Misfit dislocations in nanoscale ferroelectric heterostructures
We present a quantitative study of the thickness dependence of the polarization and piezoelectric properties in epitaxial (001) PbZr 0.52 Ti 0.48 O 3 films grown on (001) SrRuO 3 -buffered (001) SrTiO 3 substrates. High-resolution transmission electron microscopy reveals that even the thinnest films...
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Veröffentlicht in: | Applied physics letters 2005-05, Vol.86 (19), p.192910-192910-3 |
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container_title | Applied physics letters |
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creator | Nagarajan, V. Jia, C. L. Kohlstedt, H. Waser, R. Misirlioglu, I. B. Alpay, S. P. Ramesh, R. |
description | We present a quantitative study of the thickness dependence of the polarization and piezoelectric properties in epitaxial (001)
PbZr
0.52
Ti
0.48
O
3
films grown on (001)
SrRuO
3
-buffered (001)
SrTiO
3
substrates. High-resolution transmission electron microscopy reveals that even the thinnest films
(
∼
8
nm
)
are fully relaxed with a dislocation density close to
10
12
cm
−
2
and a spacing of approximately 12 nm. Quantitative piezoelectric and ferroelectric measurements show a drastic degradation in the out-of-plane piezoelectric constant
(
d
33
)
and the switched polarization
(
Δ
P
)
as a function of decreasing thickness. In contrast, lattice-matched ultrathin
PbZr
0.2
Ti
0.8
O
3
films that have a very low dislocation density show superior ferroelectric properties. Supporting theoretical calculations show that the variations in the strain field around the core of the dislocation leads to highly localized polarization gradients and hence strong depolarizing fields, which result in suppression of ferroelectricity in the vicinity of a dislocation. |
doi_str_mv | 10.1063/1.1922579 |
format | Article |
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PbZr
0.52
Ti
0.48
O
3
films grown on (001)
SrRuO
3
-buffered (001)
SrTiO
3
substrates. High-resolution transmission electron microscopy reveals that even the thinnest films
(
∼
8
nm
)
are fully relaxed with a dislocation density close to
10
12
cm
−
2
and a spacing of approximately 12 nm. Quantitative piezoelectric and ferroelectric measurements show a drastic degradation in the out-of-plane piezoelectric constant
(
d
33
)
and the switched polarization
(
Δ
P
)
as a function of decreasing thickness. In contrast, lattice-matched ultrathin
PbZr
0.2
Ti
0.8
O
3
films that have a very low dislocation density show superior ferroelectric properties. Supporting theoretical calculations show that the variations in the strain field around the core of the dislocation leads to highly localized polarization gradients and hence strong depolarizing fields, which result in suppression of ferroelectricity in the vicinity of a dislocation.</description><identifier>ISSN: 0003-6951</identifier><identifier>EISSN: 1077-3118</identifier><identifier>DOI: 10.1063/1.1922579</identifier><identifier>CODEN: APPLAB</identifier><language>eng</language><publisher>American Institute of Physics</publisher><ispartof>Applied physics letters, 2005-05, Vol.86 (19), p.192910-192910-3</ispartof><rights>2005 American Institute of Physics</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c384t-db300fb70c7a3d3958112d57e7dc8368ba042940b3c4859a7e75f243e4034bc23</citedby><cites>FETCH-LOGICAL-c384t-db300fb70c7a3d3958112d57e7dc8368ba042940b3c4859a7e75f243e4034bc23</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://pubs.aip.org/apl/article-lookup/doi/10.1063/1.1922579$$EHTML$$P50$$Gscitation$$H</linktohtml><link.rule.ids>314,780,784,794,1559,4512,27924,27925,76384,76390</link.rule.ids></links><search><creatorcontrib>Nagarajan, V.</creatorcontrib><creatorcontrib>Jia, C. L.</creatorcontrib><creatorcontrib>Kohlstedt, H.</creatorcontrib><creatorcontrib>Waser, R.</creatorcontrib><creatorcontrib>Misirlioglu, I. B.</creatorcontrib><creatorcontrib>Alpay, S. P.</creatorcontrib><creatorcontrib>Ramesh, R.</creatorcontrib><title>Misfit dislocations in nanoscale ferroelectric heterostructures</title><title>Applied physics letters</title><description>We present a quantitative study of the thickness dependence of the polarization and piezoelectric properties in epitaxial (001)
PbZr
0.52
Ti
0.48
O
3
films grown on (001)
SrRuO
3
-buffered (001)
SrTiO
3
substrates. High-resolution transmission electron microscopy reveals that even the thinnest films
(
∼
8
nm
)
are fully relaxed with a dislocation density close to
