Measurement of the x-ray dose-dependent glass transition temperature of structured polymer films by x-ray diffraction
The glass transition temperature (Tg) of polymer nanostructures was measured using a technique based on synchrotron x-ray diffraction from periodic grating structures. Poly(methyl methacrylate) (PMMA) nanostructures consisting of 1:1 lines:spaces with a 100 nm period and 100 nm height were character...
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| Veröffentlicht in: | Journal of applied physics 2007-07, Vol.102 (1) |
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| container_title | Journal of applied physics |
| container_volume | 102 |
| creator | Keymeulen, Heilke R. Diaz, Ana Solak, Harun H. David, Christian Pfeiffer, Franz Patterson, Bruce D. van der Veen, J. Friso Stoykovich, Mark P. Nealey, Paul F. |
| description | The glass transition temperature (Tg) of polymer nanostructures was measured using a technique based on synchrotron x-ray diffraction from periodic grating structures. Poly(methyl methacrylate) (PMMA) nanostructures consisting of 1:1 lines:spaces with a 100 nm period and 100 nm height were characterized to have a Tg of 118 °C, which is comparable to the Tg of PMMA in bulk systems. The Tg of the PMMA structures also was measured as a function of absorbed x-ray dose. Doses ranging from 0 to 2400 mJ/mm3 were delivered to the PMMA structures prior to the Tg measurements; the Tg of the structures was found to decrease from 118 °C to 95 °C, respectively. The dose dependence of the PMMA glass transition temperature can be attributed to changes in the polymer molecular weight under exposure to x rays. |
| doi_str_mv | 10.1063/1.2752548 |
| format | Article |
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| language | eng |
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| source | AIP Journals Complete; AIP Digital Archive |
| title | Measurement of the x-ray dose-dependent glass transition temperature of structured polymer films by x-ray diffraction |
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