Optical properties of β -Sn films
Optical properties of white tin ( β -Sn ) have been investigated using spectroscopic ellipsometry in the photon-energy range between 0.6 and 6.5 eV at room temperature. The β -Sn films are deposited by vacuum evaporation on Si(001) substrates. The structural properties of the films are evaluated by...
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| Veröffentlicht in: | Journal of applied physics 2009-04, Vol.105 (7), p.073520-073520-6 |
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| Sprache: | eng |
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| container_end_page | 073520-6 |
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| container_issue | 7 |
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| container_title | Journal of applied physics |
| container_volume | 105 |
| creator | Takeuchi, Katsuki Adachi, Sadao |
| description | Optical properties of white tin
(
β
-Sn
)
have been investigated using spectroscopic ellipsometry in the photon-energy range between 0.6 and 6.5 eV at room temperature. The
β
-Sn
films are deposited by vacuum evaporation on Si(001) substrates. The structural properties of the films are evaluated by x-ray diffraction and
ex situ
atomic force microscopy. The measured
ε
(
E
)
spectra reveal distinct structures at several interband critical points in the Brillouin zone of
β
-Sn
. These spectra are analyzed on the basis of a simplified model of the interband transitions, including the free-carrier absorption between the filled and empty electronic states. Dielectric-related optical constants, such as the complex refractive index, absorption coefficient, and normal-incidence reflectivity, of bulk
β
-Sn
films are also presented. |
| doi_str_mv | 10.1063/1.3106528 |
| format | Article |
| fullrecord | <record><control><sourceid>scitation_cross</sourceid><recordid>TN_cdi_crossref_primary_10_1063_1_3106528</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>jap</sourcerecordid><originalsourceid>FETCH-LOGICAL-c284t-525fa75c6b48bde271bf0f30ba60db6cc088353e3d7640debd95b116c30f1e883</originalsourceid><addsrcrecordid>eNp1j8FKxDAURYMoWEcX_kFx5yIz7zVNmm4EGRwVBmYxug5JmkCkMy1JNv6WH-I3WZmCK1dncQ8XDiG3CEsEwVa4ZBN5Jc9IgSBb2nAO56QAqJDKtmkvyVVKHwCIkrUFuduNOVjdl2McRhdzcKkcfPn9VdL9sfShP6RrcuF1n9zNzAV53zy9rV_odvf8un7cUlvJOlNeca8bboWppelc1aDx4BkYLaAzwlqQknHmWNeIGjpnupYbRGEZeHTTtiD3p18bh5Si82qM4aDjp0JQv3EK1Rw3uQ8nN9mQdQ7D8X95LlR_hWpgP2M-Vf4</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Optical properties of β -Sn films</title><source>AIP Journals Complete</source><source>AIP Digital Archive</source><source>Alma/SFX Local Collection</source><creator>Takeuchi, Katsuki ; Adachi, Sadao</creator><creatorcontrib>Takeuchi, Katsuki ; Adachi, Sadao</creatorcontrib><description>Optical properties of white tin
(
β
-Sn
)
have been investigated using spectroscopic ellipsometry in the photon-energy range between 0.6 and 6.5 eV at room temperature. The
β
-Sn
films are deposited by vacuum evaporation on Si(001) substrates. The structural properties of the films are evaluated by x-ray diffraction and
ex situ
atomic force microscopy. The measured
ε
(
E
)
spectra reveal distinct structures at several interband critical points in the Brillouin zone of
β
-Sn
. These spectra are analyzed on the basis of a simplified model of the interband transitions, including the free-carrier absorption between the filled and empty electronic states. Dielectric-related optical constants, such as the complex refractive index, absorption coefficient, and normal-incidence reflectivity, of bulk
β
-Sn
films are also presented.</description><identifier>ISSN: 0021-8979</identifier><identifier>EISSN: 1089-7550</identifier><identifier>DOI: 10.1063/1.3106528</identifier><identifier>CODEN: JAPIAU</identifier><language>eng</language><publisher>American Institute of Physics</publisher><ispartof>Journal of applied physics, 2009-04, Vol.105 (7), p.073520-073520-6</ispartof><rights>2009 American Institute of Physics</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c284t-525fa75c6b48bde271bf0f30ba60db6cc088353e3d7640debd95b116c30f1e883</citedby><cites>FETCH-LOGICAL-c284t-525fa75c6b48bde271bf0f30ba60db6cc088353e3d7640debd95b116c30f1e883</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://pubs.aip.org/jap/article-lookup/doi/10.1063/1.3106528$$EHTML$$P50$$Gscitation$$H</linktohtml><link.rule.ids>314,780,784,794,1559,4512,27924,27925,76384,76390</link.rule.ids></links><search><creatorcontrib>Takeuchi, Katsuki</creatorcontrib><creatorcontrib>Adachi, Sadao</creatorcontrib><title>Optical properties of β -Sn films</title><title>Journal of applied physics</title><description>Optical properties of white tin
