Nanopencil as a wear-tolerant probe for ultrahigh density data storage
A dielectric-sheathed carbon nanotube probe, resembling a "nanopencil," has been fabricated by conformal deposition of silicon-oxide on a carbon nanotube and subsequent "sharpening" to expose its tip. The high aspect-ratio nanopencil probe takes advantage of the small nanotube el...
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| Veröffentlicht in: | Applied physics letters 2008-09, Vol.93 (10), p.103112-103112-3 |
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| container_end_page | 103112-3 |
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| container_issue | 10 |
| container_start_page | 103112 |
| container_title | Applied physics letters |
| container_volume | 93 |
| creator | Tayebi, Noureddine Narui, Yoshie Chen, Robert J. Collier, C. Patrick Giapis, Konstantinos P. Zhang, Yuegang |
| description | A dielectric-sheathed carbon nanotube probe, resembling a "nanopencil," has been fabricated by conformal deposition of silicon-oxide on a carbon nanotube and subsequent "sharpening" to expose its tip. The high aspect-ratio nanopencil probe takes advantage of the small nanotube electrode size, while avoiding bending and buckling issues encountered with naked or polymer-coated carbon nanotube probes. Since the effective electrode diameter of the probe would not change even after significant wear, it is capable of long-lasting read/write operations in contact mode with a bit size of several nanometers. |
| doi_str_mv | 10.1063/1.2981641 |
| format | Article |
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| fulltext | fulltext |
| identifier | ISSN: 0003-6951 |
| ispartof | Applied physics letters, 2008-09, Vol.93 (10), p.103112-103112-3 |
| issn | 0003-6951 1077-3118 |
| language | eng |
| recordid | cdi_crossref_primary_10_1063_1_2981641 |
| source | AIP Journals Complete; AIP Digital Archive; Alma/SFX Local Collection |
| title | Nanopencil as a wear-tolerant probe for ultrahigh density data storage |
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