Ultraviolet electroluminescence from ZnO/NiO-based heterojunction light-emitting diodes
Ultraviolet light-emitting diodes based on ZnO/NiO heterojunctions were fabricated on commercially available n+-GaN/sapphire substrates using a radio frequency magnetron sputtering system. Near band edge emission of ZnO peaking at ∼370 nm with a full-width at half maximum of ∼7 nm was achieved at ro...
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Veröffentlicht in: | Applied physics letters 2009-07, Vol.95 (1) |
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creator | Long, Hao Fang, Guojia Huang, Huihui Mo, Xiaoming Xia, Wei Dong, Binzhong Meng, Xianquan Zhao, Xingzhong |
description | Ultraviolet light-emitting diodes based on ZnO/NiO heterojunctions were fabricated on commercially available n+-GaN/sapphire substrates using a radio frequency magnetron sputtering system. Near band edge emission of ZnO peaking at ∼370 nm with a full-width at half maximum of ∼7 nm was achieved at room temperature when the devices were under sufficient forward bias. With the help of an electron blocking i-Mg1−xZnxO(0 |
doi_str_mv | 10.1063/1.3176440 |
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Near band edge emission of ZnO peaking at ∼370 nm with a full-width at half maximum of ∼7 nm was achieved at room temperature when the devices were under sufficient forward bias. With the help of an electron blocking i-Mg1−xZnxO(0<x<1) layer inserted between the ZnO and NiO layers, the emission intensity has been much enhanced and the threshold current drops down to ∼23 from ∼70 mA. The results were discussed in terms of the band diagrams of the heterojunctions.</description><identifier>ISSN: 0003-6951</identifier><identifier>EISSN: 1077-3118</identifier><identifier>DOI: 10.1063/1.3176440</identifier><language>eng</language><ispartof>Applied physics letters, 2009-07, Vol.95 (1)</ispartof><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c295t-30837aead5a0f482393c689b16f0207eb9ae726eeb4bb7f5831ef9d1cde614543</citedby><cites>FETCH-LOGICAL-c295t-30837aead5a0f482393c689b16f0207eb9ae726eeb4bb7f5831ef9d1cde614543</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,776,780,27903,27904</link.rule.ids></links><search><creatorcontrib>Long, Hao</creatorcontrib><creatorcontrib>Fang, Guojia</creatorcontrib><creatorcontrib>Huang, Huihui</creatorcontrib><creatorcontrib>Mo, Xiaoming</creatorcontrib><creatorcontrib>Xia, Wei</creatorcontrib><creatorcontrib>Dong, Binzhong</creatorcontrib><creatorcontrib>Meng, Xianquan</creatorcontrib><creatorcontrib>Zhao, Xingzhong</creatorcontrib><title>Ultraviolet electroluminescence from ZnO/NiO-based heterojunction light-emitting diodes</title><title>Applied physics letters</title><description>Ultraviolet light-emitting diodes based on ZnO/NiO heterojunctions were fabricated on commercially available n+-GaN/sapphire substrates using a radio frequency magnetron sputtering system. Near band edge emission of ZnO peaking at ∼370 nm with a full-width at half maximum of ∼7 nm was achieved at room temperature when the devices were under sufficient forward bias. With the help of an electron blocking i-Mg1−xZnxO(0<x<1) layer inserted between the ZnO and NiO layers, the emission intensity has been much enhanced and the threshold current drops down to ∼23 from ∼70 mA. 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Near band edge emission of ZnO peaking at ∼370 nm with a full-width at half maximum of ∼7 nm was achieved at room temperature when the devices were under sufficient forward bias. With the help of an electron blocking i-Mg1−xZnxO(0<x<1) layer inserted between the ZnO and NiO layers, the emission intensity has been much enhanced and the threshold current drops down to ∼23 from ∼70 mA. The results were discussed in terms of the band diagrams of the heterojunctions.</abstract><doi>10.1063/1.3176440</doi></addata></record> |
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title | Ultraviolet electroluminescence from ZnO/NiO-based heterojunction light-emitting diodes |
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