Measurement and noise performance of nano-superconducting-quantum-interference devices fabricated by focused ion beam

Science and industry demand ever more sensitive measurements on ever smaller systems, as exemplified by spintronics, nanoelectromechanical system, and spin-based quantum information processing, where single electronic spin detection poses a grand challenge. Superconducting quantum interference devic...

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Veröffentlicht in:	Applied physics letters 2008-05, Vol.92 (19), p.192507-192507-3
Hauptverfasser:	Hao, L., Macfarlane, J. C., Gallop, J. C., Cox, D., Beyer, J., Drung, D., Schurig, T.
Format:	Artikel
Sprache:	eng
Online-Zugang:	Volltext
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