High-yield dielectrophoretic assembly of two-dimensional graphene nanostructures
Graphene handling is still dominated by serial mechanical exfoliation, which may well facilitate measurements in a laboratory environment but does not allow reliable larger-scale integration. Herein we demonstrate the controlled, high-yield ( > 90 % ) , site-selective deposition of ultrathin few-...
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Veröffentlicht in: | Applied physics letters 2009-02, Vol.94 (5), p.053110-053110-3 |
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container_title | Applied physics letters |
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creator | Burg, Brian R. Lütolf, Fabian Schneider, Julian Schirmer, Niklas C. Schwamb, Timo Poulikakos, Dimos |
description | Graphene handling is still dominated by serial mechanical exfoliation, which may well facilitate measurements in a laboratory environment but does not allow reliable larger-scale integration. Herein we demonstrate the controlled, high-yield
(
>
90
%
)
, site-selective deposition of ultrathin few-layer (three to ten) graphene oxide by dielectrophoresis between prefabricated electrodes. Individual layers are found near the edges. Initially insulating, thermal reduction at
450
°
C
thins out the two-dimensional few-atom thick films and dramatically reduces electrical resistances down to
40
k
Ω
. Conductivities between 15 and 36 S/cm are obtained. The introduced method permits the nonintrusive, parallel, large-scale assembly of soluble two-dimensional nanostructures and sheets. |
doi_str_mv | 10.1063/1.3077197 |
format | Article |
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(
>
90
%
)
, site-selective deposition of ultrathin few-layer (three to ten) graphene oxide by dielectrophoresis between prefabricated electrodes. Individual layers are found near the edges. Initially insulating, thermal reduction at
450
°
C
thins out the two-dimensional few-atom thick films and dramatically reduces electrical resistances down to
40
k
Ω
. Conductivities between 15 and 36 S/cm are obtained. The introduced method permits the nonintrusive, parallel, large-scale assembly of soluble two-dimensional nanostructures and sheets.</description><identifier>ISSN: 0003-6951</identifier><identifier>EISSN: 1077-3118</identifier><identifier>DOI: 10.1063/1.3077197</identifier><identifier>CODEN: APPLAB</identifier><language>eng</language><publisher>American Institute of Physics</publisher><ispartof>Applied physics letters, 2009-02, Vol.94 (5), p.053110-053110-3</ispartof><rights>2009 American Institute of Physics</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c350t-7164f1074483126b9189faa69e6e29a48bba86a3371d7bad8c4af60ffc41af233</citedby><cites>FETCH-LOGICAL-c350t-7164f1074483126b9189faa69e6e29a48bba86a3371d7bad8c4af60ffc41af233</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://pubs.aip.org/apl/article-lookup/doi/10.1063/1.3077197$$EHTML$$P50$$Gscitation$$H</linktohtml><link.rule.ids>315,782,786,796,1561,4516,27933,27934,76394,76400</link.rule.ids></links><search><creatorcontrib>Burg, Brian R.</creatorcontrib><creatorcontrib>Lütolf, Fabian</creatorcontrib><creatorcontrib>Schneider, Julian</creatorcontrib><creatorcontrib>Schirmer, Niklas C.</creatorcontrib><creatorcontrib>Schwamb, Timo</creatorcontrib><creatorcontrib>Poulikakos, Dimos</creatorcontrib><title>High-yield dielectrophoretic assembly of two-dimensional graphene nanostructures</title><title>Applied physics letters</title><description>Graphene handling is still dominated by serial mechanical exfoliation, which may well facilitate measurements in a laboratory environment but does not allow reliable larger-scale integration. Herein we demonstrate the controlled, high-yield
(
>
90
%
)
