Separating dipolar broadening from the intrinsic switching field distribution in perpendicular patterned media
A critical requirement for bit patterned media applications is the control and minimization of the switching field distribution (SFD). Here, we use the Δ H ( M , Δ M ) method to separate dipolar interactions due to neighbor islands from the intrinsic SFD by measuring a series of partial reversal cur...
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| Veröffentlicht in: | Applied physics letters 2007-04, Vol.90 (16), p.162516-162516-3 |
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| container_end_page | 162516-3 |
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| container_issue | 16 |
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| container_title | Applied physics letters |
| container_volume | 90 |
| creator | Hellwig, O. Berger, A. Thomson, T. Dobisz, E. Bandic, Z. Z Yang, H. Kercher, D. S. Fullerton, E. E. |
| description | A critical requirement for bit patterned media applications is the control and minimization of the switching field distribution (SFD). Here, we use the
Δ
H
(
M
,
Δ
M
)
method to separate dipolar interactions due to neighbor islands from the intrinsic SFD by measuring a series of partial reversal curves of perpendicular anisotropy
Co
∕
Pd
based multilayer films deposited onto prepatterned Si substrates. For a
100
-
nm
-period island array the dipolar broadening contributes 22% to the observed SFD. For a
45
-
nm
-period array this value increases to 31%. These results highlight the importance of quantifying long-range dipolar interactions for determining the intrinsic SFD of patterned media. |
| doi_str_mv | 10.1063/1.2730744 |
| format | Article |
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Δ
H
(
M
,
Δ
M
)
method to separate dipolar interactions due to neighbor islands from the intrinsic SFD by measuring a series of partial reversal curves of perpendicular anisotropy
Co
∕
Pd
based multilayer films deposited onto prepatterned Si substrates. For a
100
-
nm
-period island array the dipolar broadening contributes 22% to the observed SFD. For a
45
-
nm
-period array this value increases to 31%. These results highlight the importance of quantifying long-range dipolar interactions for determining the intrinsic SFD of patterned media.</description><identifier>ISSN: 0003-6951</identifier><identifier>EISSN: 1077-3118</identifier><identifier>DOI: 10.1063/1.2730744</identifier><identifier>CODEN: APPLAB</identifier><language>eng</language><publisher>American Institute of Physics</publisher><ispartof>Applied physics letters, 2007-04, Vol.90 (16), p.162516-162516-3</ispartof><rights>2007 American Institute of Physics</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c350t-7885bb3dfb06bb7b6d7e917d26a5286f718c66213ab5edc418d94600c3d6189b3</citedby><cites>FETCH-LOGICAL-c350t-7885bb3dfb06bb7b6d7e917d26a5286f718c66213ab5edc418d94600c3d6189b3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://pubs.aip.org/apl/article-lookup/doi/10.1063/1.2730744$$EHTML$$P50$$Gscitation$$H</linktohtml><link.rule.ids>314,777,781,791,1554,4498,27905,27906,76133,76139</link.rule.ids></links><search><creatorcontrib>Hellwig, O.</creatorcontrib><creatorcontrib>Berger, A.</creatorcontrib><creatorcontrib>Thomson, T.</creatorcontrib><creatorcontrib>Dobisz, E.</creatorcontrib><creatorcontrib>Bandic, Z. Z</creatorcontrib><creatorcontrib>Yang, H.</creatorcontrib><creatorcontrib>Kercher, D. S.</creatorcontrib><creatorcontrib>Fullerton, E. E.</creatorcontrib><title>Separating dipolar broadening from the intrinsic switching field distribution in perpendicular patterned media</title><title>Applied physics letters</title><description>A critical requirement for bit patterned media applications is the control and minimization of the switching field distribution (SFD). Here, we use the
Δ
H
(
M
,
Δ
M
)
method to separate dipolar interactions due to neighbor islands from the intrinsic SFD by measuring a series of partial reversal curves of perpendicular anisotropy
Co
∕
Pd
based multilayer films deposited onto prepatterned Si substrates. For a
