Dispersion of thermo-optic coefficient in porous silicon layers of different porosities

Dispersion of thermo-optic coefficient in porous silicon layers of different porosities

The thermo-optic coefficient (dn∕dT) of porous silicon has been measured. The measurements are based on a simple technique. The experimental data, in the wavelength range between 500 and 1100nm and at different porosities, have been compared with the Bruggeman and Landau–Lifshitz models. The results...

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Veröffentlicht in:Applied physics letters 2005-02, Vol.86 (6)
Hauptverfasser: Moretti, Luigi, De Stefano, Luca, Mario Rossi, Andrea, Rendina, Ivo
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De Stefano, Luca
Mario Rossi, Andrea
Rendina, Ivo
description The thermo-optic coefficient (dn∕dT) of porous silicon has been measured. The measurements are based on a simple technique. The experimental data, in the wavelength range between 500 and 1100nm and at different porosities, have been compared with the Bruggeman and Landau–Lifshitz models. The results show good agreement in case of the Bruggeman model for porosities lower than 0.7, while for higher porosities the Landau model is in better agreement. An estimation of dn∕dT as a function of the porosity at the fiber optic communication wavelength of 1.55μm has also been reported.
doi_str_mv 10.1063/1.1857077
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title Dispersion of thermo-optic coefficient in porous silicon layers of different porosities
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