Photographic surveying of minority carrier diffusion length in polycrystalline silicon solar cells by electroluminescence

Photographic surveying of minority carrier diffusion length in polycrystalline silicon solar cells by electroluminescence

Photographic surveying of the minority carrier diffusion length distribution in polycrystalline silicon solar cells was proposed. Light emission from the cell under the forward bias was captured by a charge coupled device camera. We have found that the intensity distribution of light emission clearl...

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Veröffentlicht in:Applied physics letters 2005-06, Vol.86 (26), p.262108-262108-3
Hauptverfasser: Fuyuki, Takashi, Kondo, Hayato, Yamazaki, Tsutomu, Takahashi, Yu, Uraoka, Yukiharu
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container_issue 26
container_start_page 262108
container_title Applied physics letters
container_volume 86
creator Fuyuki, Takashi
Kondo, Hayato
Yamazaki, Tsutomu
Takahashi, Yu
Uraoka, Yukiharu
description Photographic surveying of the minority carrier diffusion length distribution in polycrystalline silicon solar cells was proposed. Light emission from the cell under the forward bias was captured by a charge coupled device camera. We have found that the intensity distribution of light emission clearly agreed with the mapping of minority carrier diffusion length in polycrystalline silicon active layers. The emission intensity had a one-to-one relationship with the minority carrier diffusion length, which yielded a semiquantitative analysis method of the diffusion length mapping and the detection of the deteriorated areas.
doi_str_mv 10.1063/1.1978979
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title Photographic surveying of minority carrier diffusion length in polycrystalline silicon solar cells by electroluminescence
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