Distributed Bragg reflector consisting of high- and low-refractive-index thin film layers made of the same material

Distributed Bragg reflector consisting of high- and low-refractive-index thin film layers made of the same material

A conductive distributed Bragg reflector (DBR) composed entirely of a single material—indium tin oxide (ITO)—is reported. The high- and low-refractive-index layers of the DBR are deposited by oblique-angle deposition and consist of ITO thin films with low and high porosities, which yield an index co...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Applied physics letters 2007-04, Vol.90 (14)
Hauptverfasser: Schubert, Martin F., Xi, J.-Q., Kim, Jong Kyu, Schubert, E. Fred
Format: Artikel
Sprache:eng
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue 14
container_start_page
container_title Applied physics letters
container_volume 90
creator Schubert, Martin F.
Xi, J.-Q.
Kim, Jong Kyu
Schubert, E. Fred
description A conductive distributed Bragg reflector (DBR) composed entirely of a single material—indium tin oxide (ITO)—is reported. The high- and low-refractive-index layers of the DBR are deposited by oblique-angle deposition and consist of ITO thin films with low and high porosities, which yield an index contrast of Δn=0.4. A single-material DBR with three periods achieves a reflectivity of 72.7%, in excellent agreement with theory.
doi_str_mv 10.1063/1.2720269
format Article
fullrecord <record><control><sourceid>crossref</sourceid><recordid>TN_cdi_crossref_primary_10_1063_1_2720269</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>10_1063_1_2720269</sourcerecordid><originalsourceid>FETCH-LOGICAL-c330t-f124df1b8ed54998ea72d178b98d9db3cffc0033fd9824eb98afa28d4f4321343</originalsourceid><addsrcrecordid>eNotUMlOBCEQJUYTx9GDf8DVAyMFPdNw1HFNJvGi5w4NRTemFwO4zN-LcU6Vekul3iPkEvgK-EZew0rUgouNPiIL4HXNJIA6JgvOuWQbvYZTcpbSe1nXQsoFSXch5Rjaz4yO3kbTdTSiH9DmOVI7T6nQYero7Gkfup5RMzk6zN-sqKKxOXwhC5PDH5r7MFEfhpEOZo8x0dE4_PPlHmkyIxYgYwxmOCcn3gwJLw5zSd4e7l-3T2z38vi8vdkxKyXPzIOonIdWoVtXWis0tXBQq1Yrp10rrfe2pJLeaSUqLLDxRihX-UoKkJVckqv_uzbOKZWHm48YRhP3DfDmr60GmkNb8hfDSV4R</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Distributed Bragg reflector consisting of high- and low-refractive-index thin film layers made of the same material</title><source>AIP Journals Complete</source><source>AIP Digital Archive</source><creator>Schubert, Martin F. ; Xi, J.-Q. ; Kim, Jong Kyu ; Schubert, E. Fred</creator><creatorcontrib>Schubert, Martin F. ; Xi, J.-Q. ; Kim, Jong Kyu ; Schubert, E. Fred</creatorcontrib><description>A conductive distributed Bragg reflector (DBR) composed entirely of a single material—indium tin oxide (ITO)—is reported. The high- and low-refractive-index layers of the DBR are deposited by oblique-angle deposition and consist of ITO thin films with low and high porosities, which yield an index contrast of Δn=0.4. A single-material DBR with three periods achieves a reflectivity of 72.7%, in excellent agreement with theory.</description><identifier>ISSN: 0003-6951</identifier><identifier>EISSN: 1077-3118</identifier><identifier>DOI: 10.1063/1.2720269</identifier><language>eng</language><ispartof>Applied physics letters, 2007-04, Vol.90 (14)</ispartof><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c330t-f124df1b8ed54998ea72d178b98d9db3cffc0033fd9824eb98afa28d4f4321343</citedby><cites>FETCH-LOGICAL-c330t-f124df1b8ed54998ea72d178b98d9db3cffc0033fd9824eb98afa28d4f4321343</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784,27924,27925</link.rule.ids></links><search><creatorcontrib>Schubert, Martin F.</creatorcontrib><creatorcontrib>Xi, J.-Q.