On the importance of boundary conditions on nanomechanical bending behavior and elastic modulus determination of silver nanowires

Nanomechanical bending behavior and elastic modulus of silver nanowires ( 65 - 140 nm ∅ ) suspended across silicon microchannels were investigated using digital pulsed force mode (DPFM) atomic force microscopy through coincident imaging and force profiling. Deflection profiles analyzed off-line demo...

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Veröffentlicht in:	Journal of applied physics 2006-11, Vol.100 (10), p.104301-104301-7
Hauptverfasser:	Chen, Yunxia, Dorgan, Brian L., McIlroy, David N., Eric Aston, D.
Format:	Artikel
Sprache:	eng
Online-Zugang:	Volltext
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