Correlation-length dependence of lifetime ratios: Individual estimation of interface profile parameters

We show that the ratio between relaxation lifetimes dominated by roughness-related scatterings in heterostructures is a well-defined function of the correlation length. Thus, we propose an efficient method for individual estimation of the two size parameters of interface profiles from transport data...

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Veröffentlicht in:	Applied physics letters 2009-02, Vol.94 (7)
Hauptverfasser:	Quang, Doan Nhat, Tung, Nguyen Huyen, Tuan, Le, Hong, Nguyen Trung, Hai, Tran Thi
Format:	Artikel
Sprache:	eng
Online-Zugang:	Volltext
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