ESR of Free Radicals Trapped in Inert Matrices at Low Temperature: CH3, SiH3, GeH3, and SnH3

The free radicals CH3, SiH3, GeH3, and SnH3 have been produced in a krypton matrix at 4.2°K by γ irradiation of the matrix containing dilute concentrations of CH4, SiH4, GeH4, and SnH4. The electron spin resonances indicate free or restricted rotation for all the radicals in the matrix. Observed ani...

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Veröffentlicht in:The Journal of chemical physics 1966-09, Vol.45 (5), p.1751-1758
Hauptverfasser: Morehouse, Roger L., Christiansen, Jørn J., Gordy, Walter
Format: Artikel
Sprache:eng
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