(
β
-Sn
)
have been investigated using spectroscopic ellipsometry in the photon-energy range between 0.6 and 6.5 eV at room temperature. The
β
-Sn
films are deposited by vacuum evaporation on Si(001) substrates. The structural properties of the films are evaluated by x-ray diffraction and
ex situ
atomic force microscopy. The measured
ε
(
E
)
spectra reveal distinct structures at several interband critical points in the Brillouin zone of
β
-Sn
. These spectra are analyzed on the basis of a simplified model of the interband transitions, including the free-carrier absorption between the filled and empty electronic states. Dielectric-related optical constants, such as the complex refractive index, absorption coefficient, and normal-incidence reflectivity, of bulk
β
-Sn
films are also presented.</description><issn>0021-8979</issn><issn>1089-7550</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2009</creationdate><recordtype>article</recordtype><recordid>eNp1j8FKxDAURYMoWEcX_kFx5yIz7zVNmm4EGRwVBmYxug5JmkCkMy1JNv6WH-I3WZmCK1dncQ8XDiG3CEsEwVa4ZBN5Jc9IgSBb2nAO56QAqJDKtmkvyVVKHwCIkrUFuduNOVjdl2McRhdzcKkcfPn9VdL9sfShP6RrcuF1n9zNzAV53zy9rV_odvf8un7cUlvJOlNeca8bboWppelc1aDx4BkYLaAzwlqQknHmWNeIGjpnupYbRGEZeHTTtiD3p18bh5Si82qM4aDjp0JQv3EK1Rw3uQ8nN9mQdQ7D8X95LlR_hWpgP2M-Vf4</recordid><startdate>20090401</startdate><enddate>20090401</enddate><creator>Takeuchi, Katsuki</creator><creator>Adachi, Sadao</creator><general>American Institute of Physics</general><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>20090401</creationdate><title>Optical properties of β -Sn films</title><author>Takeuchi, Katsuki ; Adachi, Sadao</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c284t-525fa75c6b48bde271bf0f30ba60db6cc088353e3d7640debd95b116c30f1e883</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2009</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Takeuchi, Katsuki</creatorcontrib><creatorcontrib>Adachi, Sadao</creatorcontrib><collection>CrossRef</collection><jtitle>Journal of applied physics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Takeuchi, Katsuki</au><au>Adachi, Sadao</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Optical properties of β -Sn films</atitle><jtitle>Journal of applied physics</jtitle><date>2009-04-01</date><risdate>2009</risdate><volume>105</volume><issue>7</issue><spage>073520</spage><epage>073520-6</epage><pages>073520-073520-6</pages><issn>0021-8979</issn><eissn>1089-7550</eissn><coden>JAPIAU</coden><abstract>Optical properties of white tin
(
β
-Sn
)
have been investigated using spectroscopic ellipsometry in the photon-energy range between 0.6 and 6.5 eV at room temperature. The
β
-Sn
films are deposited by vacuum evaporation on Si(001) substrates. The structural properties of the films are evaluated by x-ray diffraction and
ex situ
atomic force microscopy. The measured
ε
(
E
)
spectra reveal distinct structures at several interband critical points in the Brillouin zone of
β
-Sn
. These spectra are analyzed on the basis of a simplified model of the interband transitions, including the free-carrier absorption between the filled and empty electronic states. Dielectric-related optical constants, such as the complex refractive index, absorption coefficient, and normal-incidence reflectivity, of bulk
β
-Sn
films are also presented.</abstract><pub>American Institute of Physics</pub><doi>10.1063/1.3106528</doi></addata></record> |
| fulltext | fulltext |
| identifier | ISSN: 0021-8979 |
| ispartof | Journal of applied physics, 2009-04, Vol.105 (7), p.073520-073520-6 |
| issn | 0021-8979 1089-7550 |
| language | eng |
| recordid | cdi_crossref_primary_10_1063_1_3106528 |
| source | AIP Journals Complete; AIP Digital Archive; Alma/SFX Local Collection |
| title | Optical properties of β -Sn films |
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