Bending-stress-driven phase transitions in pentacene thin films for flexible organic field-effect transistors
The effects of bending strain on the structure and electrical characteristics of pentacene films in flexible devices were investigated. It was found that the volume fraction of bulk phase in the pentacene film increases from 10.7% to 27.7% under 1.1% of tensile strain but decreases to 3.5% under 1.0...
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Veröffentlicht in: | Applied physics letters 2008-06, Vol.92 (24), p.243305-243305-3 |
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creator | Yang, Chanwoo Yoon, Jinhwan Kim, Se Hyun Hong, Kipyo Chung, Dae Sung Heo, Kyuyoung Park, Chan Eon Ree, Moonhor |
description | The effects of bending strain on the structure and electrical characteristics of pentacene films in flexible devices were investigated. It was found that the volume fraction of bulk phase in the pentacene film increases from 10.7% to 27.7% under 1.1% of tensile strain but decreases to 3.5% under 1.0% of compressive strain. These bending-stress-driven phase transitions between the bulk phase and the thin-film phase in the pentacene film resulted in the changes in field-effect mobility, and were driven by the differences between the in-plane dimensions of the crystal unit cells of the two phases to reduce the external bending stress. |
doi_str_mv | 10.1063/1.2948862 |
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fullrecord | <record><control><sourceid>scitation_cross</sourceid><recordid>TN_cdi_crossref_primary_10_1063_1_2948862</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>apl</sourcerecordid><originalsourceid>FETCH-LOGICAL-c385t-ae368539f7998876d25e25e19cbbca01dba9aca8e3208b0dcdcc1ff13046e693</originalsourceid><addsrcrecordid>eNp1kE9LAzEQxYMoWKsHv8FePaQmm-5uchG0-A8KXnoP2WTSRrbZkgmi397U7lUYGN68x4P5EXLL2YKzVtzzRa2WUrb1GZlx1nVUcC7PyYwxJmirGn5JrhA_i2xqIWZk_wTRhbilmBMgUpfCF8TqsDMIVU4mYshhjFiFcoSYjYVYjF2RPgx7rPyYKj_Ad-gHqMa0NTHYYsHgKHgPNk8tmMeE1-TCmwHhZtpzsnl53qze6Prj9X31uKZWyCZTA6KVjVC-U0rKrnV1A2W4sn1vDeOuN8pYI0HUTPbMWWct954LtmyhVWJO7k61No2ICbw-pLA36Udzpo-YNNcTppJ9OGXRhmyOv_4fnljpEyv9x0r8Ah3TcuA</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Bending-stress-driven phase transitions in pentacene thin films for flexible organic field-effect transistors</title><source>AIP Journals Complete</source><source>AIP Digital Archive</source><source>Alma/SFX Local Collection</source><creator>Yang, Chanwoo ; Yoon, Jinhwan ; Kim, Se Hyun ; Hong, Kipyo ; Chung, Dae Sung ; Heo, Kyuyoung ; Park, Chan Eon ; Ree, Moonhor</creator><creatorcontrib>Yang, Chanwoo ; Yoon, Jinhwan ; Kim, Se Hyun ; Hong, Kipyo ; Chung, Dae Sung ; Heo, Kyuyoung ; Park, Chan Eon ; Ree, Moonhor</creatorcontrib><description>The effects of bending strain on the structure and electrical characteristics of pentacene films in flexible devices were investigated. It was found that the volume fraction of bulk phase in the pentacene film increases from 10.7% to 27.7% under 1.1% of tensile strain but decreases to 3.5% under 1.0% of compressive strain. These bending-stress-driven phase transitions between the bulk phase and the thin-film phase in the pentacene film resulted in the changes in field-effect mobility, and were driven by the differences between the in-plane dimensions of the crystal unit cells of the two phases to reduce the external bending stress.</description><identifier>ISSN: 0003-6951</identifier><identifier>EISSN: 1077-3118</identifier><identifier>DOI: 10.1063/1.2948862</identifier><identifier>CODEN: APPLAB</identifier><language>eng</language><publisher>American Institute of Physics</publisher><ispartof>Applied physics letters, 2008-06, Vol.92 (24), p.243305-243305-3</ispartof><rights>2008 American Institute of Physics</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c385t-ae368539f7998876d25e25e19cbbca01dba9aca8e3208b0dcdcc1ff13046e693</citedby><cites>FETCH-LOGICAL-c385t-ae368539f7998876d25e25e19cbbca01dba9aca8e3208b0dcdcc1ff13046e693</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://pubs.aip.org/apl/article-lookup/doi/10.1063/1.2948862$$EHTML$$P50$$Gscitation$$H</linktohtml><link.rule.ids>314,776,780,790,1553,4498,27901,27902,76126,76132</link.rule.ids></links><search><creatorcontrib>Yang, Chanwoo</creatorcontrib><creatorcontrib>Yoon, Jinhwan</creatorcontrib><creatorcontrib>Kim, Se Hyun</creatorcontrib><creatorcontrib>Hong, Kipyo</creatorcontrib><creatorcontrib>Chung, Dae