Domain structure sequence in ferroelectric Pb(Zr0.2Ti0.8)O3 thin film on MgO

The structural evolution of a polydomain ferroelectric Pb(Zr0.2Ti0.8)O3 film was studied by temperature-dependent x-ray diffraction. Two critical temperatures were evidenced: T*=740K, corresponding to a change in the domain structure (a∕c∕a∕c to a1∕a2∕a1∕a2), and TCfilm=825K, where the film undergoe...

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Veröffentlicht in:	Applied physics letters 2007-04, Vol.90 (16)
Hauptverfasser:	Janolin, Pierre-Eymeric, Fraisse, Bernard, Dkhil, Brahim, Le Marrec, Françoise, Ringgaard, Erling
Format:	Artikel
Sprache:	eng
Online-Zugang:	Volltext
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