Soft x-ray pulse height analyzer in the HT-7 tokamak
A new soft x-ray pulse height analyzer (PHA), based on a Silicon Drift Detector (SDD) linear array consisting of 15 SDD detectors, has been installed in the HT-7 tokamak. The energy resolution of 150–180 eV at photon energy of 6 keV is achieved for the SDD with Peltier cooling. The effective time...
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Veröffentlicht in: | Review of scientific instruments 2004-11, Vol.75 (11), p.4930-4933 |
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container_title | Review of scientific instruments |
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creator | Shi, Yuejiang Chen, Zhongyong Wan, Baonian Lv, Bo Hu, Liqun Lin, Shiyao Hu, Qinsheng Qian, Jinping Liu, Haiqing Liu, Shengxia Xu, Yucun Shan, Jiafang Li, Jiangang |
description | A new soft x-ray pulse height analyzer (PHA), based on a Silicon Drift Detector (SDD) linear array consisting of 15 SDD detectors, has been installed in the HT-7 tokamak. The energy resolution of
150–180
eV
at photon energy of
6
keV
is achieved for the SDD with Peltier cooling. The effective time response of the SDD PHA is
50
ms
. The profiles of electron temperature and the intensity of metallic impurities can be obtained with a spatial resolution of
3
cm
. The performance and first experimental results from the new PHA system are presented. |
doi_str_mv | 10.1063/1.1808911 |
format | Article |
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150–180
eV
at photon energy of
6
keV
is achieved for the SDD with Peltier cooling. The effective time response of the SDD PHA is
50
ms
. The profiles of electron temperature and the intensity of metallic impurities can be obtained with a spatial resolution of
3
cm
. The performance and first experimental results from the new PHA system are presented.</description><identifier>ISSN: 0034-6748</identifier><identifier>EISSN: 1089-7623</identifier><identifier>DOI: 10.1063/1.1808911</identifier><identifier>CODEN: RSINAK</identifier><language>eng</language><publisher>United States</publisher><subject>70 PLASMA PHYSICS AND FUSION TECHNOLOGY ; COOLING ; ELECTRON TEMPERATURE ; ENERGY RESOLUTION ; EV RANGE 100-1000 ; HT-7 TOKAMAK ; ION TEMPERATURE ; KEV RANGE 01-10 ; PHOTONS ; PLASMA DIAGNOSTICS ; PLASMA IMPURITIES ; PULSES ; SI SEMICONDUCTOR DETECTORS ; SILICON ; SOFT X RADIATION ; SPATIAL RESOLUTION ; THERMONUCLEAR REACTORS</subject><ispartof>Review of scientific instruments, 2004-11, Vol.75 (11), p.4930-4933</ispartof><rights>American Institute of Physics</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c327t-26671c01c0caef3b16df341611d01506d8033f34abaf3c4196121a9cbfd38e413</citedby><cites>FETCH-LOGICAL-c327t-26671c01c0caef3b16df341611d01506d8033f34abaf3c4196121a9cbfd38e413</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://pubs.aip.org/rsi/article-lookup/doi/10.1063/1.1808911$$EHTML$$P50$$Gscitation$$H</linktohtml><link.rule.ids>230,314,776,780,790,881,1553,4498,27901,27902,76127,76133</link.rule.ids><backlink>$$Uhttps://www.osti.gov/biblio/20644020$$D View this record in