Efficient sub 100nm focusing of hard x rays

Efficient sub 100nm focusing of hard x rays

An x-ray beam with energy of 20.5keV has been efficiently focused down to a spot size as small as 90nm×90nm by a Kirkpatrick–Baez reflecting mirrors device. The first mirror, coated with a graded multilayer, plays both the role of vertical focusing device and monochromator, resulting in a very high...

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Veröffentlicht in:Review of scientific instruments 2005-06, Vol.76 (6)
Hauptverfasser: Hignette, O., Cloetens, P., Rostaing, G., Bernard, P., Morawe, C.
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Sprache:eng ; jpn
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container_issue 6
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container_title Review of scientific instruments
container_volume 76
creator Hignette, O.
Cloetens, P.
Rostaing, G.
Bernard, P.
Morawe, C.
description An x-ray beam with energy of 20.5keV has been efficiently focused down to a spot size as small as 90nm×90nm by a Kirkpatrick–Baez reflecting mirrors device. The first mirror, coated with a graded multilayer, plays both the role of vertical focusing device and monochromator, resulting in a very high flux (2×1011photons∕s) and medium monochromaticity (ΔE∕E∼10−2). Evaluation of the error contributions shows that the vertical focus is presently limited by the mirror figure errors, while the horizontal focus is limited by the horizontal extension of the x-ray source. With a gain in excess of a few million, this device opens up new possibilities in trace element nanoanalysis and fast projection microscopy.
doi_str_mv 10.1063/1.1928191
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fullrecord <record><control><sourceid>crossref</sourceid><recordid>TN_cdi_crossref_primary_10_1063_1_1928191</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>10_1063_1_1928191</sourcerecordid><originalsourceid>FETCH-LOGICAL-c1406-d0a4c1788f9746d89c0c0d5f6ef0b6e763217ebe18942fb76fcae1f3738b1ec33</originalsourceid><addsrcrecordid>eNotj8tKAzEUQIModKwu-gfZSkm9d5LmsZRSH1Dopq5DksnVETsjiQX791Xs2ZzdgcPYDGGBoOU9LtC1Fh1esAbBOmF0Ky9ZAyCV0EbZCbuu9QN-WSI2bL4m6lOfh29eD5EjwLDnNKZD7Yc3PhJ_D6XjP7yEY71hVxQ-a749e8peH9e71bPYbJ9eVg8bkVCBFh0EldBYS84o3VmXIEG3JJ0Jos5GyxZNjhmtUy1FoymFjCSNtBFzknLK7v67qYy1lkz-q_T7UI4ewf9devTnS3kCOkdCJA</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Efficient sub 100nm focusing of hard x rays</title><source>AIP Journals Complete</source><source>AIP Digital Archive</source><creator>Hignette, O. ; Cloetens, P. ; Rostaing, G. ; Bernard, P. ; Morawe, C.</creator><creatorcontrib>Hignette, O. ; Cloetens, P. ; Rostaing, G. ; Bernard, P. ; Morawe, C.</creatorcontrib><description>An x-ray beam with energy of 20.5keV has been efficiently focused down to a spot size as small as 90nm×90nm by a Kirkpatrick–Baez reflecting mirrors device. The first mirror, coated with a graded multilayer, plays both the role of vertical focusing device and monochromator, resulting in a very high flux (2×1011photons∕s) and medium monochromaticity (ΔE∕E∼10−2). Evaluation of the error contributions shows that the vertical focus is presently limited by the mirror figure errors, while the horizontal focus is limited by the horizontal extension of the x-ray source. With a gain in excess of a few million, this device opens up new possibilities in trace element nanoanalysis and fast projection microscopy.</description><identifier>ISSN: 0034-6748</identifier><identifier>EISSN: 1089-7623</identifier><identifier>DOI: 10.1063/1.1928191</identifier><language>eng ; jpn</language><ispartof>Review of scientific instruments, 2005-06, Vol.76 (6)</ispartof><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c1406-d0a4c1788f9746d89c0c0d5f6ef0b6e763217ebe18942fb76fcae1f3738b1ec33</citedby><cites>FETCH-LOGICAL-c1406-d0a4c1788f9746d89c0c0d5f6ef0b6e763217ebe18942fb76fcae1f3738b1ec33</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784,27923,27924</link.rule.ids></links><search><creatorcontrib>Hignette, O.</creatorcontrib><creatorcontrib>Cloetens, P.</creatorcontrib><creatorcontrib>Rostaing, G.</creatorcontrib><creatorcontrib>Bernard, P.