Subnanometric measurements of evanescent wave penetration depth using total internal reflection microscopy combined with fluorescent correlation spectroscopy

In total internal reflection microscopy (TIRM), quantitative interpretation of results often requires a precise knowledge of the penetration depth of the evanescent wave. Standard TIRM practice is to calculate this depth from the microscope’s geometry, but this can introduce significant errors. We s...

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Veröffentlicht in:	Applied physics letters 2004-10, Vol.85 (17), p.3917-3919
Hauptverfasser:	Harlepp, S., Robert, J., Darnton, N. C., Chatenay, D.
Format:	Artikel
Sprache:	eng
Online-Zugang:	Volltext
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