1/ f noise in Hall effect: Fluctuations in mobility
From theoretical and experimental investigations on 1/f noise in the Hall voltage at high magnetic induction it is concluded that 1/f noise is caused by mobility fluctuations.
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| Veröffentlicht in: | Journal of applied physics 1980-01, Vol.51 (6), p.3438-3438 |
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| Format: | Artikel |
| Sprache: | eng |
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| container_end_page | 3438 |
|---|---|
| container_issue | 6 |
| container_start_page | 3438 |
| container_title | Journal of applied physics |
| container_volume | 51 |
| creator | Kleinpenning, T. G. M. |
| description | From theoretical and experimental investigations on 1/f noise in the Hall voltage at high magnetic induction it is concluded that 1/f noise is caused by mobility fluctuations. |
| doi_str_mv | 10.1063/1.328029 |
| format | Article |
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| fulltext | fulltext |
| identifier | ISSN: 0021-8979 |
| ispartof | Journal of applied physics, 1980-01, Vol.51 (6), p.3438-3438 |
| issn | 0021-8979 1089-7550 |
| language | eng |
| recordid | cdi_crossref_primary_10_1063_1_328029 |
| source | AIP Digital Archive |
| title | 1/ f noise in Hall effect: Fluctuations in mobility |
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