Osti.gov$$Hfree_for_read</backlink></links><search><creatorcontrib>Shi, Yuejiang</creatorcontrib><creatorcontrib>Chen, Zhongyong</creatorcontrib><creatorcontrib>Wan, Baonian</creatorcontrib><creatorcontrib>Lv, Bo</creatorcontrib><creatorcontrib>Hu, Liqun</creatorcontrib><creatorcontrib>Lin, Shiyao</creatorcontrib><creatorcontrib>Hu, Qinsheng</creatorcontrib><creatorcontrib>Qian, Jinping</creatorcontrib><creatorcontrib>Liu, Haiqing</creatorcontrib><creatorcontrib>Liu, Shengxia</creatorcontrib><creatorcontrib>Xu, Yucun</creatorcontrib><creatorcontrib>Shan, Jiafang</creatorcontrib><creatorcontrib>Li, Jiangang</creatorcontrib><title>Soft x-ray pulse height analyzer in the HT-7 tokamak</title><title>Review of scientific instruments</title><description>A new soft x-ray pulse height analyzer (PHA), based on a Silicon Drift Detector (SDD) linear array consisting of 15 SDD detectors, has been installed in the HT-7 tokamak. The energy resolution of
150–180
eV
at photon energy of
6
keV
is achieved for the SDD with Peltier cooling. The effective time response of the SDD PHA is
50
ms
. The profiles of electron temperature and the intensity of metallic impurities can be obtained with a spatial resolution of
3
cm
. The performance and first experimental results from the new PHA system are presented.</description><subject>70 PLASMA PHYSICS AND FUSION TECHNOLOGY</subject><subject>COOLING</subject><subject>ELECTRON TEMPERATURE</subject><subject>ENERGY RESOLUTION</subject><subject>EV RANGE 100-1000</subject><subject>HT-7 TOKAMAK</subject><subject>ION TEMPERATURE</subject><subject>KEV RANGE 01-10</subject><subject>PHOTONS</subject><subject>PLASMA DIAGNOSTICS</subject><subject>PLASMA IMPURITIES</subject><subject>PULSES</subject><subject>SI SEMICONDUCTOR DETECTORS</subject><subject>SILICON</subject><subject>SOFT X RADIATION</subject><subject>SPATIAL RESOLUTION</subject><subject>THERMONUCLEAR REACTORS</subject><issn>0034-6748</issn><issn>1089-7623</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2004</creationdate><recordtype>article</recordtype><recordid>eNqd0FFLAzEMAOAiCs7pg_-g4JNCZ3LterdHGc4JAx-cz6Xrtd657TraKp6_3o4NfDcEEsJHICHkGmGEIPk9jrCCaoJ4QgaYG1bKgp-SAQAXTJaiOicXMX5AjjHigIhX7xL9ZkH3dPe5iZY2tn1vEtWd3vQ_NtC2o6mxdL5kJU1-rbd6fUnOnM726liH5G32uJzO2eLl6Xn6sGCGF2VihZQlGshptHV8hbJ2XKBErAHHIOsKOM8TvdKOG4ETiQXqiVm5mldWIB-Sm8NeH1OrommTNY3xXWdNUgVIIaCArG4PygQfY7BO7UK71aFXCGr_FIXq-JRs7w52v0yn1nf_w18-_EG1y3f9Aq8MbSY</recordid><startdate>200411</startdate><enddate>200411</enddate><creator>Shi, Yuejiang</creator><creator>Chen, Zhongyong</creator><creator>Wan, Baonian</creator><creator>Lv, Bo</creator><creator>Hu, Liqun</creator><creator>Lin, Shiyao</creator><creator>Hu, Qinsheng</creator><creator>Qian, Jinping</creator><creator>Liu, Haiqing</creator><creator>Liu, Shengxia</creator><creator>Xu, Yucun</creator><creator>Shan, Jiafang</creator><creator>Li, Jiangang</creator><scope>AAYXX</scope><scope>CITATION</scope><scope>OTOTI</scope></search><sort><creationdate>200411</creationdate><title>Soft x-ray pulse height analyzer in the HT-7 tokamak</title><author>Shi, Yuejiang ; Chen, Zhongyong ; Wan, Baonian ; Lv, Bo ; Hu, Liqun ; Lin, Shiyao ; Hu, Qinsheng ; Qian, Jinping ; Liu, Haiqing ; Liu, Shengxia ; Xu, Yucun ; Shan, Jiafang ; Li, Jiangang</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c327t-26671c01c0caef3b16df341611d01506d8033f34abaf3c4196121a9cbfd38e413</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2004</creationdate><topic>70 PLASMA PHYSICS AND FUSION TECHNOLOGY</topic><topic>COOLING</topic><topic>ELECTRON TEMPERATURE</topic><topic>ENERGY RESOLUTION</topic><topic>EV RANGE 100-1000</topic><topic>HT-7 TOKAMAK</topic><topic>ION TEMPERATURE</topic><topic>KEV RANGE 01-10</topic><topic>PHOTONS</topic><topic>PLASMA DIAGNOSTICS</topic><topic>PLASMA IMPURITIES</topic><topic>PULSES</topic><topic>SI SEMICONDUCTOR DETECTORS</topic><topic>SILICON</topic><topic>SOFT X RADIATION</topic><topic>SPATIAL RESOLUTION</topic><topic>THERMONUCLEAR REACTORS</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Shi, Yuejiang</creatorcontrib><creatorcontrib>Chen, Zhongyong</creatorcontrib><creatorcontrib>Wan, Baonian</creatorcontrib><creatorcontrib>Lv, Bo</creatorcontrib><creatorcontrib>Hu, Liqun</creatorcontrib><creatorcontrib>Lin, Shiyao</creatorcontrib><creatorcontrib>Hu, Qinsheng</creatorcontrib><creatorcontrib>Qian, Jinping</creatorcontrib><creatorcontrib>Liu, Haiqing</creatorcontrib><creatorcontrib>Liu, Shengxia</creatorcontrib><creatorcontrib>Xu, Yucun</creatorcontrib><creatorcontrib>Shan, Jiafang</creatorcontrib><creatorcontrib>Li, Jiangang</creatorcontrib><collection>CrossRef</collection><collection>OSTI.GOV</collection><jtitle>Review of scientific instruments</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Shi, Yuejiang</au><au>Chen, Zhongyong</au><au>Wan, Baonian</au><au>Lv, Bo</au><au>Hu, Liqun</au><au>Lin, Shiyao</au><au>Hu, Qinsheng</au><au>Qian, Jinping</au><au>Liu, Haiqing</au><au>Liu, Shengxia</au><au>Xu, Yucun</au><au>Shan, Jiafang</au><au>Li, Jiangang</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Soft x-ray pulse height analyzer in the HT-7 tokamak</atitle><jtitle>Review of scientific instruments</jtitle><date>2004-11</date><risdate>2004</risdate><volume>75</volume><issue>11</issue><spage>4930</spage><epage>4933</epage><pages>4930-4933</pages><issn>0034-6748</issn><eissn>1089-7623</eissn><coden>RSINAK</coden><abstract>A new soft x-ray pulse height analyzer (PHA), based on a Silicon Drift Detector (SDD) linear array consisting of 15 SDD detectors, has been installed in the HT-7 tokamak. The energy resolution of
150–180
eV
at photon energy of
6
keV
is achieved for the SDD with Peltier cooling. The effective time response of the SDD PHA is
50
ms
. The profiles of electron temperature and the intensity of metallic impurities can be obtained with a spatial resolution of
3
cm
. The performance and first experimental results from the new PHA system are presented.</abstract><cop>United States</cop><doi>10.1063/1.1808911</doi><tpages>4</tpages></addata></record> |
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subjects | 70 PLASMA PHYSICS AND FUSION TECHNOLOGY COOLING ELECTRON TEMPERATURE ENERGY RESOLUTION EV RANGE 100-1000 HT-7 TOKAMAK ION TEMPERATURE KEV RANGE 01-10 PHOTONS PLASMA DIAGNOSTICS PLASMA IMPURITIES PULSES SI SEMICONDUCTOR DETECTORS SILICON SOFT X RADIATION SPATIAL RESOLUTION THERMONUCLEAR REACTORS |
title | Soft x-ray pulse height analyzer in the HT-7 tokamak |
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