Photoelectric quantum efficiencies and filter window absorption coefficients from 20 eV to 10 KeV
Photodiodes with x-ray sensitive photocathodes are commonly used as broadband x-ray detectors in fusion plasma diagnostics. We have measured the photocathode quantum efficiency between 1–500 Å of common photocathode materials including aluminum, copper, nickel, gold, three forms of carbon, chromium,...
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Veröffentlicht in: | J. Appl. Phys.; (United States) 1981-11, Vol.52 (11), p.6965-6973 |
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container_title | J. Appl. Phys.; (United States) |
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creator | Day, R. H. Lee, P. Saloman, E. B. Nagel, D. J. |
description | Photodiodes with x-ray sensitive photocathodes are commonly used as broadband x-ray detectors in fusion plasma diagnostics. We have measured the photocathode quantum efficiency between 1–500 Å of common photocathode materials including aluminum, copper, nickel, gold, three forms of carbon, chromium, and cesium iodide. We have also studied the effects of the experimental environment and long-term cathode aging on the measured quantum efficiencies. In addition, we have measured the x-ray mass-absorption coefficients of x-ray filter windows of Kimfoil, aluminum, polypropylene, and Formvar in energy regions where data were previously unavailable. Measurements between 1–50 Å were performed at the Los Alamos Scientific Laboratory’s low-energy x-ray calibration facility, while the measurements between 50–500 Å were performed at the National Bureau of Standard’s synchrotron ultraviolet radiation facility. |
doi_str_mv | 10.1063/1.328653 |
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J.</creatorcontrib><creatorcontrib>Los Alamos Scientific Laboratory, Los Alamos, New Mexico 87545</creatorcontrib><title>Photoelectric quantum efficiencies and filter window absorption coefficients from 20 eV to 10 KeV</title><title>J. Appl. Phys.; (United States)</title><description>Photodiodes with x-ray sensitive photocathodes are commonly used as broadband x-ray detectors in fusion plasma diagnostics. We have measured the photocathode quantum efficiency between 1–500 Å of common photocathode materials including aluminum, copper, nickel, gold, three forms of carbon, chromium, and cesium iodide. We have also studied the effects of the experimental environment and long-term cathode aging on the measured quantum efficiencies. In addition, we have measured the x-ray mass-absorption coefficients of x-ray filter windows of Kimfoil, aluminum, polypropylene, and Formvar in energy regions where data were previously unavailable. Measurements between 1–50 Å were performed at the Los Alamos Scientific Laboratory’s low-energy x-ray calibration facility, while the measurements between 50–500 Å were performed at the National Bureau of Standard’s synchrotron ultraviolet radiation facility.</description><subject>420800 - Engineering- Electronic Circuits & Devices- (-1989)</subject><subject>ABSORPTIVITY</subject><subject>CALIBRATION</subject><subject>CARBON</subject><subject>CATHODES</subject><subject>DATA</subject><subject>EFFICIENCY</subject><subject>ELECTRODES</subject><subject>ELECTROMAGNETIC RADIATION</subject><subject>ELEMENTS</subject><subject>ENERGY RANGE</subject><subject>ENGINEERING</subject><subject>EV RANGE</subject><subject>EXPERIMENTAL DATA</subject><subject>FILTERS</subject><subject>FUSION REACTIONS</subject><subject>INFORMATION</subject><subject>IONIZING RADIATIONS</subject><subject>KEV RANGE</subject><subject>METALS</subject><subject>NONMETALS</subject><subject>NUCLEAR REACTIONS</subject><subject>NUMERICAL DATA</subject><subject>OPENINGS</subject><subject>OPTICAL PROPERTIES</subject><subject>PHOTOCATHODES</subject><subject>PHOTODIODES</subject><subject>PHOTOELECTRIC EFFECT</subject><subject>PHOTOELECTROMAGNETIC EFFECTS</subject><subject>PHYSICAL PROPERTIES</subject><subject>PLASMA</subject><subject>QUANTUM EFFICIENCY</subject><subject>RADIATIONS</subject><subject>SEMICONDUCTOR DEVICES</subject><subject>SEMICONDUCTOR DIODES</subject><subject>SENSITIVITY</subject><subject>WAVELENGTHS</subject><subject>WINDOWS</subject><subject>X RADIATION</subject><issn>0021-8979</issn><issn>1089-7550</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1981</creationdate><recordtype>article</recordtype><recordid>eNo1kMtKQzEURYMoWKvgJwRHTm7NSXrzGErxhQUdaKchzT2hkTapSYr491aqg82eLDbsRcglsAkwKW5gIriWvTgiI2DadKrv2TEZMcah00aZU3JW6wdjAFqYEXGvq9wyrtG3Ej393LnUdhuKIUQfMe1TqUsDDXHdsNCvmIb8Rd2y5rJtMSfq8z_bKg0lbyhnFBe0ZQqMPuPinJwEt6548ddj8n5_9zZ77OYvD0-z23nnBejWIRdCBxGcGvigncPgHRrFhQnLqeRm6r1CkMYBX5pecWkwKMmd0ow7AVKMydVhN9cWbfWxoV_5nNL-mu21Mb2c7qHrA-RLrrVgsNsSN658W2D2158Fe_AnfgAvKmH2</recordid><startdate>19811101</startdate><enddate>19811101</enddate><creator>Day, R. H.