Effect of ultraviolet radiation on slow-relaxation processes in ferroelectric capacitance structures
The effects of ultraviolet (UV) irradiation on the relaxation processes in Ba 0.3 Sr 0.7 TiO 3 thin film capacitors were experimentally investigated in a range of wavelengths λ = ( 310 - 400 ) nm . It was observed that irradiation with a specific wavelength reduces the time of slow capacitance rel...
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| Veröffentlicht in: | Journal of applied physics 2010-04, Vol.107 (8), p.084102-084102-6 |
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| container_end_page | 084102-6 |
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| container_issue | 8 |
| container_start_page | 084102 |
| container_title | Journal of applied physics |
| container_volume | 107 |
| creator | Petrov, P. K. Alford, N. McN Kozyrev, A. Gaidukov, M. Altynnikov, A. Vasilevskiy, A. Konoplev, G. Tumarkin, A. Gagarin, A. |
| description | The effects of ultraviolet (UV) irradiation on the relaxation processes in
Ba
0.3
Sr
0.7
TiO
3
thin film capacitors were experimentally investigated in a range of wavelengths
λ
=
(
310
-
400
)
nm
. It was observed that irradiation with a specific wavelength reduces the time of slow capacitance relaxation up to three orders of magnitude in comparison with relaxation time in the "dark" regime. It was also observed that at a certain wavelength of UV irradiation there was a maximum in the leakage current of the capacitors. This wavelength corresponded exactly with a minimum in the relaxation time of the capacitance. It was shown that the decrease in the ferroelectric film thickness resulted in a shift in
τ
(
λ
)
minima
and
I
(
λ
)
maxima
towards the shorter wavelengths. Phenomena observed are analyzed using Bouguer's law. |
| doi_str_mv | 10.1063/1.3327236 |
| format | Article |
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Ba
0.3
Sr
0.7
TiO
3
thin film capacitors were experimentally investigated in a range of wavelengths
λ
=
(
310
-
400
)
nm
. It was observed that irradiation with a specific wavelength reduces the time of slow capacitance relaxation up to three orders of magnitude in comparison with relaxation time in the "dark" regime. It was also observed that at a certain wavelength of UV irradiation there was a maximum in the leakage current of the capacitors. This wavelength corresponded exactly with a minimum in the relaxation time of the capacitance. It was shown that the decrease in the ferroelectric film thickness resulted in a shift in
τ
(
λ
)
minima
and
I
(
λ
)
maxima
towards the shorter wavelengths. Phenomena observed are analyzed using Bouguer's law.</description><identifier>ISSN: 0021-8979</identifier><identifier>EISSN: 1089-7550</identifier><identifier>DOI: 10.1063/1.3327236</identifier><identifier>CODEN: JAPIAU</identifier><language>eng</language><publisher>American Institute of Physics</publisher><ispartof>Journal of applied physics, 2010-04, Vol.107 (8), p.084102-084102-6</ispartof><rights>2010 American Institute of Physics</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c350t-22fbb8b6c42d3b3e0ea5458e0293363a2fd9239e6c13079ed5305db99182187c3</citedby><cites>FETCH-LOGICAL-c350t-22fbb8b6c42d3b3e0ea5458e0293363a2fd9239e6c13079ed5305db99182187c3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://pubs.aip.org/jap/article-lookup/doi/10.1063/1.3327236$$EHTML$$P50$$Gscitation$$H</linktohtml><link.rule.ids>314,776,780,790,1553,4498,27901,27902,76126,76132</link.rule.ids></links><search><creatorcontrib>Petrov, P. K.</creatorcontrib><creatorcontrib>Alford, N. McN</creatorcontrib><creatorcontrib>Kozyrev, A.</creatorcontrib><creatorcontrib>Gaidukov, M.</creatorcontrib><creatorcontrib>Altynnikov, A.</creatorcontrib><creatorcontrib>Vasilevskiy, A.</creatorcontrib><creatorcontrib>Konoplev, G.</creatorcontrib><creatorcontrib>Tumarkin, A.</creatorcontrib><creatorcontrib>Gagarin, A.</creatorcontrib><title>Effect of ultraviolet radiation on slow-relaxation processes in ferroelectric capacitance structures</title><title>Journal of applied physics</title><description>The effects of ultraviolet (UV) irradiation on the relaxation processes in
Ba
0.3
Sr
0.7
TiO
3
thin film capacitors were experimentally investigated in a range of wavelengths
λ
=
(
310
-
400
)
nm
