Electron Microscope Investigation of Extinction Line Contours in Copper Oxide Whiskers
Oxide whiskers were grown in dry air on pre-worked and pre-annealed copper and studied by high-magnification transmission electron microscopy. Examinations of individual whiskers at high magnifications revealed a complex array of lines of strong contrast within some of the crystals. Stereoscopic exa...
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| Veröffentlicht in: | Journal of applied physics 1962-06, Vol.33 (6), p.2045-2050 |
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| Hauptverfasser: | , |
| Format: | Artikel |
| Sprache: | eng |
| Online-Zugang: | Volltext |
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