Enhancement of electrical properties in polycrystalline BiFeO3 thin films

Ferroelectric BiFeO3 thin films were grown on Pt∕TiO2∕SiO2∕Si substrates by pulsed-laser deposition. From the x-ray diffraction analysis, the BiFeO3 thin films consist of perovskite single phase, and the crystal structure shows the tetragonal structure with a space group P4mm. The BiFeO3 thin films...

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Veröffentlicht in:	Applied physics letters 2006-11, Vol.89 (19)
Hauptverfasser:	Yun, Kwi Young, Ricinschi, Dan, Kanashima, Takeshi, Okuyama, Masanori
Format:	Artikel
Sprache:	eng
Online-Zugang:	Volltext
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