. It was observed that irradiation with a specific wavelength reduces the time of slow capacitance relaxation up to three orders of magnitude in comparison with relaxation time in the "dark" regime. It was also observed that at a certain wavelength of UV irradiation there was a maximum in the leakage current of the capacitors. This wavelength corresponded exactly with a minimum in the relaxation time of the capacitance. It was shown that the decrease in the ferroelectric film thickness resulted in a shift in
τ
(
λ
)
minima
and
I
(
λ
)
maxima
towards the shorter wavelengths. Phenomena observed are analyzed using Bouguer's law.</description><issn>0021-8979</issn><issn>1089-7550</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2010</creationdate><recordtype>article</recordtype><recordid>eNp1kE1LAzEQhoMoWKsH_0GuHrZOMs3u5iJIqR9Q8KLnkM1OILI2Jcn68e9t2YInYeCF4eFl5mHsWsBCQI23YoEoG4n1CZsJaHXVKAWnbAYgRdXqRp-zi5zfAYRoUc9Yv_aeXOHR83EoyX6GOFDhyfbBlhC3fD95iF9VosF-T6tdio5ypszDlntKKdKw70jBcWd31oVit454Lml0ZUyUL9mZt0Omq2PO2dvD-nX1VG1eHp9X95vKoYJSSem7ru1qt5Q9dkhAVi1VSyA1Yo1W-l5L1FQ7gdBo6hWC6jutRStF2zics5up16WYcyJvdil82PRjBJiDHiPMUc-evZvYfLj38Nf_8OTIRG_-HOEv1ytu6Q</recordid><startdate>20100415</startdate><enddate>20100415</enddate><creator>Petrov, P. K.</creator><creator>Alford, N. McN</creator><creator>Kozyrev, A.</creator><creator>Gaidukov, M.</creator><creator>Altynnikov, A.</creator><creator>Vasilevskiy, A.</creator><creator>Konoplev, G.</creator><creator>Tumarkin, A.</creator><creator>Gagarin, A.</creator><general>American Institute of Physics</general><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>20100415</creationdate><title>Effect of ultraviolet radiation on slow-relaxation processes in ferroelectric capacitance structures</title><author>Petrov, P. K. ; Alford, N. McN ; Kozyrev, A. ; Gaidukov, M. ; Altynnikov, A. ; Vasilevskiy, A. ; Konoplev, G. ; Tumarkin, A. ; Gagarin, A.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c350t-22fbb8b6c42d3b3e0ea5458e0293363a2fd9239e6c13079ed5305db99182187c3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2010</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Petrov, P. K.</creatorcontrib><creatorcontrib>Alford, N. McN</creatorcontrib><creatorcontrib>Kozyrev, A.</creatorcontrib><creatorcontrib>Gaidukov, M.</creatorcontrib><creatorcontrib>Altynnikov, A.</creatorcontrib><creatorcontrib>Vasilevskiy, A.</creatorcontrib><creatorcontrib>Konoplev, G.</creatorcontrib><creatorcontrib>Tumarkin, A.</creatorcontrib><creatorcontrib>Gagarin, A.</creatorcontrib><collection>CrossRef</collection><jtitle>Journal of applied physics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Petrov, P. K.</au><au>Alford, N. McN</au><au>Kozyrev, A.</au><au>Gaidukov, M.</au><au>Altynnikov, A.</au><au>Vasilevskiy, A.</au><au>Konoplev, G.</au><au>Tumarkin, A.</au><au>Gagarin, A.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Effect of ultraviolet radiation on slow-relaxation processes in ferroelectric capacitance structures</atitle><jtitle>Journal of applied physics</jtitle><date>2010-04-15</date><risdate>2010</risdate><volume>107</volume><issue>8</issue><spage>084102</spage><epage>084102-6</epage><pages>084102-084102-6</pages><issn>0021-8979</issn><eissn>1089-7550</eissn><coden>JAPIAU</coden><abstract>The effects of ultraviolet (UV) irradiation on the relaxation processes in
Ba
0.3
Sr
0.7
TiO
3
thin film capacitors were experimentally investigated in a range of wavelengths
λ
=
(
310
-
400
)
nm
. It was observed that irradiation with a specific wavelength reduces the time of slow capacitance relaxation up to three orders of magnitude in comparison with relaxation time in the "dark" regime. It was also observed that at a certain wavelength of UV irradiation there was a maximum in the leakage current of the capacitors. This wavelength corresponded exactly with a minimum in the relaxation time of the capacitance. It was shown that the decrease in the ferroelectric film thickness resulted in a shift in
τ
(
λ
)
minima
and
I
(
λ
)
maxima
towards the shorter wavelengths. Phenomena observed are analyzed using Bouguer's law.</abstract><pub>American Institute of Physics</pub><doi>10.1063/1.3327236</doi></addata></record> |
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| identifier | ISSN: 0021-8979 |
| ispartof | Journal of applied physics, 2010-04, Vol.107 (8), p.084102-084102-6 |
| issn | 0021-8979 1089-7550 |
| language | eng |
| recordid | cdi_crossref_primary_10_1063_1_3327236 |
| source | AIP Journals Complete; AIP Digital Archive; Alma/SFX Local Collection |
| title | Effect of ultraviolet radiation on slow-relaxation processes in ferroelectric capacitance structures |
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