, site-selective deposition of ultrathin few-layer (three to ten) graphene oxide by dielectrophoresis between prefabricated electrodes. Individual layers are found near the edges. Initially insulating, thermal reduction at
450
°
C
thins out the two-dimensional few-atom thick films and dramatically reduces electrical resistances down to
40
k
Ω
. Conductivities between 15 and 36 S/cm are obtained. The introduced method permits the nonintrusive, parallel, large-scale assembly of soluble two-dimensional nanostructures and sheets.</description><issn>0003-6951</issn><issn>1077-3118</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2009</creationdate><recordtype>article</recordtype><recordid>eNp1kEFLwzAUx4MoWKcHv0GvHjLzljZtL4IMdcJAD3oOr2myRtpmJBmyb2_mhjcv770__Hn8-BFyC2wOTPB7mHNWVdBUZySDdFEOUJ-TjDHGqWhKuCRXIXylWC44z8j7ym56urd66PIuTa2id9veeR2tyjEEPbbDPncmj9-OdnbUU7BuwiHfeNz2etL5hJML0e9U3HkdrsmFwSHom9Oekc_np4_liq7fXl6Xj2uqeMkirUAUJgEWRc1hIdoG6sYgikYLvWiwqNsWa4GcV9BVLXa1KtAIZowqAE1Cn5G741_lXQheG7n1dkS_l8DkQYUEeVKRug_HblA2Ykz8_5cPPuSvD_nng_8AFOJnzg</recordid><startdate>20090202</startdate><enddate>20090202</enddate><creator>Burg, Brian R.</creator><creator>Lütolf, Fabian</creator><creator>Schneider, Julian</creator><creator>Schirmer, Niklas C.</creator><creator>Schwamb, Timo</creator><creator>Poulikakos, Dimos</creator><general>American Institute of Physics</general><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>20090202</creationdate><title>High-yield dielectrophoretic assembly of two-dimensional graphene nanostructures</title><author>Burg, Brian R. ; Lütolf, Fabian ; Schneider, Julian ; Schirmer, Niklas C. ; Schwamb, Timo ; Poulikakos, Dimos</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c350t-7164f1074483126b9189faa69e6e29a48bba86a3371d7bad8c4af60ffc41af233</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2009</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Burg, Brian R.</creatorcontrib><creatorcontrib>Lütolf, Fabian</creatorcontrib><creatorcontrib>Schneider, Julian</creatorcontrib><creatorcontrib>Schirmer, Niklas C.</creatorcontrib><creatorcontrib>Schwamb, Timo</creatorcontrib><creatorcontrib>Poulikakos, Dimos</creatorcontrib><collection>CrossRef</collection><jtitle>Applied physics letters</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Burg, Brian R.</au><au>Lütolf, Fabian</au><au>Schneider, Julian</au><au>Schirmer, Niklas C.</au><au>Schwamb, Timo</au><au>Poulikakos, Dimos</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>High-yield dielectrophoretic assembly of two-dimensional graphene nanostructures</atitle><jtitle>Applied physics letters</jtitle><date>2009-02-02</date><risdate>2009</risdate><volume>94</volume><issue>5</issue><spage>053110</spage><epage>053110-3</epage><pages>053110-053110-3</pages><issn>0003-6951</issn><eissn>1077-3118</eissn><coden>APPLAB</coden><abstract>Graphene handling is still dominated by serial mechanical exfoliation, which may well facilitate measurements in a laboratory environment but does not allow reliable larger-scale integration. Herein we demonstrate the controlled, high-yield
(
>
90
%
)
, site-selective deposition of ultrathin few-layer (three to ten) graphene oxide by dielectrophoresis between prefabricated electrodes. Individual layers are found near the edges. Initially insulating, thermal reduction at
450
°
C
thins out the two-dimensional few-atom thick films and dramatically reduces electrical resistances down to
40
k
Ω
. Conductivities between 15 and 36 S/cm are obtained. The introduced method permits the nonintrusive, parallel, large-scale assembly of soluble two-dimensional nanostructures and sheets.</abstract><pub>American Institute of Physics</pub><doi>10.1063/1.3077197</doi></addata></record> |
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title | High-yield dielectrophoretic assembly of two-dimensional graphene nanostructures |
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