Charge transport mechanism in amorphous alumina
The charge transport mechanism in amorphous Al 2 O 3 was examined both experimentally and theoretically. We have found that electrons are dominant charge carriers in Al 2 O 3 . A satisfactory agreement between the experimental and calculated data was obtained assuming the multiphonon ionization mech...
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| Veröffentlicht in: | Applied physics letters 2009-06, Vol.94 (22), p.222904-222904-3 |
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| container_title | Applied physics letters |
| container_volume | 94 |
| creator | Novikov, Yu N. Gritsenko, V. A. Nasyrov, K. A. |
| description | The charge transport mechanism in amorphous
Al
2
O
3
was examined both experimentally and theoretically. We have found that electrons are dominant charge carriers in
Al
2
O
3
. A satisfactory agreement between the experimental and calculated data was obtained assuming the multiphonon ionization mechanism for deep traps in
Al
2
O
3
. For the thermal and optical trap ionization energies in
Al
2
O
3
, the values
W
T
=
1.5
eV
and
W
opt
=
3.0
eV
were obtained. |
| doi_str_mv | 10.1063/1.3151861 |
| format | Article |
| fullrecord | <record><control><sourceid>scitation_cross</sourceid><recordid>TN_cdi_crossref_primary_10_1063_1_3151861</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>apl</sourcerecordid><originalsourceid>FETCH-LOGICAL-c284t-a72983b60f94a14c74c04e614de4e1a133808dad21e7189324ce0bbc51d2cb63</originalsourceid><addsrcrecordid>eNp1z01LxDAQxvEgCtbVg9-gVw_dzWTSNL0IUnyDBS97D9M0tZHtC0n34Le30sWbp2HgzwM_xu6Bb4Er3MEWIQet4IIlwIsiQwB9yRLOOWaqzOGa3cT4tby5QEzYruoofLp0DjTEaQxz2jvb0eBjn_ohpX4MUzeeYkrHU-8HumVXLR2juzvfDTu8PB-qt2z_8fpePe0zK7ScMypEqbFWvC0lgbSFtFw6BbJx0gEBoua6oUaAK0CXKKR1vK5tDo2wtcINe1hnbRhjDK41U_A9hW8D3PxCDZgzdGkf1zZaP9Psx-H_eNWaP61ZtPgDHfhaEw</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Charge transport mechanism in amorphous alumina</title><source>AIP Journals Complete</source><source>AIP Digital Archive</source><source>Alma/SFX Local Collection</source><creator>Novikov, Yu N. ; Gritsenko, V. A. ; Nasyrov, K. A.</creator><creatorcontrib>Novikov, Yu N. ; Gritsenko, V. A. ; Nasyrov, K. A.</creatorcontrib><description>The charge transport mechanism in amorphous
Al
2
O
3
was examined both experimentally and theoretically. We have found that electrons are dominant charge carriers in
Al
2
O
3
. A satisfactory agreement between the experimental and calculated data was obtained assuming the multiphonon ionization mechanism for deep traps in
Al
2
O
3
. For the thermal and optical trap ionization energies in
Al
2
O
3
, the values
W
T
=
1.5
eV
and
W
opt
=
3.0
eV
were obtained.</description><identifier>ISSN: 0003-6951</identifier><identifier>EISSN: 1077-3118</identifier><identifier>DOI: 10.1063/1.3151861</identifier><identifier>CODEN: APPLAB</identifier><language>eng</language><publisher>American Institute of Physics</publisher><ispartof>Applied physics letters, 2009-06, Vol.94 (22), p.222904-222904-3</ispartof><rights>2009 American Institute of Physics</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c284t-a72983b60f94a14c74c04e614de4e1a133808dad21e7189324ce0bbc51d2cb63</citedby><cites>FETCH-LOGICAL-c284t-a72983b60f94a14c74c04e614de4e1a133808dad21e7189324ce0bbc51d2cb63</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://pubs.aip.org/apl/article-lookup/doi/10.1063/1.3151861$$EHTML$$P50$$Gscitation$$H</linktohtml><link.rule.ids>314,780,784,794,1559,4512,27924,27925,76384,76390</link.rule.ids></links><search><creatorcontrib>Novikov, Yu N.</creatorcontrib><creatorcontrib>Gritsenko, V. A.</creatorcontrib><creatorcontrib>Nasyrov, K. A.</creatorcontrib><title>Charge transport mechanism in amorphous alumina</title><title>Applied physics letters</title><description>The charge transport mechanism in amorphous
