Room-temperature epitaxial growth of ferromagnetic Fe3Si films on Si(111) by facing target direct-current sputtering
Ferromagnetic Fe3Si thin films with an extremely smooth surface morphology can be epitaxially grown on Si(111) at room temperature by facing target direct-current sputtering. The epitaxial relationship is Fe3Si(111)‖Si(111) with Fe3Si[11¯0]‖Si[1¯10]. By the application of the extinction rule of x-ra...
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Veröffentlicht in: | Applied physics letters 2005-06, Vol.86 (26) |
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creator | Yoshitake, T. Nakagauchi, D. Ogawa, T. Itakura, M. Kuwano, N. Tomokiyo, Y. Kajiwara, T. Nagayama, K. |
description | Ferromagnetic Fe3Si thin films with an extremely smooth surface morphology can be epitaxially grown on Si(111) at room temperature by facing target direct-current sputtering. The epitaxial relationship is Fe3Si(111)‖Si(111) with Fe3Si[11¯0]‖Si[1¯10]. By the application of the extinction rule of x-ray diffraction, the generated Fe3Si was confirmed to possess a B2 structure and not a DO3 one. The film showed a saturation magnetization value of 960emu∕cm3, which was slightly lower than that of bulk DO3-Fe3Si. It was observed that the magnetization easy axis was along the [11¯0] direction in the film plane. |
doi_str_mv | 10.1063/1.1978984 |
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fullrecord | <record><control><sourceid>crossref</sourceid><recordid>TN_cdi_crossref_primary_10_1063_1_1978984</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>10_1063_1_1978984</sourcerecordid><originalsourceid>FETCH-LOGICAL-c225t-fb664c4cc63c155670bc1b6705f20cc58418483f4264f47aa818c063b535d8233</originalsourceid><addsrcrecordid>eNotkM1KAzEYRYMoWKsL3yBLu0jNN_mZdCnFqlAQrK6HzNdkjHR-SDJo394RuzpcuFy4h5Bb4EvgWtzDElalWRl5RmbAy5IJAHNOZpxzwfRKwSW5SulriqoQYkbyW9-3LLt2cNHmMTrqhpDtT7AH2sT-O3_S3lPvYuxb23QuB6QbJ3aB-nBoE-07ugt3ALCg9ZF6i6FraLaxcZnuQ3SYGY4xui7TNIw5uzgVrsmFt4fkbk6ck4_N4_v6mW1fn17WD1uGRaEy87XWEiWiFghK6ZLXCPUE5QuOqIwEI43wstDSy9JaAwYnCbUSam-me3Oy-N_F2KcUna-GGFobjxXw6k9XBdVJl_gFkyNc2g</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Room-temperature epitaxial growth of ferromagnetic Fe3Si films on Si(111) by facing target direct-current sputtering</title><source>AIP Journals Complete</source><source>AIP Digital Archive</source><creator>Yoshitake, T. ; Nakagauchi, D. ; Ogawa, T. ; Itakura, M. ; Kuwano, N. ; Tomokiyo, Y. ; Kajiwara, T. ; Nagayama, K.</creator><creatorcontrib>Yoshitake, T. ; Nakagauchi, D. ; Ogawa, T. ; Itakura, M. ; Kuwano, N. ; Tomokiyo, Y. ; Kajiwara, T. ; Nagayama, K.</creatorcontrib><description>Ferromagnetic Fe3Si thin films with an extremely smooth surface morphology can be epitaxially grown on Si(111) at room temperature by facing target direct-current sputtering. The epitaxial relationship is Fe3Si(111)‖Si(111) with Fe3Si[11¯0]‖Si[1¯10]. By the application of the extinction rule of x-ray diffraction, the generated Fe3Si was confirmed to possess a B2 structure and not a DO3 one. The film showed a saturation magnetization value of 960emu∕cm3, which was slightly lower than that of bulk DO3-Fe3Si. It was observed that the magnetization easy axis was along the [11¯0] direction in the film plane.</description><identifier>ISSN: 0003-6951</identifier><identifier>EISSN: 1077-3118</identifier><identifier>DOI: 10.1063/1.1978984</identifier><language>eng</language><ispartof>Applied physics letters, 2005-06, Vol.86 (26)</ispartof><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c225t-fb664c4cc63c155670bc1b6705f20cc58418483f4264f47aa818c063b535d8233</citedby><cites>FETCH-LOGICAL-c225t-fb664c4cc63c155670bc1b6705f20cc58418483f4264f47aa818c063b535d8233</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784,27924,27925</link.rule.ids></links><search><creatorcontrib>Yoshitake, T.</creatorcontrib><creatorcontrib>Nakagauchi, D.</creatorcontrib><creatorcontrib>Ogawa, T.</creatorcontrib><creatorcontrib>Itakura, M.</creatorcontrib><creatorcontrib>Kuwano, N.</creatorcontrib><creatorcontrib>Tomokiyo, Y.</creatorcontrib><creatorcontrib>Kajiwara, T.