$Polarization fatigue in PbZr0.45Ti0.55O3-based capacitors studied from high resolution synchrotron x-ray diffraction$

Polarization fatigue in PbZr0.45Ti0.55O3-based capacitors studied from high resolution synchrotron x-ray diffraction

High resolution synchrotron x-ray diffraction experiments were performed on (111)-oriented PbZr0.45Ti0.55O3-based capacitors with a composition in the morphotropic region. Diffraction analyzes were done after bipolar pulses were applied and removed, representing several places in the cyclic switchin...

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Veröffentlicht in:	Journal of applied physics 2005-03, Vol.97 (6)
Hauptverfasser:	Menou, N., Muller, Ch, Baturin, I. S., Shur, V. Ya, Hodeau, J.-L.
Format:	Artikel
Sprache:	eng
Online-Zugang:	Volltext
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