Direct full compensation of the aberrations in quantitative phase microscopy of thin objects by a single digital hologram
Aberrations and the distortions due to the imaging optics can be compensated in quantitative phase microscopy of thin phase objects by digital holography using a single hologram. The reconstructed quantitative phase microscopy phase distribution map can be directly corrected in the reconstructed ima...
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| Veröffentlicht in: | Applied physics letters 2007-01, Vol.90 (4), p.041104-041104-3 |
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| container_end_page | 041104-3 |
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| container_issue | 4 |
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| container_title | Applied physics letters |
| container_volume | 90 |
| creator | Miccio, L. Alfieri, D. Grilli, S. Ferraro, P. Finizio, A. De Petrocellis, L. Nicola, S. D. |
| description | Aberrations and the distortions due to the imaging optics can be compensated in quantitative phase microscopy of thin phase objects by digital holography using a single hologram. The reconstructed quantitative phase microscopy phase distribution map can be directly corrected in the reconstructed image plane by a numerical method. To remove this unwanted aberration, in the special case of thin objects, the authors perform a two-dimensional fit with the Zernike polynomials of the reconstructed unwrapped phase. Subtraction of the fitted polynomial from the original phase map gives quantitative phase microscopy phase map free of aberrations. |
| doi_str_mv | 10.1063/1.2432287 |
| format | Article |
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D.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Direct full compensation of the aberrations in quantitative phase microscopy of thin objects by a single digital hologram</atitle><jtitle>Applied physics letters</jtitle><date>2007-01-22</date><risdate>2007</risdate><volume>90</volume><issue>4</issue><spage>041104</spage><epage>041104-3</epage><pages>041104-041104-3</pages><issn>0003-6951</issn><eissn>1077-3118</eissn><coden>APPLAB</coden><abstract>Aberrations and the distortions due to the imaging optics can be compensated in quantitative phase microscopy of thin phase objects by digital holography using a single hologram. The reconstructed quantitative phase microscopy phase distribution map can be directly corrected in the reconstructed image plane by a numerical method. To remove this unwanted aberration, in the special case of thin objects, the authors perform a two-dimensional fit with the Zernike polynomials of the reconstructed unwrapped phase. Subtraction of the fitted polynomial from the original phase map gives quantitative phase microscopy phase map free of aberrations.</abstract><pub>American Institute of Physics</pub><doi>10.1063/1.2432287</doi></addata></record> |
| fulltext | fulltext |
| identifier | ISSN: 0003-6951 |
| ispartof | Applied physics letters, 2007-01, Vol.90 (4), p.041104-041104-3 |
| issn | 0003-6951 1077-3118 |
| language | eng |
| recordid | cdi_crossref_primary_10_1063_1_2432287 |
| source | AIP Journals Complete; AIP Digital Archive |
| title | Direct full compensation of the aberrations in quantitative phase microscopy of thin objects by a single digital hologram |
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