The effect of moisture on the photon-enhanced negative bias thermal instability in Ga-In-Zn-O thin film transistors

We investigated the impact of photon irradiation on the stability of gallium-indium-zinc oxide (GIZO) thin film transistors. The application of light on the negative bias temperature stress (NBTS) accelerated the negative displacement of the threshold voltage ( V th ) . This phenomenon can be attrib...

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Veröffentlicht in:	Applied physics letters 2009-12, Vol.95 (23), p.232106-232106-3
Hauptverfasser:	Lee, Kwang-Hee, Jung, Ji Sim, Son, Kyoung Seok, Park, Joon Seok, Kim, Tae Sang, Choi, Rino, Jeong, Jae Kyeong, Kwon, Jang-Yeon, Koo, Bonwon, Lee, Sangyun
Format:	Artikel
Sprache:	eng
Online-Zugang:	Volltext
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