</creatorcontrib><creatorcontrib>Morawe, C.</creatorcontrib><title>Efficient sub 100nm focusing of hard x rays</title><title>Review of scientific instruments</title><description>An x-ray beam with energy of 20.5keV has been efficiently focused down to a spot size as small as 90nm×90nm by a Kirkpatrick–Baez reflecting mirrors device. The first mirror, coated with a graded multilayer, plays both the role of vertical focusing device and monochromator, resulting in a very high flux (2×1011photons∕s) and medium monochromaticity (ΔE∕E∼10−2). Evaluation of the error contributions shows that the vertical focus is presently limited by the mirror figure errors, while the horizontal focus is limited by the horizontal extension of the x-ray source. With a gain in excess of a few million, this device opens up new possibilities in trace element nanoanalysis and fast projection microscopy.</description><issn>0034-6748</issn><issn>1089-7623</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2005</creationdate><recordtype>article</recordtype><recordid>eNotj8tKAzEUQIModKwu-gfZSkm9d5LmsZRSH1Dopq5DksnVETsjiQX791Xs2ZzdgcPYDGGBoOU9LtC1Fh1esAbBOmF0Ky9ZAyCV0EbZCbuu9QN-WSI2bL4m6lOfh29eD5EjwLDnNKZD7Yc3PhJ_D6XjP7yEY71hVxQ-a749e8peH9e71bPYbJ9eVg8bkVCBFh0EldBYS84o3VmXIEG3JJ0Jos5GyxZNjhmtUy1FoymFjCSNtBFzknLK7v67qYy1lkz-q_T7UI4ewf9devTnS3kCOkdCJA</recordid><startdate>20050601</startdate><enddate>20050601</enddate><creator>Hignette, O.</creator><creator>Cloetens, P.</creator><creator>Rostaing, G.</creator><creator>Bernard, P.</creator><creator>Morawe, C.</creator><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>20050601</creationdate><title>Efficient sub 100nm focusing of hard x rays</title><author>Hignette, O. ; Cloetens, P. ; Rostaing, G. ; Bernard, P. ; Morawe, C.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c1406-d0a4c1788f9746d89c0c0d5f6ef0b6e763217ebe18942fb76fcae1f3738b1ec33</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng ; jpn</language><creationdate>2005</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Hignette, O.</creatorcontrib><creatorcontrib>Cloetens, P.</creatorcontrib><creatorcontrib>Rostaing, G.</creatorcontrib><creatorcontrib>Bernard, P.</creatorcontrib><creatorcontrib>Morawe, C.</creatorcontrib><collection>CrossRef</collection><jtitle>Review of scientific instruments</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Hignette, O.</au><au>Cloetens, P.</au><au>Rostaing, G.</au><au>Bernard, P.</au><au>Morawe, C.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Efficient sub 100nm focusing of hard x rays</atitle><jtitle>Review of scientific instruments</jtitle><date>2005-06-01</date><risdate>2005</risdate><volume>76</volume><issue>6</issue><issn>0034-6748</issn><eissn>1089-7623</eissn><abstract>An x-ray beam with energy of 20.5keV has been efficiently focused down to a spot size as small as 90nm×90nm by a Kirkpatrick–Baez reflecting mirrors device. The first mirror, coated with a graded multilayer, plays both the role of vertical focusing device and monochromator, resulting in a very high flux (2×1011photons∕s) and medium monochromaticity (ΔE∕E∼10−2). Evaluation of the error contributions shows that the vertical focus is presently limited by the mirror figure errors, while the horizontal focus is limited by the horizontal extension of the x-ray source. With a gain in excess of a few million, this device opens up new possibilities in trace element nanoanalysis and fast projection microscopy.</abstract><doi>10.1063/1.1928191</doi></addata></record>
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title Efficient sub 100nm focusing of hard x rays
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-09T07%3A07%3A04IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-crossref&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Efficient%20sub%20100nm%20focusing%20of%20hard%20x%20rays&rft.jtitle=Review%20of%20scientific%20instruments&rft.au=Hignette,%20O.&rft.date=2005-06-01&rft.volume=76&rft.issue=6&rft.issn=0034-6748&rft.eissn=1089-7623&rft_id=info:doi/10.1063/1.1928191&rft_dat=%3Ccrossref%3E10_1063_1_1928191%3C/crossref%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true