10
12
cm
−
2
and a spacing of approximately 12 nm. Quantitative piezoelectric and ferroelectric measurements show a drastic degradation in the out-of-plane piezoelectric constant
(
d
33
)
and the switched polarization
(
Δ
P
)
as a function of decreasing thickness. In contrast, lattice-matched ultrathin
PbZr
0.2
Ti
0.8
O
3
films that have a very low dislocation density show superior ferroelectric properties. Supporting theoretical calculations show that the variations in the strain field around the core of the dislocation leads to highly localized polarization gradients and hence strong depolarizing fields, which result in suppression of ferroelectricity in the vicinity of a dislocation.</description><issn>0003-6951</issn><issn>1077-3118</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2005</creationdate><recordtype>article</recordtype><recordid>eNp1j01LxDAURYMoWEcX_oNuXXR8yUuaZCEig18w4kbXIU0TjNRWkszCf2-1s3Dj6nF5h3s5hJxTWFNo8ZKuqWZMSH1AKgpSNkipOiQVAGDTakGPyUnO73MUDLEi108xh1jqPuZhcrbEacx1HOvRjlN2dvB18ClNfvCupOjqN198mnJJO1d2yedTchTskP3Z_q7I693ty-ah2T7fP25uto1DxUvTdwgQOglOWuxRC0Up64X0sncKW9VZ4Exz6NBxJbSdHyIwjp4D8s4xXJGLpdfN6zn5YD5T_LDpy1AwP-aGmr35zF4tbHax_Cr9Dy_65q8-fgO7fWCg</recordid><startdate>20050509</startdate><enddate>20050509</enddate><creator>Nagarajan, V.</creator><creator>Jia, C. L.</creator><creator>Kohlstedt, H.</creator><creator>Waser, R.</creator><creator>Misirlioglu, I. B.</creator><creator>Alpay, S. P.</creator><creator>Ramesh, R.</creator><general>American Institute of Physics</general><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>20050509</creationdate><title>Misfit dislocations in nanoscale ferroelectric heterostructures</title><author>Nagarajan, V. ; Jia, C. L. ; Kohlstedt, H. ; Waser, R. ; Misirlioglu, I. B. ; Alpay, S. P. ; Ramesh, R.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c384t-db300fb70c7a3d3958112d57e7dc8368ba042940b3c4859a7e75f243e4034bc23</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2005</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Nagarajan, V.</creatorcontrib><creatorcontrib>Jia, C. L.</creatorcontrib><creatorcontrib>Kohlstedt, H.</creatorcontrib><creatorcontrib>Waser, R.</creatorcontrib><creatorcontrib>Misirlioglu, I. B.</creatorcontrib><creatorcontrib>Alpay, S. P.</creatorcontrib><creatorcontrib>Ramesh, R.</creatorcontrib><collection>CrossRef</collection><jtitle>Applied physics letters</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Nagarajan, V.</au><au>Jia, C. L.</au><au>Kohlstedt, H.</au><au>Waser, R.</au><au>Misirlioglu, I. B.</au><au>Alpay, S. P.</au><au>Ramesh, R.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Misfit dislocations in nanoscale ferroelectric heterostructures</atitle><jtitle>Applied physics letters</jtitle><date>2005-05-09</date><risdate>2005</risdate><volume>86</volume><issue>19</issue><spage>192910</spage><epage>192910-3</epage><pages>192910-192910-3</pages><issn>0003-6951</issn><eissn>1077-3118</eissn><coden>APPLAB</coden><abstract>We present a quantitative study of the thickness dependence of the polarization and piezoelectric properties in epitaxial (001)
PbZr
0.52
Ti
0.48
O
3
films grown on (001)
SrRuO
3
-buffered (001)
SrTiO
3
substrates. High-resolution transmission electron microscopy reveals that even the thinnest films
(
∼
8
nm
)
are fully relaxed with a dislocation density close to
10
12
cm
−
2
and a spacing of approximately 12 nm. Quantitative piezoelectric and ferroelectric measurements show a drastic degradation in the out-of-plane piezoelectric constant
(
d
33
)
and the switched polarization
(
Δ
P
)
as a function of decreasing thickness. In contrast, lattice-matched ultrathin
PbZr
0.2
Ti
0.8
O
3
films that have a very low dislocation density show superior ferroelectric properties. Supporting theoretical calculations show that the variations in the strain field around the core of the dislocation leads to highly localized polarization gradients and hence strong depolarizing fields, which result in suppression of ferroelectricity in the vicinity of a dislocation.</abstract><pub>American Institute of Physics</pub><doi>10.1063/1.1922579</doi><oa>free_for_read</oa></addata></record> |
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issn | 0003-6951 1077-3118 |
language | eng |
recordid | cdi_crossref_primary_10_1063_1_1922579 |
source | AIP Journals Complete; AIP Digital Archive |
title | Misfit dislocations in nanoscale ferroelectric heterostructures |
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