</creator><creator>Lee, P.</creator><creator>Saloman, E. B.</creator><creator>Nagel, D. J.</creator><scope>AAYXX</scope><scope>CITATION</scope><scope>OTOTI</scope></search><sort><creationdate>19811101</creationdate><title>Photoelectric quantum efficiencies and filter window absorption coefficients from 20 eV to 10 KeV</title><author>Day, R. H. ; Lee, P. ; Saloman, E. B. ; Nagel, D. J.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c318t-e2338f3fa7d2d8aaefcae97239fb46294cc7e169a12b957269ef762a7802a3163</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1981</creationdate><topic>420800 - Engineering- Electronic Circuits & Devices- (-1989)</topic><topic>ABSORPTIVITY</topic><topic>CALIBRATION</topic><topic>CARBON</topic><topic>CATHODES</topic><topic>DATA</topic><topic>EFFICIENCY</topic><topic>ELECTRODES</topic><topic>ELECTROMAGNETIC RADIATION</topic><topic>ELEMENTS</topic><topic>ENERGY RANGE</topic><topic>ENGINEERING</topic><topic>EV RANGE</topic><topic>EXPERIMENTAL DATA</topic><topic>FILTERS</topic><topic>FUSION REACTIONS</topic><topic>INFORMATION</topic><topic>IONIZING RADIATIONS</topic><topic>KEV RANGE</topic><topic>METALS</topic><topic>NONMETALS</topic><topic>NUCLEAR REACTIONS</topic><topic>NUMERICAL DATA</topic><topic>OPENINGS</topic><topic>OPTICAL PROPERTIES</topic><topic>PHOTOCATHODES</topic><topic>PHOTODIODES</topic><topic>PHOTOELECTRIC EFFECT</topic><topic>PHOTOELECTROMAGNETIC EFFECTS</topic><topic>PHYSICAL PROPERTIES</topic><topic>PLASMA</topic><topic>QUANTUM EFFICIENCY</topic><topic>RADIATIONS</topic><topic>SEMICONDUCTOR DEVICES</topic><topic>SEMICONDUCTOR DIODES</topic><topic>SENSITIVITY</topic><topic>WAVELENGTHS</topic><topic>WINDOWS</topic><topic>X RADIATION</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Day, R. H.</creatorcontrib><creatorcontrib>Lee, P.</creatorcontrib><creatorcontrib>Saloman, E. B.</creatorcontrib><creatorcontrib>Nagel, D. J.</creatorcontrib><creatorcontrib>Los Alamos Scientific Laboratory, Los Alamos, New Mexico 87545</creatorcontrib><collection>CrossRef</collection><collection>OSTI.GOV</collection><jtitle>J. Appl. Phys.; (United States)</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Day, R. H.</au><au>Lee, P.</au><au>Saloman, E. B.</au><au>Nagel, D. J.</au><aucorp>Los Alamos Scientific Laboratory, Los Alamos, New Mexico 87545</aucorp><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Photoelectric quantum efficiencies and filter window absorption coefficients from 20 eV to 10 KeV</atitle><jtitle>J. Appl. Phys.; (United States)</jtitle><date>1981-11-01</date><risdate>1981</risdate><volume>52</volume><issue>11</issue><spage>6965</spage><epage>6973</epage><pages>6965-6973</pages><issn>0021-8979</issn><eissn>1089-7550</eissn><abstract>Photodiodes with x-ray sensitive photocathodes are commonly used as broadband x-ray detectors in fusion plasma diagnostics. We have measured the photocathode quantum efficiency between 1–500 Å of common photocathode materials including aluminum, copper, nickel, gold, three forms of carbon, chromium, and cesium iodide. We have also studied the effects of the experimental environment and long-term cathode aging on the measured quantum efficiencies. In addition, we have measured the x-ray mass-absorption coefficients of x-ray filter windows of Kimfoil, aluminum, polypropylene, and Formvar in energy regions where data were previously unavailable. Measurements between 1–50 Å were performed at the Los Alamos Scientific Laboratory’s low-energy x-ray calibration facility, while the measurements between 50–500 Å were performed at the National Bureau of Standard’s synchrotron ultraviolet radiation facility.</abstract><cop>United States</cop><doi>10.1063/1.328653</doi><tpages>9</tpages></addata></record> |
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subjects | 420800 - Engineering- Electronic Circuits & Devices- (-1989) ABSORPTIVITY CALIBRATION CARBON CATHODES DATA EFFICIENCY ELECTRODES ELECTROMAGNETIC RADIATION ELEMENTS ENERGY RANGE ENGINEERING EV RANGE EXPERIMENTAL DATA FILTERS FUSION REACTIONS INFORMATION IONIZING RADIATIONS KEV RANGE METALS NONMETALS NUCLEAR REACTIONS NUMERICAL DATA OPENINGS OPTICAL PROPERTIES PHOTOCATHODES PHOTODIODES PHOTOELECTRIC EFFECT PHOTOELECTROMAGNETIC EFFECTS PHYSICAL PROPERTIES PLASMA QUANTUM EFFICIENCY RADIATIONS SEMICONDUCTOR DEVICES SEMICONDUCTOR DIODES SENSITIVITY WAVELENGTHS WINDOWS X RADIATION |
title | Photoelectric quantum efficiencies and filter window absorption coefficients from 20 eV to 10 KeV |
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