Noise resolution of RuO2-based resistance thermometers

Low-frequency noise was measured for RuO2-based thick film resistors at liquid helium temperatures down to 0.36 K. The 1∕f-type spectrum and squared voltage dependence of power spectral density observed at low voltages attribute the noise as coming from equilibrium resistance fluctuations. Measureme...

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Veröffentlicht in:	Review of scientific instruments 2005-01, Vol.76 (1)
Hauptverfasser:	Ptak, Piotr, Kolek, Andrzej, Zawislak, Zbigniew, Stadler, Adam W., Mleczko, Krzysztof
Format:	Artikel
Sprache:	eng
Online-Zugang:	Volltext
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