Time-of-flight emission profiles of the entire plume using fast imaging during pulsed laser deposition of YBa2Cu3O7−x

Emission time-of-flight (TOF) profiles have been obtained using gated imagery to further the process control during the pulsed laser deposition of the high temperature superconductor, YBa2Cu3O7−x. An intensified charge coupled device array was used to obtain a sequence of plume images at 10ns tempor...

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Veröffentlicht in:	Review of scientific instruments 2005-09, Vol.76 (9)
Hauptverfasser:	Druffner, Carl J., Perram, Glen P., Biggers, Rand R.
Format:	Artikel
Sprache:	eng
Online-Zugang:	Volltext
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