Epitaxial growth and characterization of Eu0.5Sr0.5CoO3 thin films by off-axis sputtering

We report the epitaxial growth and physical properties of Eu0.5Sr0.5CoO3 (ESCO) thin films deposited on (001) LaAlO3 (LAO) and (001) SrTiO3 (STO) substrates by off-axis rf sputtering. The magnetic properties of a grown film are governed by the crystallinity of the thin film and strain effects due to...

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Veröffentlicht in:Applied physics letters 2009-09, Vol.95 (12)
Hauptverfasser: Kwon, Daeyoung, Wu, Youngsu, Kim, Bongju, Kim, Bog G., Hwang, Harold Y.
Format: Artikel
Sprache:eng
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Zusammenfassung:We report the epitaxial growth and physical properties of Eu0.5Sr0.5CoO3 (ESCO) thin films deposited on (001) LaAlO3 (LAO) and (001) SrTiO3 (STO) substrates by off-axis rf sputtering. The magnetic properties of a grown film are governed by the crystallinity of the thin film and strain effects due to the substrate. The temperature-dependent resistivity of an optimized ESCO thin film on a LAO substrate shows a characteristic sudden decrease near the ferromagnetic transition temperature, indicating metallic double-exchange-like behavior, while the resistivity of ESCO on a STO substrate displays insulatinglike behavior because of substrate strain. These results suggest that optimized ESCO film on LAO is ideal as a bottom electrode for strained dielectric and ferroelectric heterostructures.
ISSN:0003-6951
1077-3118
DOI:10.1063/1.3234372