Microwave dielectric loss at single photon energies and millikelvin temperatures

The microwave performance of amorphous dielectric materials at very low temperatures and very low excitation strengths displays significant excess loss. Here, we present the loss tangents of some common amorphous and crystalline dielectrics, measured at low temperatures ( T < 100 mK ) with near s...

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Veröffentlicht in:	Applied physics letters 2008-03, Vol.92 (11), p.112903-112903-3
Hauptverfasser:	O'Connell, Aaron D., Ansmann, M., Bialczak, R. C., Hofheinz, M., Katz, N., Lucero, Erik, McKenney, C., Neeley, M., Wang, H., Weig, E. M., Cleland, A. N., Martinis, J. M.
Format:	Artikel
Sprache:	eng
Online-Zugang:	Volltext
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