Controllable method for the preparation of metalized probes for efficient scanning near-field optical Raman microscopy
A modification of the mirror reaction method has been used to metalize atomic force microscope (AFM) probes for apertureless near-field optical microscopy. The method produces a single silver particle of controllable size at the apex of the AFM tip with no detrimental effects on the AFM probe. A par...
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| Veröffentlicht in: | Applied physics letters 2005-06, Vol.86 (26), p.263111-263111-3 |
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| container_end_page | 263111-3 |
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| container_issue | 26 |
| container_start_page | 263111 |
| container_title | Applied physics letters |
| container_volume | 86 |
| creator | Wang, J. J. Saito, Y. Batchelder, D. N. Kirkham, J. Robinson, C. Smith, D. A. |
| description | A modification of the mirror reaction method has been used to metalize atomic force microscope (AFM) probes for apertureless near-field optical microscopy. The method produces a single silver particle of controllable size at the apex of the AFM tip with no detrimental effects on the AFM probe. A particle of the order
80
nm
in diameter appears to provide the best tip-enhanced Raman signal using
488
nm
excitation. The near-field Raman spatial resolution of one such probe was shown to be as high as
24
nm
using single-walled carbon nanotubes as a test sample. |
| doi_str_mv | 10.1063/1.1978983 |
| format | Article |
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80
nm
in diameter appears to provide the best tip-enhanced Raman signal using
488
nm
excitation. The near-field Raman spatial resolution of one such probe was shown to be as high as
24
nm
using single-walled carbon nanotubes as a test sample.</description><identifier>ISSN: 0003-6951</identifier><identifier>EISSN: 1077-3118</identifier><identifier>DOI: 10.1063/1.1978983</identifier><identifier>CODEN: APPLAB</identifier><language>eng</language><publisher>American Institute of Physics</publisher><ispartof>Applied physics letters, 2005-06, Vol.86 (26), p.263111-263111-3</ispartof><rights>2005 American Institute of Physics</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c349t-beb6e6a75b618a2baa9d1d174d1a5508464d8c7dc73852860d0d1bfd294bee6d3</citedby><cites>FETCH-LOGICAL-c349t-beb6e6a75b618a2baa9d1d174d1a5508464d8c7dc73852860d0d1bfd294bee6d3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://pubs.aip.org/apl/article-lookup/doi/10.1063/1.1978983$$EHTML$$P50$$Gscitation$$H</linktohtml><link.rule.ids>314,780,784,794,1558,4510,27922,27923,76154,76160</link.rule.ids></links><search><creatorcontrib>Wang, J. J.</creatorcontrib><creatorcontrib>Saito, Y.</creatorcontrib><creatorcontrib>Batchelder, D. N.</creatorcontrib><creatorcontrib>Kirkham, J.</creatorcontrib><creatorcontrib>Robinson, C.</creatorcontrib><creatorcontrib>Smith, D. A.</creatorcontrib><title>Controllable method for the preparation of metalized probes for efficient scanning near-field optical Raman microscopy</title><title>Applied physics letters</title><description>A modification of the mirror reaction method has been used to metalize atomic force microscope (AFM) probes for apertureless near-field optical microscopy. The method produces a single silver particle of controllable size at the apex of the AFM tip with no detrimental effects on the AFM probe. A particle of the order
80
nm
in diameter appears to provide the best tip-enhanced Raman signal using
488
nm
excitation. The near-field Raman spatial resolution of one such probe was shown to be as high as
24
nm
using single-walled carbon nanotubes as a test sample.</description><issn>0003-6951</issn><issn>1077-3118</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2005</creationdate><recordtype>article</recordtype><recordid>eNp1kE1LxDAQhoMouK4e_Ae5euiaNG3aHjzI4hcsCKLnMkkmbqRNShKE9de7XwcvnobhfXiHeQi55mzBmRS3fMG7pu1acUJmnDVNIThvT8mMMSYK2dX8nFyk9LVd61KIGfleBp9jGAZQA9IR8zoYakOkeY10ijhBhOyCp8HuUhjcD5ptEBSmPYfWOu3QZ5o0eO_8J_UIsbAOB0PDlJ2Ggb7BCJ6OTseQdJg2l-TMwpDw6jjn5OPx4X35XKxen16W96tCi6rLhUIlUUJTK8lbKBVAZ7jhTWU41DVrK1mZVjdGN6Kty1YywwxX1pRdpRClEXNyc-jdHU4RbT9FN0Lc9Jz1O2E974_CtuzdgU3a5f3T_8N_rfUHa-IXhoV1vQ</recordid><startdate>20050627</startdate><enddate>20050627</enddate><creator>Wang, J. J.</creator><creator>Saito, Y.</creator><creator>Batchelder, D. N.</creator><creator>Kirkham, J.</creator><creator>Robinson, C.</creator><creator>Smith, D. A.</creator><general>American Institute of Physics</general><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>20050627</creationdate><title>Controllable method for the preparation of metalized probes for efficient scanning near-field optical Raman microscopy</title><author>Wang, J. J. ; Saito, Y. ; Batchelder, D. N. ; Kirkham, J. ; Robinson, C. ; Smith, D. A.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c349t-beb6e6a75b618a2baa9d1d174d1a5508464d8c7dc73852860d0d1bfd294bee6d3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2005</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Wang, J. J.</creatorcontrib><creatorcontrib>Saito, Y.</creatorcontrib><creatorcontrib>Batchelder, D. N.</creatorcontrib><creatorcontrib>Kirkham, J.</creatorcontrib><creatorcontrib>Robinson, C.</creatorcontrib><creatorcontrib>Smith, D. A.</creatorcontrib><collection>CrossRef</collection><jtitle>Applied physics letters</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Wang, J. J.</au><au>Saito, Y.</au><au>Batchelder, D. N.</au><au>Kirkham, J.</au><au>Robinson, C.</au><au>Smith, D. A.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Controllable method for the preparation of metalized probes for efficient scanning near-field optical Raman microscopy</atitle><jtitle>Applied physics letters</jtitle><date>2005-06-27</date><risdate>2005</risdate><volume>86</volume><issue>26</issue><spage>263111</spage><epage>263111-3</epage><pages>263111-263111-3</pages><issn>0003-6951</issn><eissn>1077-3118</eissn><coden>APPLAB</coden><abstract>A modification of the mirror reaction method has been used to metalize atomic force microscope (AFM) probes for apertureless near-field optical microscopy. The method produces a single silver particle of controllable size at the apex of the AFM tip with no detrimental effects on the AFM probe. A particle of the order
80
nm
in diameter appears to provide the best tip-enhanced Raman signal using
488
nm
excitation. The near-field Raman spatial resolution of one such probe was shown to be as high as
24
nm
using single-walled carbon nanotubes as a test sample.</abstract><pub>American Institute of Physics</pub><doi>10.1063/1.1978983</doi></addata></record> |
| fulltext | fulltext |
| identifier | ISSN: 0003-6951 |
| ispartof | Applied physics letters, 2005-06, Vol.86 (26), p.263111-263111-3 |
| issn | 0003-6951 1077-3118 |
| language | eng |
| recordid | cdi_crossref_primary_10_1063_1_1978983 |
| source | AIP Journals Complete; AIP Digital Archive |
| title | Controllable method for the preparation of metalized probes for efficient scanning near-field optical Raman microscopy |
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