100
-
nm
-period island array the dipolar broadening contributes 22% to the observed SFD. For a
45
-
nm
-period array this value increases to 31%. These results highlight the importance of quantifying long-range dipolar interactions for determining the intrinsic SFD of patterned media.</description><issn>0003-6951</issn><issn>1077-3118</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2007</creationdate><recordtype>article</recordtype><recordid>eNp1kE1LxDAQhoMouK4e_Ae5euiaadokvQiy6CoseFDPIV91I920JFnEf2_rFjx5GmbeZwbmQegayAoIo7ewKjklvKpO0AII5wUFEKdoQQihBWtqOEcXKX2ObV1SukDh1Q0qquzDB7Z-6DsVsY69si5Mozb2e5x3DvuQow_JG5y-fDa739C7zo5baYz0Ifs-jBgeXBxcsN4cpluDytnF4CzeO-vVJTprVZfc1VyX6P3x4W39VGxfNs_r-21haE1ywYWotaa21YRpzTWz3DXAbclUXQrWchCGsRKo0rWzpgJhm4oRYqhlIBpNl-jmeNfEPqXoWjlEv1fxWwKRkygJchY1sndHNhmf1fTG__CfLTnbkpr-APpJcs4</recordid><startdate>20070416</startdate><enddate>20070416</enddate><creator>Hellwig, O.</creator><creator>Berger, A.</creator><creator>Thomson, T.</creator><creator>Dobisz, E.</creator><creator>Bandic, Z. Z</creator><creator>Yang, H.</creator><creator>Kercher, D. S.</creator><creator>Fullerton, E. E.</creator><general>American Institute of Physics</general><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>20070416</creationdate><title>Separating dipolar broadening from the intrinsic switching field distribution in perpendicular patterned media</title><author>Hellwig, O. ; Berger, A. ; Thomson, T. ; Dobisz, E. ; Bandic, Z. Z ; Yang, H. ; Kercher, D. S. ; Fullerton, E. E.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c350t-7885bb3dfb06bb7b6d7e917d26a5286f718c66213ab5edc418d94600c3d6189b3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2007</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Hellwig, O.</creatorcontrib><creatorcontrib>Berger, A.</creatorcontrib><creatorcontrib>Thomson, T.</creatorcontrib><creatorcontrib>Dobisz, E.</creatorcontrib><creatorcontrib>Bandic, Z. Z</creatorcontrib><creatorcontrib>Yang, H.</creatorcontrib><creatorcontrib>Kercher, D. S.</creatorcontrib><creatorcontrib>Fullerton, E. E.</creatorcontrib><collection>CrossRef</collection><jtitle>Applied physics letters</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Hellwig, O.</au><au>Berger, A.</au><au>Thomson, T.</au><au>Dobisz, E.</au><au>Bandic, Z. Z</au><au>Yang, H.</au><au>Kercher, D. S.</au><au>Fullerton, E. E.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Separating dipolar broadening from the intrinsic switching field distribution in perpendicular patterned media</atitle><jtitle>Applied physics letters</jtitle><date>2007-04-16</date><risdate>2007</risdate><volume>90</volume><issue>16</issue><spage>162516</spage><epage>162516-3</epage><pages>162516-162516-3</pages><issn>0003-6951</issn><eissn>1077-3118</eissn><coden>APPLAB</coden><abstract>A critical requirement for bit patterned media applications is the control and minimization of the switching field distribution (SFD). Here, we use the
Δ
H
(
M
,
Δ
M
)
method to separate dipolar interactions due to neighbor islands from the intrinsic SFD by measuring a series of partial reversal curves of perpendicular anisotropy
Co
∕
Pd
based multilayer films deposited onto prepatterned Si substrates. For a
100
-
nm
-period island array the dipolar broadening contributes 22% to the observed SFD. For a
45
-
nm
-period array this value increases to 31%. These results highlight the importance of quantifying long-range dipolar interactions for determining the intrinsic SFD of patterned media.</abstract><pub>American Institute of Physics</pub><doi>10.1063/1.2730744</doi></addata></record> |
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| ispartof | Applied physics letters, 2007-04, Vol.90 (16), p.162516-162516-3 |
| issn | 0003-6951 1077-3118 |
| language | eng |
| recordid | cdi_crossref_primary_10_1063_1_2730744 |
| source | AIP Journals Complete; AIP Digital Archive |
| title | Separating dipolar broadening from the intrinsic switching field distribution in perpendicular patterned media |
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