Al
2
O
3
was examined both experimentally and theoretically. We have found that electrons are dominant charge carriers in
Al
2
O
3
. A satisfactory agreement between the experimental and calculated data was obtained assuming the multiphonon ionization mechanism for deep traps in
Al
2
O
3
. For the thermal and optical trap ionization energies in
Al
2
O
3
, the values
W
T
=
1.5
eV
and
W
opt
=
3.0
eV
were obtained.</description><issn>0003-6951</issn><issn>1077-3118</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2009</creationdate><recordtype>article</recordtype><recordid>eNp1z01LxDAQxvEgCtbVg9-gVw_dzWTSNL0IUnyDBS97D9M0tZHtC0n34Le30sWbp2HgzwM_xu6Bb4Er3MEWIQet4IIlwIsiQwB9yRLOOWaqzOGa3cT4tby5QEzYruoofLp0DjTEaQxz2jvb0eBjn_ohpX4MUzeeYkrHU-8HumVXLR2juzvfDTu8PB-qt2z_8fpePe0zK7ScMypEqbFWvC0lgbSFtFw6BbJx0gEBoua6oUaAK0CXKKR1vK5tDo2wtcINe1hnbRhjDK41U_A9hW8D3PxCDZgzdGkf1zZaP9Psx-H_eNWaP61ZtPgDHfhaEw</recordid><startdate>20090601</startdate><enddate>20090601</enddate><creator>Novikov, Yu N.</creator><creator>Gritsenko, V. A.</creator><creator>Nasyrov, K. A.</creator><general>American Institute of Physics</general><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>20090601</creationdate><title>Charge transport mechanism in amorphous alumina</title><author>Novikov, Yu N. ; Gritsenko, V. A. ; Nasyrov, K. A.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c284t-a72983b60f94a14c74c04e614de4e1a133808dad21e7189324ce0bbc51d2cb63</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2009</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Novikov, Yu N.</creatorcontrib><creatorcontrib>Gritsenko, V. A.</creatorcontrib><creatorcontrib>Nasyrov, K. A.</creatorcontrib><collection>CrossRef</collection><jtitle>Applied physics letters</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Novikov, Yu N.</au><au>Gritsenko, V. A.</au><au>Nasyrov, K. A.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Charge transport mechanism in amorphous alumina</atitle><jtitle>Applied physics letters</jtitle><date>2009-06-01</date><risdate>2009</risdate><volume>94</volume><issue>22</issue><spage>222904</spage><epage>222904-3</epage><pages>222904-222904-3</pages><issn>0003-6951</issn><eissn>1077-3118</eissn><coden>APPLAB</coden><abstract>The charge transport mechanism in amorphous
Al
2
O
3
was examined both experimentally and theoretically. We have found that electrons are dominant charge carriers in
Al
2
O
3
. A satisfactory agreement between the experimental and calculated data was obtained assuming the multiphonon ionization mechanism for deep traps in
Al
2
O
3
. For the thermal and optical trap ionization energies in
Al
2
O
3
, the values
W
T
=
1.5
eV
and
W
opt
=
3.0
eV
were obtained.</abstract><pub>American Institute of Physics</pub><doi>10.1063/1.3151861</doi></addata></record> |
| fulltext | fulltext |
| identifier | ISSN: 0003-6951 |
| ispartof | Applied physics letters, 2009-06, Vol.94 (22), p.222904-222904-3 |
| issn | 0003-6951 1077-3118 |
| language | eng |
| recordid | cdi_crossref_primary_10_1063_1_3151861 |
| source | AIP Journals Complete; AIP Digital Archive; Alma/SFX Local Collection |
| title | Charge transport mechanism in amorphous alumina |
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