Measuring propagation loss in a multimode semiconductor waveguide
The measurement of propagation loss based on the Fabry-Pérot transmission fringes is a powerful tool for the characterization of single-mode optical waveguides. This method is well established for lithium niobate waveguides, but its implementation with semiconductor devices is more delicate. A metho...
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Veröffentlicht in: | Journal of applied physics 2005-04, Vol.97 (7), p.073105-073105-7 |
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creator | De Rossi, Alfredo Ortiz, Valentin Calligaro, Michel Lanco, Loïc Ducci, Sara Berger, Vincent Sagnes, Isabelle |
description | The measurement of propagation loss based on the Fabry-Pérot transmission fringes is a powerful tool for the characterization of single-mode optical waveguides. This method is well established for lithium niobate waveguides, but its implementation with semiconductor devices is more delicate. A method to extend this technique to the case of multimode semiconductor waveguides is presented. Our procedure involves Fabry-Pérot measurements on a large spectral range, in order to find an interval where multimode effects do not alter the loss measurement. Two experimental examples are given, showing also the domain of validity of this approach. |
doi_str_mv | 10.1063/1.1873059 |
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source | 美国小型学会期刊集(AIP Scitation平台); AIP_美国物理联合会期刊回溯(NSTL购买) |
title | Measuring propagation loss in a multimode semiconductor waveguide |
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