Sung</creatorcontrib><creatorcontrib>Heo, Kyuyoung</creatorcontrib><creatorcontrib>Park, Chan Eon</creatorcontrib><creatorcontrib>Ree, Moonhor</creatorcontrib><title>Bending-stress-driven phase transitions in pentacene thin films for flexible organic field-effect transistors</title><title>Applied physics letters</title><description>The effects of bending strain on the structure and electrical characteristics of pentacene films in flexible devices were investigated. It was found that the volume fraction of bulk phase in the pentacene film increases from 10.7% to 27.7% under 1.1% of tensile strain but decreases to 3.5% under 1.0% of compressive strain. These bending-stress-driven phase transitions between the bulk phase and the thin-film phase in the pentacene film resulted in the changes in field-effect mobility, and were driven by the differences between the in-plane dimensions of the crystal unit cells of the two phases to reduce the external bending stress.</description><issn>0003-6951</issn><issn>1077-3118</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2008</creationdate><recordtype>article</recordtype><recordid>eNp1kE9LAzEQxYMoWKsHv8FePaQmm-5uchG0-A8KXnoP2WTSRrbZkgmi397U7lUYGN68x4P5EXLL2YKzVtzzRa2WUrb1GZlx1nVUcC7PyYwxJmirGn5JrhA_i2xqIWZk_wTRhbilmBMgUpfCF8TqsDMIVU4mYshhjFiFcoSYjYVYjF2RPgx7rPyYKj_Ad-gHqMa0NTHYYsHgKHgPNk8tmMeE1-TCmwHhZtpzsnl53qze6Prj9X31uKZWyCZTA6KVjVC-U0rKrnV1A2W4sn1vDeOuN8pYI0HUTPbMWWct954LtmyhVWJO7k61No2ICbw-pLA36Udzpo-YNNcTppJ9OGXRhmyOv_4fnljpEyv9x0r8Ah3TcuA</recordid><startdate>20080616</startdate><enddate>20080616</enddate><creator>Yang, Chanwoo</creator><creator>Yoon, Jinhwan</creator><creator>Kim, Se Hyun</creator><creator>Hong, Kipyo</creator><creator>Chung, Dae Sung</creator><creator>Heo, Kyuyoung</creator><creator>Park, Chan Eon</creator><creator>Ree, Moonhor</creator><general>American Institute of Physics</general><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>20080616</creationdate><title>Bending-stress-driven phase transitions in pentacene thin films for flexible organic field-effect transistors</title><author>Yang, Chanwoo ; Yoon, Jinhwan ; Kim, Se Hyun ; Hong, Kipyo ; Chung, Dae Sung ; Heo, Kyuyoung ; Park, Chan Eon ; Ree, Moonhor</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c385t-ae368539f7998876d25e25e19cbbca01dba9aca8e3208b0dcdcc1ff13046e693</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2008</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Yang, Chanwoo</creatorcontrib><creatorcontrib>Yoon, Jinhwan</creatorcontrib><creatorcontrib>Kim, Se Hyun</creatorcontrib><creatorcontrib>Hong, Kipyo</creatorcontrib><creatorcontrib>Chung, Dae Sung</creatorcontrib><creatorcontrib>Heo, Kyuyoung</creatorcontrib><creatorcontrib>Park, Chan Eon</creatorcontrib><creatorcontrib>Ree, Moonhor</creatorcontrib><collection>CrossRef</collection><jtitle>Applied physics letters</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Yang, Chanwoo</au><au>Yoon, Jinhwan</au><au>Kim, Se Hyun</au><au>Hong, Kipyo</au><au>Chung, Dae Sung</au><au>Heo, Kyuyoung</au><au>Park, Chan Eon</au><au>Ree, Moonhor</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Bending-stress-driven phase transitions in pentacene thin films for flexible organic field-effect transistors</atitle><jtitle>Applied physics letters</jtitle><date>2008-06-16</date><risdate>2008</risdate><volume>92</volume><issue>24</issue><spage>243305</spage><epage>243305-3</epage><pages>243305-243305-3</pages><issn>0003-6951</issn><eissn>1077-3118</eissn><coden>APPLAB</coden><abstract>The effects of bending strain on the structure and electrical characteristics of pentacene films in flexible devices were investigated. It was found that the volume fraction of bulk phase in the pentacene film increases from 10.7% to 27.7% under 1.1% of tensile strain but decreases to 3.5% under 1.0% of compressive strain. These bending-stress-driven phase transitions between the bulk phase and the thin-film phase in the pentacene film resulted in the changes in field-effect mobility, and were driven by the differences between the in-plane dimensions of the crystal unit cells of the two phases to reduce the external bending stress.</abstract><pub>American Institute of Physics</pub><doi>10.1063/1.2948862</doi><oa>free_for_read</oa></addata></record> |
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title | Bending-stress-driven phase transitions in pentacene thin films for flexible organic field-effect transistors |
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