</creatorcontrib><creatorcontrib>Kim, Jong Kyu</creatorcontrib><creatorcontrib>Schubert, E. Fred</creatorcontrib><title>Distributed Bragg reflector consisting of high- and low-refractive-index thin film layers made of the same material</title><title>Applied physics letters</title><description>A conductive distributed Bragg reflector (DBR) composed entirely of a single material—indium tin oxide (ITO)—is reported. The high- and low-refractive-index layers of the DBR are deposited by oblique-angle deposition and consist of ITO thin films with low and high porosities, which yield an index contrast of Δn=0.4. A single-material DBR with three periods achieves a reflectivity of 72.7%, in excellent agreement with theory.</description><issn>0003-6951</issn><issn>1077-3118</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2007</creationdate><recordtype>article</recordtype><recordid>eNotUMlOBCEQJUYTx9GDf8DVAyMFPdNw1HFNJvGi5w4NRTemFwO4zN-LcU6Vekul3iPkEvgK-EZew0rUgouNPiIL4HXNJIA6JgvOuWQbvYZTcpbSe1nXQsoFSXch5Rjaz4yO3kbTdTSiH9DmOVI7T6nQYero7Gkfup5RMzk6zN-sqKKxOXwhC5PDH5r7MFEfhpEOZo8x0dE4_PPlHmkyIxYgYwxmOCcn3gwJLw5zSd4e7l-3T2z38vi8vdkxKyXPzIOonIdWoVtXWis0tXBQq1Yrp10rrfe2pJLeaSUqLLDxRihX-UoKkJVckqv_uzbOKZWHm48YRhP3DfDmr60GmkNb8hfDSV4R</recordid><startdate>20070402</startdate><enddate>20070402</enddate><creator>Schubert, Martin F.</creator><creator>Xi, J.-Q.</creator><creator>Kim, Jong Kyu</creator><creator>Schubert, E. Fred</creator><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>20070402</creationdate><title>Distributed Bragg reflector consisting of high- and low-refractive-index thin film layers made of the same material</title><author>Schubert, Martin F. ; Xi, J.-Q. ; Kim, Jong Kyu ; Schubert, E. Fred</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c330t-f124df1b8ed54998ea72d178b98d9db3cffc0033fd9824eb98afa28d4f4321343</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2007</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Schubert, Martin F.</creatorcontrib><creatorcontrib>Xi, J.-Q.</creatorcontrib><creatorcontrib>Kim, Jong Kyu</creatorcontrib><creatorcontrib>Schubert, E. Fred</creatorcontrib><collection>CrossRef</collection><jtitle>Applied physics letters</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Schubert, Martin F.</au><au>Xi, J.-Q.</au><au>Kim, Jong Kyu</au><au>Schubert, E. Fred</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Distributed Bragg reflector consisting of high- and low-refractive-index thin film layers made of the same material</atitle><jtitle>Applied physics letters</jtitle><date>2007-04-02</date><risdate>2007</risdate><volume>90</volume><issue>14</issue><issn>0003-6951</issn><eissn>1077-3118</eissn><abstract>A conductive distributed Bragg reflector (DBR) composed entirely of a single material—indium tin oxide (ITO)—is reported. The high- and low-refractive-index layers of the DBR are deposited by oblique-angle deposition and consist of ITO thin films with low and high porosities, which yield an index contrast of Δn=0.4. A single-material DBR with three periods achieves a reflectivity of 72.7%, in excellent agreement with theory.</abstract><doi>10.1063/1.2720269</doi><oa>free_for_read</oa></addata></record>
fulltext fulltext
identifier ISSN: 0003-6951
ispartof Applied physics letters, 2007-04, Vol.90 (14)
issn 0003-6951
1077-3118
language eng
recordid cdi_crossref_primary_10_1063_1_2720269
source AIP Journals Complete; AIP Digital Archive
title Distributed Bragg reflector consisting of high- and low-refractive-index thin film layers made of the same material
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-02T21%3A16%3A51IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-crossref&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Distributed%20Bragg%20reflector%20consisting%20of%20high-%20and%20low-refractive-index%20thin%20film%20layers%20made%20of%20the%20same%20material&rft.jtitle=Applied%20physics%20letters&rft.au=Schubert,%20Martin%20F.&rft.date=2007-04-02&rft.volume=90&rft.issue=14&rft.issn=0003-6951&rft.eissn=1077-3118&rft_id=info:doi/10.1063/1.2720269&rft_dat=%3Ccrossref%3E10_1063_1_2720269%3C/crossref%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true