Lorentz electron microscopy of domain walls in single−crystal evaporated iron films
A method for measuring the width of domain walls by Lorentz electron microscopy is presented and applied to the case of a single−crystal iron film. The method consists of measuring the domain wall image width at a number of defocusing distances and fitting the resulting curve to a theoretical curve...
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| Veröffentlicht in: | Journal of applied physics 1975-01, Vol.46 (1), p.416-421 |
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| Hauptverfasser: | , |
| Format: | Artikel |
| Sprache: | eng |
| Online-Zugang: | Volltext |
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