Influence of impurities and structural properties on the device stability of pentacene thin film transistors

The influence of environmental conditions on the electronic transport and the device stability of polycrystalline pentacene transistors were investigated. Electrical in situ and ex situ measurements of pentacene thin film transistors were carried out to study the influence of dry oxygen and moisture...

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Veröffentlicht in:	Journal of applied physics 2007-02, Vol.101 (4)
Hauptverfasser:	Knipp, D., Benor, A., Wagner, V., Muck, T.
Format:	Artikel
Sprache:	eng
Online-Zugang:	Volltext
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