KLEEMAN, W
description The temperature dependence of the refractive index n of cubic crystals undergoing phase transitions (PT) is measured with an accuracy of the order δn=10−6 at temperatures between 3.5 and 1000 K with a computer-controlled Jamin–Lebedeff interferometer. Microscopic monitoring for in situ sample orientation and single domain work is provided. Results are presented for KMnF3 (antiferrodistortive PT) and NiO (antiferromagnetic PT) and discussed within the framework of a generalized phenomenological indicatrix perturbation theory. It predicts the proportionality between the order parameter autocorrelation function 〈δη2〉 and the refractive index anomaly preceding the PT. Comparison with recent theoretical predictions is performed.
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subjects Condensed matter: electronic structure, electrical, magnetic, and optical properties
Exact sciences and technology
Optical constants: refractive index, complex dielectric constant, absorption, reflection and transmission coefficients, emissivity
Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation
Optical properties of bulk materials and thin films
Physics
title High-precision refractive index measurements revealing order parameter fluctuations in KMnF3 and NiO
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