Experimental evidence of strain relaxed domain structure in (100)/(001)-oriented epitaxial lead titanate thick films grown by metal organic chemical vapor deposition

Epitaxial (100)/(001)-oriented PbTiO3 films with thickness of 2.8 μm were grown on Nb-doped (100) SrTiO3 substrates by pulsed metal organic chemical vapor deposition. Complex domain structures consisting of c-domains (c1) and three types of a-domains (a1, a2, and a3) were observed by piezoresponse f...

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Veröffentlicht in:Journal of applied physics 2008-09, Vol.104 (6)
Hauptverfasser: Nakaki, Hiroshi, Kim, Yong Kwan, Yokoyama, Shintaro, Ikariyama, Rikyu, Funakubo, Hiroshi, Streiffer, S. K., Nishida, Ken, Saito, Keisuke, Gruverman, Alexei
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Sprache:eng
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Zusammenfassung:Epitaxial (100)/(001)-oriented PbTiO3 films with thickness of 2.8 μm were grown on Nb-doped (100) SrTiO3 substrates by pulsed metal organic chemical vapor deposition. Complex domain structures consisting of c-domains (c1) and three types of a-domains (a1, a2, and a3) were observed by piezoresponse force microscopy in conjunction with high-resolution x-ray diffraction analysis. The obtained results suggest that (a2/a3) and (a1/c1) domain configurations represent mostly strain-relaxed structures. This conclusion is in good agreement with theoretical predictions made for thick films [Phys. State., Solidi 37, 329 (1976)].
ISSN:0021-8979
1089-7550
DOI:10.1063/1.2981193