</creatorcontrib><creatorcontrib>Nagayama, K.</creatorcontrib><title>Room-temperature epitaxial growth of ferromagnetic Fe3Si films on Si(111) by facing target direct-current sputtering</title><title>Applied physics letters</title><description>Ferromagnetic Fe3Si thin films with an extremely smooth surface morphology can be epitaxially grown on Si(111) at room temperature by facing target direct-current sputtering. The epitaxial relationship is Fe3Si(111)‖Si(111) with Fe3Si[11¯0]‖Si[1¯10]. By the application of the extinction rule of x-ray diffraction, the generated Fe3Si was confirmed to possess a B2 structure and not a DO3 one. The film showed a saturation magnetization value of 960emu∕cm3, which was slightly lower than that of bulk DO3-Fe3Si. It was observed that the magnetization easy axis was along the [11¯0] direction in the film plane.</description><issn>0003-6951</issn><issn>1077-3118</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2005</creationdate><recordtype>article</recordtype><recordid>eNotkM1KAzEYRYMoWKsL3yBLu0jNN_mZdCnFqlAQrK6HzNdkjHR-SDJo394RuzpcuFy4h5Bb4EvgWtzDElalWRl5RmbAy5IJAHNOZpxzwfRKwSW5SulriqoQYkbyW9-3LLt2cNHmMTrqhpDtT7AH2sT-O3_S3lPvYuxb23QuB6QbJ3aB-nBoE-07ugt3ALCg9ZF6i6FraLaxcZnuQ3SYGY4xui7TNIw5uzgVrsmFt4fkbk6ck4_N4_v6mW1fn17WD1uGRaEy87XWEiWiFghK6ZLXCPUE5QuOqIwEI43wstDSy9JaAwYnCbUSam-me3Oy-N_F2KcUna-GGFobjxXw6k9XBdVJl_gFkyNc2g</recordid><startdate>20050627</startdate><enddate>20050627</enddate><creator>Yoshitake, T.</creator><creator>Nakagauchi, D.</creator><creator>Ogawa, T.</creator><creator>Itakura, M.</creator><creator>Kuwano, N.</creator><creator>Tomokiyo, Y.</creator><creator>Kajiwara, T.</creator><creator>Nagayama, K.</creator><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>20050627</creationdate><title>Room-temperature epitaxial growth of ferromagnetic Fe3Si films on Si(111) by facing target direct-current sputtering</title><author>Yoshitake, T. ; Nakagauchi, D. ; Ogawa, T. ; Itakura, M. ; Kuwano, N. ; Tomokiyo, Y. ; Kajiwara, T. ; Nagayama, K.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c225t-fb664c4cc63c155670bc1b6705f20cc58418483f4264f47aa818c063b535d8233</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2005</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Yoshitake, T.</creatorcontrib><creatorcontrib>Nakagauchi, D.</creatorcontrib><creatorcontrib>Ogawa, T.</creatorcontrib><creatorcontrib>Itakura, M.</creatorcontrib><creatorcontrib>Kuwano, N.</creatorcontrib><creatorcontrib>Tomokiyo, Y.</creatorcontrib><creatorcontrib>Kajiwara, T.</creatorcontrib><creatorcontrib>Nagayama, K.</creatorcontrib><collection>CrossRef</collection><jtitle>Applied physics letters</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Yoshitake, T.</au><au>Nakagauchi, D.</au><au>Ogawa, T.</au><au>Itakura, M.</au><au>Kuwano, N.</au><au>Tomokiyo, Y.</au><au>Kajiwara, T.</au><au>Nagayama, K.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Room-temperature epitaxial growth of ferromagnetic Fe3Si films on Si(111) by facing target direct-current sputtering</atitle><jtitle>Applied physics letters</jtitle><date>2005-06-27</date><risdate>2005</risdate><volume>86</volume><issue>26</issue><issn>0003-6951</issn><eissn>1077-3118</eissn><abstract>Ferromagnetic Fe3Si thin films with an extremely smooth surface morphology can be epitaxially grown on Si(111) at room temperature by facing target direct-current sputtering. The epitaxial relationship is Fe3Si(111)‖Si(111) with Fe3Si[11¯0]‖Si[1¯10]. By the application of the extinction rule of x-ray diffraction, the generated Fe3Si was confirmed to possess a B2 structure and not a DO3 one. The film showed a saturation magnetization value of 960emu∕cm3, which was slightly lower than that of bulk DO3-Fe3Si. It was observed that the magnetization easy axis was along the [11¯0] direction in the film plane.</abstract><doi>10.1063/1.1978984</doi></addata></record> |
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title | Room-temperature epitaxial growth of ferromagnetic Fe3Si films on Si(111) by facing target direct-current sputtering |
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